Patents by Inventor Linjun Cao

Linjun Cao has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Parallel test structure
    Patent number: 10475677
    Abstract: An exemplary apparatus includes a testing module connected to, and providing a test voltage to, an integrated circuit containing devices under test. The testing module performs a time-dependent dielectric breakdown (TDDB) test on the devices under test. A decoder is connected to the devices under test and the testing module. The decoder selectively connects each device being tested to the testing module. Efuses are connected to a different one of the devices under test. The efuses separately electrically disconnect each of the devices under test from the test voltage upon failure of a corresponding device under test. Protection circuits are connected between the efuses and a ground voltage. Each protection circuit provides a shunt around the decoder upon failure of the device under test.
    Type: Grant
    Filed: August 22, 2017
    Date of Patent: November 12, 2019
    Assignee: GLOBALFOUNDRIES INC.
    Inventors: Tian Shen, Anil Kumar, Yuncheng Song, Kong Boon Yeap, Ronald G. Filippi, Jr., Linjun Cao, Seungman Choi, Cathryn J. Christiansen, Patrick R. Justison
  • PARALLEL TEST STRUCTURE
    Publication number: 20190067056
    Abstract: An exemplary apparatus includes a testing module connected to, and providing a test voltage to, an integrated circuit containing devices under test. The testing module performs a time-dependent dielectric breakdown (TDDB) test on the devices under test. A decoder is connected to the devices under test and the testing module. The decoder selectively connects each device being tested to the testing module. Efuses are connected to a different one of the devices under test. The efuses separately electrically disconnect each of the devices under test from the test voltage upon failure of a corresponding device under test. Protection circuits are connected between the efuses and a ground voltage. Each protection circuit provides a shunt around the decoder upon failure of the device under test.
    Type: Application
    Filed: August 22, 2017
    Publication date: February 28, 2019
    Applicant: GLOBALFOUNDRIES INC.
    Inventors: Tian Shen, Anil Kumar, Yuncheng Song, Kong Boon Yeap, Ronald G. Filippi, JR., Linjun Cao, Seungman Choi, Cathryn J. Christiansen, Patrick R. Justison
  • TDDB PERCOLATION CURRENT INDUCED E-FUSE STRUCTURE AND METHOD OF PROGRAMMING SAME
    Publication number: 20190066812
    Abstract: An e-fuse structure including a circuit having an e-fuse operably coupling the circuit to a power source, and a redundant circuit for operably coupling the power source in response to opening of the e-fuse, wherein the e-fuse opens in response to a time-dependent dielectric breakdown (TDDB) percolation current in proximity to the circuit migrating through the e-fuse. A method of programming such an e-fuse structure is also disclosed.
    Type: Application
    Filed: August 24, 2017
    Publication date: February 28, 2019
    Inventors: Kong Boon Yeap, Tian Shen, Ronald Gene Filippi, JR., Seungman Choi, Linjun Cao