Abstract: Disclosed are a system and a method for detecting a centroid of a complementary single pixel. The system includes a lens group, a single-pixel detector assembly, a Digital Micromirror Device (DMD) and an acquisition and processing unit. The acquisition and processing unit generates two-dimensional modulation matrices A and B which are loaded into the DMD; the lens group processes light reflected or transmitted from a target object, such that an image of the target object is imaged on the DMD; and the acquisition and processing unit is connected with data output ends of two single-pixel detectors in respective, to calculate the centroid of the target object. The DMD modulates an image signal of the target object according to modulation information A and B; the single-pixel detector assembly includes a first single-pixel detector and a second single-pixel detector.

Abstract: Disclosed are a system and a method for detecting a centroid of a complementary single pixel. The system includes a lens group, a single-pixel detector assembly, a Digital Micromirror Device (DMD) and an acquisition and processing unit. The acquisition and processing unit generates two-dimensional modulation matrices A and B which are loaded into the DMD; the lens group processes light reflected or transmitted from a target object, such that an image of the target object is imaged on the DMD; and the acquisition and processing unit is connected with data output ends of two single-pixel detectors in respective, to calculate the centroid of the target object. The DMID modulates an image signal of the target object according to modulation information A and B; the single-pixel detector assembly includes a first single-pixel detector and a second single-pixel detector.

Abstract: This application provides a polygonal spherical sampling device, belonging to the technical field of spherical field antenna measurement, and including a probe, a mounting rack and a supporting platform. The supporting platform is mounted on the mounting rack for placing an object to be tested. The number of the probes is more than or equal to six, the probes are mounted on the mounting rack and a plurality of the probes are distributed on at least two vertical planes in a three-dimensional spherical space and are arranged around the supporting platform. The vertical planes are arranged symmetrically about a vertical axis, the probes are uniformly distributed at intervals of A degrees on each vertical plane, the probes on a same horizontal plane are uniformly distributed at intervals of B degrees, both A and B are less than or equal to 90.

Abstract: This application provides a polygonal spherical sampling device, belonging to the technical field of spherical field antenna measurement, and including a probe, a mounting rack and a supporting platform. The supporting platform is mounted on the mounting rack for placing an object to be tested. The number of the probes is more than or equal to six, the probes are mounted on the mounting rack and a plurality of the probes are distributed on at least two vertical planes in a three-dimensional spherical space and are arranged around the supporting platform. The vertical planes are arranged symmetrically about a vertical axis, the probes are uniformly distributed at intervals of A degrees on each vertical plane, the probes on a same horizontal plane are uniformly distributed at intervals of B degrees, both A and B are less than or equal to 90.