Abstract: A waveguide with an input coupler and an output coupler that redirects reflected light to a camera. The waveguide may be integrated in a lens of a wearable device such as a pair of glasses. Light sources emit light beams towards the eye. A portion of the light beams are reflected by the surface of the eye towards the input coupler located in front of the eye. The input coupler may be implemented according to diffractive or reflective technologies, and may be a straight or curved line of narrow width to focus at close distances but of a length long enough to sufficiently image the eye. The input coupler changes the angles of the light beams so that the light beams are relayed using total internal reflection and focused towards an output coupler of the waveguide. The light beams are redirected by the output coupler to the camera.

Abstract: Examples of a light field metrology system for use with a display are disclosed. The light field metrology may capture images of a projected light field, and determine focus depths (or lateral focus positions) for various regions of the light field using the captured images. The determined focus depths (or lateral positions) may then be compared with intended focus depths (or lateral positions), to quantify the imperfections of the display. Based on the measured imperfections, an appropriate error correction may be performed on the light field to correct for the measured imperfections. The display can be an optical display element in a head mounted display, for example, an optical display element capable of generating multiple depth planes or a light field display.

Abstract: A stacked waveguide assembly can have multiple waveguide stacks. Each waveguide stack can include a plurality of waveguides, where a first waveguide stack may be associated with a first subcolor of each of three different colors, and a second waveguide stack may be associated with a second subcolor of each of the three different colors. For example, the first stack of waveguides can incouple blue, green, and red light at 440 nm, 520 nm, and 650 nm, respectively. The second stack of waveguides can incouple blue, green, and red light at 450 nm, 530 nm, and 660 nm, respectively.

Abstract: In a stacked waveguide assembly, the waveguides can comprise color filters, distributed filters, and/or switch materials. Examples of color filters include dyes, tints, or stains. Examples of distributed filters and/or switch materials include dichroic filters, Bragg gratings, electronically switchable glass, and electronically switchable mirrors. Switch materials can be designed or tuned to attenuate light of unwanted colors or wavelengths. The waveguides may each be associated with a particular design wavelength. This can mean that a waveguide that is associated with a design wavelength includes an incoupling optical element is configured to deflect light at the design wavelength to an associated light distributing element and that the associated wavelength selective region is configured to attenuate light not at the design wavelength.

Abstract: In a stacked waveguide assembly, the waveguides can comprise color filters, distributed filters, and/or switch materials. Examples of color filters include dyes, tints, or stains. Examples of distributed filters and/or switch materials include dichroic filters, Bragg gratings, electronically switchable glass, and electronically switchable mirrors. Switch materials can be designed or tuned to attenuate light of unwanted colors or wavelengths. The waveguides may each be associated with a particular design wavelength. This can mean that a waveguide that is associated with a design wavelength includes an incoupling optical element is configured to deflect light at the design wavelength to an associated light distributing element and that the associated wavelength selective region is configured to attenuate light not at the design wavelength.

Abstract: Examples of a light field metrology system for use with a display are disclosed. The light field metrology may capture images of a projected light field, and determine focus depths (or lateral focus positions) for various regions of the light field using the captured images. The determined focus depths (or lateral positions) may then be compared with intended focus depths (or lateral positions), to quantify the imperfections of the display. Based on the measured imperfections, an appropriate error correction may be performed on the light field to correct for the measured imperfections. The display can be an optical display element in a head mounted display, for example, an optical display element capable of generating multiple depth planes or a light field display.

Abstract: A stacked waveguide assembly can have multiple waveguide stacks. Each waveguide stack can include a plurality of waveguides, where a first waveguide stack may be associated with a first subcolor of each of three different colors, and a second waveguide stack may be associated with a second subcolor of each of the three different colors. For example, the first stack of waveguides can incouple blue, green, and red light at 440 nm, 520 nm, and 650 nm, respectively. The second stack of waveguides can incouple blue, green, and red light at 450 nm, 530 nm, and 660 nm, respectively.

Abstract: Examples of a light field metrology system for use with a display are disclosed. The light field metrology may capture images of a projected light field, and determine focus depths (or lateral focus positions) for various regions of the light field using the captured images. The determined focus depths (or lateral positions) may then be compared with intended focus depths (or lateral positions), to quantify the imperfections of the display. Based on the measured imperfections, an appropriate error correction may be performed on the light field to correct for the measured imperfections. The display can be an optical display element in a head mounted display, for example, an optical display element capable of generating multiple depth planes or a light field display.

Abstract: A stacked waveguide assembly can have multiple waveguide stacks. Each waveguide stack can include a plurality of waveguides, where a first waveguide stack may be associated with a first subcolor of each of three different colors, and a second waveguide stack may be associated with a second subcolor of each of the three different colors. For example, the first stack of waveguides can incouple blue, green, and red light at 440 nm, 520 nm, and 650 nm, respectively. The second stack of waveguides can incouple blue, green, and red light at 450 nm, 530 nm, and 660 nm, respectively.

Abstract: Examples of a light field metrology system for use with a display are disclosed. The light field metrology may capture images of a projected light field, and determine focus depths (or lateral focus positions) for various regions of the light field using the captured images. The determined focus depths (or lateral positions) may then be compared with intended focus depths (or lateral positions), to quantify the imperfections of the display. Based on the measured imperfections, an appropriate error correction may be performed on the light field to correct for the measured imperfections. The display can be an optical display element in a head mounted display, for example, an optical display element capable of generating multiple depth planes or a light field display.

