Patents by Inventor Lior Katz
Lior Katz has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Publication number: 20230377125Abstract: There is provided a system and method of defect detection of a semiconductor specimen. The method includes obtaining a first image of the specimen acquired at a first bit depth, converting by a first processor the first image to a second image with a second bit depth lower than the first bit depth, transmitting the second image to a second processor configured to perform first defect detection on the second image using a first defect detection algorithm to obtain a first set of defect candidates, and sending locations of the first set of defect candidates to the first processor, extracting, from the first image, a set of image patches corresponding to the first set of defect candidates based on the locations, and performing second defect detection on the set of image patches using a second defect detection algorithm to obtain a second set of defect candidates.Type: ApplicationFiled: May 19, 2022Publication date: November 23, 2023Inventors: Boaz DUDOVICH, Assaf ARIEL, Amir BAR, Lior YEHIELI, Chen ITZIKOWITZ, Shiran BEN ISRAEL, Lior KATZ, Eli Oren JONI, Eyal ROT
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Patent number: 11386539Abstract: A system and method for specimen examination, the system comprising a processing and memory circuitry (PMC) for: obtaining an image of at least a part of a specimen, the image acquired by an examination tool; receiving one or more characteristics of a defect of interest and a location of interest associated therewith; modifying within the image one or more pixels corresponding to the location of interest, wherein the modification is provided in accordance with a characteristic of the defect of interest, thereby planting the defect of interest into the image; processing the modified image to detect locations of potential defects of the specimen in accordance with a detection recipe; and determining whether the detected locations include the location of interest. Subject to the location of interest not being detected, modifying the detection recipe to enable detecting the planted defect of interest at the location of interest.Type: GrantFiled: May 29, 2019Date of Patent: July 12, 2022Assignee: Applied Materials Israel Ltd.Inventors: Elad Cohen, Yuri Feigin, Lior Katz, Eyal Neistein
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Patent number: 11107207Abstract: A method and system for detecting defects in a specimen, the method comprising: obtaining an image comprising a plurality of pixels of a specimen part; processing the image according to a detection recipe to derive information related to potential defects in the specimen, the information comprising a first data set informative of first locations identified, in accordance with the detection recipe as locations of potential defects, and a second data set informative of second locations not identified as locations of potential defects; receiving data specifying targeted locations of interest within the part of the specimen; when the first data set is not informative of each targeted location, generating a third data set by adding to the first data set information related to the missing targeted location from the second data set, the information bearing an indication that it corresponds to a targeted location; and outputting the third data set.Type: GrantFiled: August 6, 2019Date of Patent: August 31, 2021Assignee: Applied Materials Israel Ltd.Inventors: Elad Cohen, Yuri Feigin, Lior Katz, Eyal Neistein
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Patent number: 10992840Abstract: An example is provided to calculate calibration data for or print quality data of a printer, in one example, image data on printed elements of a plurality of patches printed at different powers or intensities by a print device may be determined.Type: GrantFiled: October 20, 2016Date of Patent: April 27, 2021Assignee: HP Indigo B.V.Inventors: Uri Lidai, Rivay Mor, Lior Katz, Iliya Shahamov, Pavel Blinchuk
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Publication number: 20210042905Abstract: A method and system for detecting defects in a specimen, the method comprising: obtaining an image comprising a plurality of pixels of a specimen part; processing the image according to a detection recipe to derive information related to potential defects in the specimen, said information comprising a first data set informative of first locations identified, in accordance with the detection recipe as locations of potential defects, and a second data set informative of second locations not identified as locations of potential defects; receiving data specifying targeted locations of interest within the part of the specimen; when the first data set is not informative of each targeted location, generating a third data set by adding to the first data set information related to the missing targeted location from the second data set, the information bearing an indication that it corresponds to a targeted location; and outputting the third data set.Type: ApplicationFiled: August 6, 2019Publication date: February 11, 2021Inventors: Elad COHEN, Yuri FEIGIN, Lior KATZ, Eyal NEISTEIN
