Patents by Inventor Linda Marie Clough

Linda Marie Clough has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Defect resolution methodology and data defects quality/risk metric model extension
    Patent number: 7757125
    Abstract: Methods, systems, and articles of manufacture for analyzing defects associated with a software development project. Descriptions of defects identified during the testing of a software product may be stored in a data structure. One or more of the defects may be identified as data defects. If data defects are determined to be the dominant class of defects in the data structure, the data defects may be analyzed to determine a cause for one or more data defects. For example, the focus areas affected by the defects, the trends over time of the defects, the particular types of the data defects, the stability of the system, etc. may be analyzed to determine a cause for the data defects. Therefore, corrective measures may be taken based on the identified cause of the one or more data defects.
    Type: Grant
    Filed: February 16, 2007
    Date of Patent: July 13, 2010
    Assignee: International Business Machines Corporation
    Inventors: Kathryn Allyn Bassin, Clyde J. Bearss, Linda Marie Clough, Susan Eileen Skrabanek, Crystal Faye Springer
  • Defect Resolution Methodology and Data Defects Quality/Risk Metric Model Extension
    Publication number: 20080201612
    Abstract: Methods, systems, and articles of manufacture for analyzing defects associated with a software development project. Descriptions of defects identified during the testing of a software product may be stored in a data structure. One or more of the defects may be identified as data defects. If data defects are determined to be the dominant class of defects in the data structure, the data defects may be analyzed to determine a cause for one or more data defects. For example, the focus areas affected by the defects, the trends over time of the defects, the particular types of the data defects, the stability of the system, etc. may be analyzed to determine a cause for the data defects. Therefore, corrective measures may be taken based on the identified cause of the one or more data defects.
    Type: Application
    Filed: February 16, 2007
    Publication date: August 21, 2008
    Inventors: Kathryn Allyn Bassin, Clyde J. Bearss, Linda Marie Clough, Susan Eileen Skrabanek, Crystal Faye Springer