Abstract: Examples of a light field metrology system for use with a display are disclosed. The light field metrology may capture images of a projected light field, and determine focus depths (or lateral focus positions) for various regions of the light field using the captured images. The determined focus depths (or lateral positions) may then be compared with intended focus depths (or lateral positions), to quantify the imperfections of the display. Based on the measured imperfections, an appropriate error correction may be performed on the light field to correct for the measured imperfections. The display can be an optical display element in a head mounted display, for example, an optical display element capable of generating multiple depth planes or a light field display.

Abstract: Examples of a light field metrology system for use with a display are disclosed. The light field metrology may capture images of a projected light field, and determine focus depths (or lateral focus positions) for various regions of the light field using the captured images. The determined focus depths (or lateral positions) may then be compared with intended focus depths (or lateral positions), to quantify the imperfections of the display. Based on the measured imperfections, an appropriate error correction may be performed on the light field to correct for the measured imperfections. The display can be an optical display element in a head mounted display, for example, an optical display element capable of generating multiple depth planes or a light field display.

Abstract: Examples of a light field metrology system for use with a display are disclosed. The light field metrology may capture images of a projected light field, and determine focus depths (or lateral focus positions) for various regions of the light field using the captured images. The determined focus depths (or lateral positions) may then be compared with intended focus depths (or lateral positions), to quantify the imperfections of the display. Based on the measured imperfections, an appropriate error correction may be performed on the light field to correct for the measured imperfections. The display can be an optical display element in a head mounted display, for example, an optical display element capable of generating multiple depth planes or a light field display.

Abstract: In a stacked waveguide assembly, the waveguides can comprise color filters, distributed filters, and/or switch materials. Examples of color filters include dyes, tints, or stains. Examples of distributed filters and/or switch materials include dichroic filters, Bragg gratings, electronically switchable glass, and electronically switchable mirrors. Switch materials can be designed or tuned to attenuate light of unwanted colors or wavelengths. The waveguides may each be associated with a particular design wavelength. This can mean that a waveguide that is associated with a design wavelength includes an incoupling optical element is configured to deflect light at the design wavelength to an associated light distributing element and that the associated wavelength selective region is configured to attenuate light not at the design wavelength.

Abstract: In a stacked waveguide assembly, the waveguides can comprise color filters, distributed filters, and/or switch materials. Examples of color filters include dyes, tints, or stains. Examples of distributed filters and/or switch materials include dichroic filters, Bragg gratings, electronically switchable glass, and electronically switchable mirrors. Switch materials can be designed or tuned to attenuate light of unwanted colors or wavelengths. The waveguides may each be associated with a particular design wavelength. This can mean that a waveguide that is associated with a design wavelength includes an incoupling optical element is configured to deflect light at the design wavelength to an associated light distributing element and that the associated wavelength selective region is configured to attenuate light not at the design wavelength.

Abstract: In a stacked waveguide assembly, the waveguides can comprise color filters, distributed filters, and/or switch materials. Examples of color filters include dyes, tints, or stains. Examples of distributed filters and/or switch materials include dichroic filters, Bragg gratings, electronically switchable glass, and electronically switchable mirrors. Switch materials can be designed or tuned to attenuate light of unwanted colors or wavelengths. The waveguides may each be associated with a particular design wavelength. This can mean that a waveguide that is associated with a design wavelength includes an incoupling optical element is configured to deflect light at the design wavelength to an associated light distributing element and that the associated wavelength selective region is configured to attenuate light not at the design wavelength.

Abstract: A stacked waveguide assembly can have multiple waveguide stacks. Each waveguide stack can include a plurality of waveguides, where a first waveguide stack may be associated with a first subcolor of each of three different colors, and a second waveguide stack may be associated with a second subcolor of each of the three different colors. For example, the first stack of waveguides can incouple blue, green, and red light at 440 nm, 520 nm, and 650 nm, respectively. The second stack of waveguides can incouple blue, green, and red light at 450 nm, 530 nm, and 660 nm, respectively.

Abstract: Examples of a light field metrology system for use with a display are disclosed. The light field metrology may capture images of a projected light field, and determine focus depths (or lateral focus positions) for various regions of the light field using the captured images. The determined focus depths (or lateral positions) may then be compared with intended focus depths (or lateral positions), to quantify the imperfections of the display. Based on the measured imperfections, an appropriate error correction may be performed on the light field to correct for the measured imperfections. The display can be an optical display element in a head mounted display, for example, an optical display element capable of generating multiple depth planes or a light field display.

Abstract: Examples of a light field metrology system for use with a display are disclosed. The light field metrology may capture images of a projected light field, and determine focus depths (or lateral focus positions) for various regions of the light field using the captured images. The determined focus depths (or lateral positions) may then be compared with intended focus depths (or lateral positions), to quantify the imperfections of the display. Based on the measured imperfections, an appropriate error correction may be performed on the light field to correct for the measured imperfections. The display can be an optical display element in a head mounted display, for example, an optical display element capable of generating multiple depth planes or a light field display.