Abstract: A coated cutting tool has a CVD coating and a substrate of a cemented carbide, wherein the metallic binder in the cemented carbide includes Ni. The CVD coating has an inner layer of TiN and a subsequent layer of TiCN. A C-activity relative to graphite in the metallic binder is lower than 0.15 and an average d electron value of the metallic binder is 7.00-7.43, wherein an interface between the substrate and the inner TiN layer is free of Ti-containing intermetallic phase.

Abstract: A coated cutting tool has a CVD coated and a substrate of a cemented carbide, wherein the metallic binder in the cemented carbide includes Ni. The CVD coating has an inner layer of TiN and a subsequent layer of TiCN. The C-activity relative to graphite in the metallic binder is lower than 0.15 and an average d electron value of the metallic binder is 7.00-7.43, wherein an interface between the substrate and the inner TiN layer is free of Ti-containing intermetallic phase.

Abstract: A coated cutting tool is provided. The cutting tool is CVD coated and has a substrate of cemented carbide, wherein a metallic binder in the cemented carbide includes Ni. The CVD coating has an inner layer of TiN and a subsequent layer of TiCN and a layer of Al2O3 located between the TiCN layer and an outermost surface of the coated cutting tool.

Abstract: A coated cutting tool is CVD coated and includes a substrate of a cemented carbide, wherein the metallic binder in the cemented carbide Includes Ni. The CVD coating includes an inner layer of TiN and a subsequent layer of TiCN.

Abstract: A coated cutting tool includes a substrate coated with a multi-layered wear resistant coating having a layer of ?-Al2O3 and a layer of titanium carbonitride TixCyN1-y, with 0.85?x?1.3 and 0.4?y?0.85, deposited on the ?-Al2O3 layer. The TixCyN1-y exhibits a texture coefficient TC(hkl), measured by X-ray diffraction using CuK? radiation and ?-2? scan. The TC(hkl) is defined according to Harris formula: TC ? ( hkl ) = I ? ( hkl ) I 0 ? ( hkl ) ? [ 1 n ? ? n = 1 n ? I ? ( hkl ) I 0 ? ( hkl ) ] - 1 , wherein I(hkl) is the measured intensity (integrated area) of the (hkl) reflection; I0(hkl) is standard intensity of the standard powder diffraction data according to JCPDS card no. 42-1489; n is the number of reflections used in the calculation, and where the (hkl) reflections used are (1 1 1), (2 0 0), (2 2 0), (3 1 1), (3 3 1), (4 2 0) and (4 2 2), and wherein TC(1 1 1)?3.