Abstract: The invention presents a lensless Fourier ptychographic diffraction tomography microscopy imaging method based on wavelength scanning. The technique uses only a wavelength-tunable light source for illumination on a lensless microscope experimental system to collect a series of coaxial holograms. Then, the three-dimensional scattering potential spectrum is filled using an iterative Fourier ptychographic method to restore the three-dimensional refractive index distribution of the sample directly. The present invention does not require complex modifications to traditional lensless on-chip microscopes. It can endow lensless on-chip microscopes with the ability of pixel super-resolution three-dimensional tomographic imaging.

Abstract: A lens-free single-frame phase recovery method based on partially coherent light-emitting diode illumination. The method is implemented in a lens-free on-chip microscopy experiment system. Only a single-color patch LED light source is used for illumination, and a single in-line hologram is collected. High-resolution and high signal-to-noise-ratio phase information of an object is then directly recovered by means of a multi-wavelength iteration phase recovery method in combination with a dynamic phase support constraint. By means of the method, the capability of rapid and long-time lens-free on-chip single-frame phase recovery can be given without the need for complex transformation of a conventional lens-free on-chip microscope. The structure of a microscopy system includes a light source (1), a sample (2) and a sensor (3).

Abstract: This invention discloses a method for transport of intensity diffraction tomography based on non-interferometric synthetic aperture. By acquiring through-focus intensity stacks under different illumination angles and performing three-dimensional Fourier domain half-space filtering (or 3D Hilbert transform equivalently) on the measured intensity stack, further combining with non-interferometric synthetic aperture, the 3D refractive index tomographic imaging in a non-interferometric manner without the need to meet matched illumination condition can be achieved. Leveraging the inherent advantage of synthetic aperture, the imaging resolution reaches the incoherent diffraction limit, resulting in high-resolution imaging results. The non-interferometric nature of TIDT-NSA offers a simple imaging optical setup, delivers speckle-free imaging quality, and is compatible with an off-the-shelf bright-field microscope.

Abstract: The invention presents a lensless Fourier ptychographic diffraction tomography microscopy imaging method based on wavelength scanning. The technique uses only a wavelength-tunable light source for illumination on a lensless microscope experimental system to collect a series of coaxial holograms. Then, the three-dimensional scattering potential spectrum is filled using an iterative Fourier ptychographic method to restore the three-dimensional refractive index distribution of the sample directly. The present invention does not require complex modifications to traditional lensless on-chip microscopes. It can endow lensless on-chip microscopes with the ability of pixel super-resolution three-dimensional tomographic imaging.