Patents by Inventor Lindsay Buck
Lindsay Buck has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 11579459Abstract: A polychromator system comprising: an optical element defining an aperture; a collimation mirror for receiving light via the aperture and reflecting substantially collimated light; at least a first dispersive optical component and a second dispersive optical component, each configured to disperse the substantially collimated light received from the collimation mirror by different amounts for different wavelengths and to provide cross-dispersed light having different wavelengths of light spaced along a first and second axis; and a focus mirror positioned to focus the cross-dispersed light onto a 2-D array detector to provide a plurality of aperture images of the aperture at a respective plurality of regions of the detector, each of the plurality of aperture images associated with a respective wavelength of the cross-dispersed light.Type: GrantFiled: May 2, 2018Date of Patent: February 14, 2023Assignee: Agilent Technologies, Inc.Inventors: Sean M. Kent, Lindsay Buck
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Publication number: 20200379270Abstract: A polychromator system comprising: an optical element defining an aperture; a collimation mirror for receiving light via the aperture and reflecting substantially collimated light; at least a first dispersive optical component and a second dispersive optical component, each configured to disperse the substantially collimated light received from the collimation mirror by different amounts for different wavelengths and to provide cross-dispersed light having different wavelengths of light spaced along a first and second axis; and a focus mirror positioned to focus the cross-dispersed light onto a 2-D array detector to provide a plurality of aperture images of the aperture at a respective plurality of regions of the detector, each of the plurality of aperture images associated with a respective wavelength of the cross-dispersed light.Type: ApplicationFiled: May 2, 2018Publication date: December 3, 2020Inventors: Sean M. Kent, Lindsay Buck
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Patent number: 10401221Abstract: An optical emission spectrometer system includes a light source and a dichroic beam combiner. The light source emits first light in a first direction and second light in a second direction different from the first direction. The dichroic beam combiner receives the first light via a first light path and the second light via a second light path, reflects a portion the first light into an entrance aperture of a light detection and measurement apparatus, and transmits a portion of the second light into the entrance aperture, enabling analysis and measurement of both first and second light characteristics simultaneously. The portion of the first light reflected into the entrance aperture predominately has wavelengths in a first range of wavelengths and the portion of the second light transmitted into the entrance aperture predominately has wavelengths in a second range of wavelengths, different from the first range of wavelengths.Type: GrantFiled: August 17, 2017Date of Patent: September 3, 2019Assignee: AGILENT TECHNOLOGIES, INC.Inventors: Michael Bolles, Yin Sheng Sun, Lindsay Buck, Glyn Russell
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Publication number: 20170343414Abstract: An optical emission spectrometer system includes a light source and a dichroic beam combiner. The light source emits first light in a first direction and second light in a second direction different from the first direction. The dichroic beam combiner receives the first light via a first light path and the second light via a second light path, reflects a portion the first light into an entrance aperture of a light detection and measurement apparatus, and transmits a portion of the second light into the entrance aperture, enabling analysis and measurement of both first and second light characteristics simultaneously. The portion of the first light reflected into the entrance aperture predominately has wavelengths in a first range of wavelengths and the portion of the second light transmitted into the entrance aperture predominately has wavelengths in a second range of wavelengths, different from the first range of wavelengths.Type: ApplicationFiled: August 17, 2017Publication date: November 30, 2017Inventors: Michael Bolles, Yin Sheng Sun, Lindsay Buck, Glyn Russell
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Patent number: 9752933Abstract: An optical emission spectrometer system includes a light source and a dichroic beam combiner. The light source emits first light in a first direction and second light in a second direction different from the first direction. The dichroic beam combiner receives the first light via a first light path and the second light via a second light path, reflects a portion the first light into an entrance aperture of a light detection and measurement apparatus, and transmits a portion of the second light into the entrance aperture, enabling analysis and measurement of both first and second light characteristics simultaneously. The portion of the first light reflected into the entrance aperture predominately has wavelengths in a first range of wavelengths and the portion of the second light transmitted into the entrance aperture predominately has wavelengths in a second range of wavelengths, different from the first range of wavelengths.Type: GrantFiled: February 4, 2015Date of Patent: September 5, 2017Assignee: Agilent Technologies, Inc.Inventors: Michael Bolles, Yin Sheng Sun, Lindsay Buck, Glyn Russell
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Patent number: 9279722Abstract: An optical emission spectrometer system includes a light source and a dichroic beam combiner. The light source emits first light in a first direction and second light in a second direction different from the first direction. The dichroic beam combiner receives the first light via a first light path and the second light via a second light path, reflects a portion the first light into an entrance aperture of a light detection and measurement apparatus, and transmits a portion of the second light into the entrance aperture, enabling analysis and measurement of both first and second light characteristics simultaneously. The portion of the first light reflected into the entrance aperture predominately has wavelengths in a first range of wavelengths and the portion of the second light transmitted into the entrance aperture predominately has wavelengths in a second range of wavelengths, different from the first range of wavelengths.Type: GrantFiled: April 30, 2012Date of Patent: March 8, 2016Assignee: Agilent Technologies, Inc.Inventors: Michael Bolles, Yin Sheng Sun, Lindsay Buck, Glyn Russell
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Publication number: 20150138548Abstract: An optical emission spectrometer system includes a light source and a dichroic beam combiner. The light source emits first light in a first direction and second light in a second direction different from the first direction. The dichroic beam combiner receives the first light via a first light path and the second light via a second light path, reflects a portion the first light into an entrance aperture of a light detection and measurement apparatus, and transmits a portion of the second light into the entrance aperture, enabling analysis and measurement of both first and second light characteristics simultaneously. The portion of the first light reflected into the entrance aperture predominately has wavelengths in a first range of wavelengths and the portion of the second light transmitted into the entrance aperture predominately has wavelengths in a second range of wavelengths, different from the first range of wavelengths.Type: ApplicationFiled: February 4, 2015Publication date: May 21, 2015Applicant: AGILENT TECHNOLOGIES, INC.Inventors: Michael Bolles, Yin Sheng Sun, Lindsay Buck, Glyn Russell
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Publication number: 20130286390Abstract: An optical emission spectrometer system includes a light source and a dichroic beam combiner. The light source emits first light in a first direction and second light in a second direction different from the first direction. The dichroic beam combiner receives the first light via a first light path and the second light via a second light path, reflects a portion the first light into an entrance aperture of a light detection and measurement apparatus, and transmits a portion of the second light into the entrance aperture, enabling analysis and measurement of both first and second light characteristics simultaneously. The portion of the first light reflected into the entrance aperture predominately has wavelengths in a first range of wavelengths and the portion of the second light transmitted into the entrance aperture predominately has wavelengths in a second range of wavelengths, different from the first range of wavelengths.Type: ApplicationFiled: April 30, 2012Publication date: October 31, 2013Applicant: AGILENT TECHNOLOGIES, INC.Inventors: Michael Bolles, Yin Sheng Sun, Lindsay Buck, Glyn Russell