Patents by Inventor Linkun Chen

Linkun Chen has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 9178756
    Abstract: Embodiments of the present invention provide a method and a device for processing location information of a fault point. The method includes: obtaining, by an ingress node of an LDP LSP, first location information of a fault point on a link traversed by the LDP LSP, where the first location information of the fault point includes an identifier of an upstream node of the fault point and an identifier of an interface that is connected to the fault point and located on the upstream node of the fault point; and providing the first location information of the fault point to a user so that the user determines a location of the fault point corresponding to an LDP LSP fault. Therefore, the location of the fault point corresponding to the LDP LSP fault can be determined, and efficiency of troubleshooting specific to the LDP LSP fault can be improved.
    Type: Grant
    Filed: November 15, 2013
    Date of Patent: November 3, 2015
    Assignee: Huawei Technologies Co., Ltd.
    Inventors: Changsheng Sun, Yu Zhang, Linkun Chen
  • Publication number: 20140071834
    Abstract: Embodiments of the present invention provide a method and a device for processing location information of a fault point. The method includes: obtaining, by an ingress node of an LDP LSP, first location information of a fault point on a link traversed by the LDP LSP, where the first location information of the fault point includes an identifier of an upstream node of the fault point and an identifier of an interface that is connected to the fault point and located on the upstream node of the fault point; and providing the first location information of the fault point to a user so that the user determines a location of the fault point corresponding to an LDP LSP fault. Therefore, the location of the fault point corresponding to the LDP LSP fault can be determined, and efficiency of troubleshooting specific to the LDP LSP fault can be improved.
    Type: Application
    Filed: November 15, 2013
    Publication date: March 13, 2014
    Applicant: Huawei Technologies Co., Ltd.
    Inventors: Changsheng Sun, Yu Zhang, Linkun Chen