Patents by Inventor Lin Chun Hung

Lin Chun Hung has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method and system for automatically managing probe mark shifts
    Patent number: 8054097
    Abstract: Disclosed is a method and a system for automatically managing probe mark shifts. A determination is made from test data as to whether a die on a wafer is defective. A probe mark check on the wafer is made to determine whether a probe mark is shifted. Necessary recovery action is performed in response to the probe mark being shifted. In the probe mark check, a plurality of probe mark positions are selected from the test data. A determination is then made as to whether at least one of the plurality of probe mark positions violates an engineering rule.
    Type: Grant
    Filed: March 6, 2007
    Date of Patent: November 8, 2011
    Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
    Inventors: Sam Lin, Lin Chun Hung, Tsung Hsien Chen
  • Method and System for Automatically Managing Probe Mark Shifts
    Publication number: 20080218189
    Abstract: Disclosed is a method and a system for automatically managing probe mark shifts. A determination is made from test data as to whether a die on a wafer is defective. A probe mark check on the wafer is made to determine whether a probe mark is shifted. Necessary recovery action is performed in response to the probe mark being shifted. In the probe mark check, a plurality of probe mark positions are selected from the test data. A determination is then made as to whether at least one of the plurality of probe mark positions violates an engineering rule.
    Type: Application
    Filed: March 6, 2007
    Publication date: September 11, 2008
    Applicant: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.
    Inventors: Sam Lin, Lin Chun Hung, T. H. Chen