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Publication number: 20200380662Abstract: A system and method for specimen examination, the system comprising a processing and memory circuitry (PMC) for: obtaining an image of at least a part of a specimen, the image acquired by an examination tool; receiving one or more characteristics of a defect of interest and a location of interest associated therewith; modifying within the image one or more pixels corresponding to the location of interest, wherein the modification is provided in accordance with a characteristic of the defect of interest, thereby planting the defect of interest into the image; processing the modified image to detect locations of potential defects of the specimen in accordance with a detection recipe; and determining whether the detected locations include the location of interest. Subject to the location of interest not being detected, modifying the detection recipe to enable detecting the planted defect of interest at the location of interest.Type: ApplicationFiled: May 29, 2019Publication date: December 3, 2020Inventors: Elad COHEN, Yuri FEIGIN, Lior KATZ, Eyal NEISTEIN
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Publication number: 20200192234Abstract: An electrostatic ink composition is disclosed. The electrostatic ink composition can comprise: a liquid carrier; and particles dispersed in the liquid carrier, wherein the particles comprise a thermoplastic resin, and a metal or metal alloy pigment having a melting of point of less than about 200° C. The metal or metal alloy pigment can have a diameter of from about 0.01 ?m to about 50 ?m.Type: ApplicationFiled: March 28, 2017Publication date: June 18, 2020Applicant: HP Indigo B.V.Inventors: Ariel HAGEGE, Yaron GRINWALD, Gregory KATZ, Regina GUSLITZER, Ziv GiLAN, Yavin ATZMON, Lior KATZ
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Publication number: 20190268503Abstract: An example is provided to calculate calibration data for or print quality data of a printer, in one example, image data on printed elements of a plurality of patches printed at different powers or intensities by a print device may be determined.Type: ApplicationFiled: October 20, 2016Publication date: August 29, 2019Applicant: HP Indigo B.V.Inventors: Uri Lidai, Rivay Mor, Lior Katz, Iliya Shahamov, Pavel Blinchuk
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Patent number: 10165150Abstract: A printer (300) is disclosed. The printer has two scanners (336, 338) in the paper path of the printer located after the print zone (346). The two scanners are spaced apart from each other by a known distance A and overlap each other in a direction perpendicular to the media axis of travel. The two scanners capture a first and second image of the media.Type: GrantFiled: November 22, 2013Date of Patent: December 25, 2018Assignee: HP Indigo B.V.Inventors: Ran Waidman, Sagi Refael, Lior Katz
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Patent number: 10031458Abstract: A method includes forming a second set of printing dots on a photosensitive member by a printing dot applicator corresponding to image data of second portions of the image adjacent to first portions of the image. The second set of printing dots are formed on the photosensitive member after the first set of printing dots have been transferred from the photosensitive member. Thus, a merging of adjacent printing dots due to an electrical interaction there between on the photosensitive member is reduced.Type: GrantFiled: September 26, 2014Date of Patent: July 24, 2018Assignee: HP Indigo B.V.Inventors: Yohanan Sivan, Ran Waidman, Lior Katz
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Publication number: 20170219978Abstract: A method includes forming a second set of printing dots on a photosensitive member by a printing dot applicator corresponding to image data of second portions of the image adjacent to first portions of the image. The second set of printing dots are formed on the photosensitive member after the first set of printing dots have been transferred from the photosensitive member. Thus, a merging of adjacent printing dots due to an electrical interaction there between on the photosensitive member is reduced.Type: ApplicationFiled: September 26, 2014Publication date: August 3, 2017Inventors: Yohanan Sivan, Ran Waidman, Lior Katz
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Publication number: 20160277629Abstract: A printer (300) is disclosed. The printer has two scanners (336, 338) in the paper path of the printer located after the print zone (346). The two scanners are spaced appart from each other by a known distance A and overlap each other in a direction perpendicular to the media axis of travel. The two scanners capture a first and second image of the media.Type: ApplicationFiled: November 22, 2013Publication date: September 22, 2016Applicant: HEWLETT-PACKARD INDIGO B.V.Inventors: Ran Waidman, Sagi Refael, Lior Katz
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Patent number: 9253371Abstract: A system can comprise a memory to store machine readable instructions and a processing unit to access the memory and execute the machine readable instructions. The machine readable instructions can comprise a press color state (PCS) estimator to calculate an optical density for each of four single separation solid colors based on a color measurement provided by a scanner. The color measurement can characterize material printed on a substrate and scanned by a scanner. The PCS estimator can also provide an updated LUT for each of the four single separation colors based on the color measurement provided by the scanner. The machine readable instructions can comprise a print controller to provide the optical density for each of the four single separation solid colors and the updated LUT to a printer to facilitate color calibration of the printer.Type: GrantFiled: December 27, 2011Date of Patent: February 2, 2016Assignee: Hewlett-Packard Development Company, L.P.Inventors: Kogan Hadas, Doron Shaked, Lior Katz
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Patent number: 9124754Abstract: A method for position calibration of a spot of a known geometry of an optical sensor is disclosed. The method may include providing a position calibration patch on a sheet at a position which is known with respect to a reference position on the sheet, along a scan path of the spot of the optical sensor across the sheet. The patch may include at least two adjacent blocks of different colors. The method may also include obtaining a sampling of the position calibration patch using the optical sensor. The method may further include determining from the sampling a relative coverage of the spot over the color blocks of the position calibration patch, and based on the known geometry of the spot and on the determined relative coverage, determining the position of the spot of the sensor with respect to the reference position.Type: GrantFiled: June 8, 2011Date of Patent: September 1, 2015Assignee: Hewlett-Packard Indigo B.V.Inventors: Nadav Barkai, Lior Katz, Gal Amit
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Patent number: 9063884Abstract: A signal from a system, such as a reactive system, that reflects health indicators of the system may be selected. A signal analyzer may extract the health indicators from the signal and conduct a diagnostics of the health of the system based on the health indicators.Type: GrantFiled: October 23, 2012Date of Patent: June 23, 2015Assignee: Hewlett-Packard Development Company, L.P.Inventors: Ayelet Pnueli, Ami Shiff, Avner Arnstein, Ron Maurer, Tsafrir Yedid Am, Lior Katz
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Patent number: 9036206Abstract: Techniques for correcting the color uniformity of a laser printer of a digital press or other device are provided. A process for correcting the color uniformity of a laser printer may include scanning a test page by an inline scanner of a digital press, determining scanner signal data from the test page, determining a scanner polynomial fitted to the scanner signal data, and determining a non-uniform coverage polynomial from the scanner polynomial. Additionally, techniques for verifying the linearity of a scanner are also provided.Type: GrantFiled: June 22, 2011Date of Patent: May 19, 2015Assignee: Hewlett-Packard Development Company, L.P.Inventors: Michal Aharon, Hadas Kogan, Meirav Naaman, Lior Katz
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Patent number: 8736905Abstract: A method for position calibration of a spot of an optical sensor may include providing a position calibration patch on a sheet at a predetermined position, along a scan path of the spot across the sheet, the patch comprising at least two adjacent blocks of different colors. The method may also include obtaining a single sample of the position calibration patch using the optical sensor. The method may further include determining from the single sample the position of the spot of the sensor with respect to the position calibration patch.Type: GrantFiled: December 15, 2011Date of Patent: May 27, 2014Assignee: Hewlett-Packard Indigo B.V.Inventors: Nadav Barkai, Gal Amit, Lior Katz
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Publication number: 20140111836Abstract: Techniques for correcting the color uniformity of a laser printer of a digital press or other device are provided. A process for correcting the color uniformity of a laser printer may include scanning a test page by an inline scanner of a digital press, determining scanner signal data from the test page, determining a scanner polynomial fitted to the scanner signal data, and determining a non-uniform coverage polynomial from the scanner polynomial. Additionally, techniques for verifying the linearity of a scanner are also provided.Type: ApplicationFiled: June 22, 2011Publication date: April 24, 2014Inventors: Michal Aharon, Hadas Kogan, Meirav Naaman, Lior Katz
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Publication number: 20140115398Abstract: A signal from a system, such as a reactive system, that reflects health indicators of the system may be selected. A signal analyzer may extract the health indicators from the signal and conduct a diagnostics of the health of the system based on the health indicators.Type: ApplicationFiled: October 23, 2012Publication date: April 24, 2014Applicant: HEWLETT-PACKARD DEVELOPMENT COMPANY, L.P.Inventors: Ayelet Pnueli, Ami Shiff, Avner Arnstein, Ron Maurer, Tsafrir Yedid Am, Lior Katz
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Publication number: 20140092402Abstract: A method for position calibration of a spot of a known geometry of an optical sensor is disclosed. The method may include providing a position calibration patch on a sheet at a position which is known with respect to a reference position on the sheet, along a scan path of the spot of the optical sensor across the sheet. The patch may include at least two adjacent blocks of different colors. The method may also include obtaining a sampling of the position calibration patch using the optical sensor. The method may further include determining from the sampling a relative coverage of the spot over the color blocks of the position calibration patch, and based on the known geometry of the spot and on the determined relative coverage, determining the position of the spot of the sensor with respect to the reference position.Type: ApplicationFiled: June 8, 2011Publication date: April 3, 2014Inventors: Nadav Barkai, Lior Katz, Gal Amit