Abstract: The present application discloses a method, an apparatus for superimposing laser point clouds and a high-precision map and an electronic device, comprising: when superimposing the laser point clouds and the high-precision map for visualization, first performing dilution processing on non-road laser point clouds in the laser point clouds to be fused to obtain target non-road laser point clouds, which effectively reduces the amount of data of the laser point clouds to be fused; and performing segmentation processing on the map to be fused to obtain multi-level map data corresponding to the map to be fused, which effectively reduces the amount of data of the map to be fused. In this way, when superimposing the laser point clouds and the high-precision map for visualization, both non-road information may be visualized through the laser point clouds, and road information may be visualized through the high-precision map.

Abstract: The present application discloses a method, an apparatus for superimposing laser point clouds and a high-precision map and an electronic device, comprising: when superimposing the laser point clouds and the high-precision map for visualization, first performing dilution processing on non-road laser point clouds in the laser point clouds to be fused to obtain target non-road laser point clouds, which effectively reduces the amount of data of the laser point clouds to be fused; and performing segmentation processing on the map to be fused to obtain multi-level map data corresponding to the map to be fused, which effectively reduces the amount of data of the map to be fused. In this way, when superimposing the laser point clouds and the high-precision map for visualization, both non-road information may be visualized through the laser point clouds, and road information may be visualized through the high-precision map.

Abstract: The present invention relates to fields of continuous directional catalysis of soybean slurry to extract protein and functional oil with nano-magnetic immobilized enzymes. The present invention discloses soybean slurry as raw material and continuous mobile phase, and nano-magnetic immobilized enzymes as stationary phase applied in three-phase magnetic fluidized bed. The present invention provides a method of enzymatic disrupting cell walls by nano-magnetic immobilized enzyme cocktail including cellulose, pectinase and alkaline protease. The method can he used to break down lipoprotein, lipopolysaccharide complex and break lipoprotein film on the surface of lipoprotein to release the lipid. The present invention also provides a method to catalyze phospholipid using nano-magnetic immobilized phospholipase to change the polarity of phospholipids and control liquid emulsification phenomenon. The enzymes disclosed in the present invention do not interfere with each other.

Abstract: An electronic test structure and method for testing non-volatile memory cells. The structure includes a first transistor coupled in series to a floating gate transistor whereby a source of the first transistor is coupled to a positive power supply voltage and a source of the floating gate transistor is coupled to a power supply ground. A gate of the first transistor is further coupled to a source of the first transistor. A second transistor is coupled in series with a memory cell with a source of the second transistor coupled to a positive power supply voltage and a gate of the second transistor is coupled to the drain of the first transistor.

Abstract: A method for preventing snap-back in a circuit including at least one MOS transistor having a parasitic bipolar transistor associated with it includes coupling a circuit node including at least one source/drain node of the at least one MOS transistor to a bias-voltage circuit and enabling the bias-voltage circuit to supply a potential to the at least one source/drain node of the at least on MOS transistor, the potential having a magnitude selected to prevent the parasitic bipolar transistor from turning on.

Abstract: A method for preventing snap-back in a circuit including at least one MOS transistor having a parasitic bipolar transistor associated with it includes coupling a circuit node including at least one source/drain node of the at least one MOS transistor to a bias-voltage circuit and enabling the bias-voltage circuit to supply a potential to the at least one source/drain node of the at least on MOS transistor, the potential having a magnitude selected to prevent the parasitic bipolar transistor from turning on.

Abstract: Circuitry for testing a power-on-reset circuit in an integrated circuit includes a high-voltage detector coupled to a first I/O pad of the integrated circuit. A power-on-reset circuit in the integrated circuit has an output coupled to a driver circuit that is powered by the high-voltage. A second I/O pad of the integrated circuit is coupled to the output of the driver circuit. The driver circuit may be enabled by a signal provided on a third I/O pad of the integrated circuit.

Abstract: An electronic test structure and method for testing non-volatile memory cells. The structure includes a first transistor coupled in series to a floating gate transistor whereby a source of the first transistor is coupled to a positive power supply voltage and a source of the floating gate transistor is coupled to a power supply ground. A gate of the first transistor is further coupled to a source of the first transistor. A second transistor is coupled in series with a memory cell with a source of the second transistor coupled to a positive power supply voltage and a gate of the second transistor is coupled to the drain of the first transistor.

Abstract: An electronic test structure and method for testing non-volatile memory cells. The structure includes a first transistor coupled in series to a floating gate transistor whereby a source of the first transistor is coupled to a positive power supply voltage and a source of the floating gate transistor is coupled to a power supply ground. A gate of the first transistor is further coupled to a source of the first transistor. A second transistor is coupled in series with a memory cell with a source of the second transistor coupled to a positive power supply voltage and a gate of the second transistor is coupled to the drain of the first transistor.

Abstract: Circuitry for testing a power-on-reset circuit in an integrated circuit includes a high-voltage detector coupled to a first I/O pad of the integrated circuit. A power-on-reset circuit in the integrated circuit has an output coupled to a driver circuit that is powered by the high-voltage. A second I/O pad of the integrated circuit is coupled to the output of the driver circuit. The driver circuit may be enabled by a signal provided on a third I/O pad of the integrated circuit.

Abstract: An electronic test structure and method for testing non-volatile memory cells. The structure includes a first transistor coupled in series to a floating gate transistor whereby a source of the first transistor is coupled to a positive power supply voltage and a source of the floating gate transistor is coupled to a power supply ground. A gate of the first transistor is further coupled to a source of the first transistor. A second transistor is coupled in series with a memory cell with a source of the second transistor coupled to a positive power supply voltage and a gate of the second transistor is coupled to the drain of the first transistor.

Abstract: A bitline selection network is composed of a plurality of bitlines and a plurality of global bitlines. The bitlines are grouped into bytes with eight bitlines per byte. The bitlines provide access to memory cells for read and write operations. A bitline is connected to a global bitline through a bitline select transistor. Each of the bitline select transistors is activated one at a time by a bitline select controller. Activation of each bitline select transistor provides a connection to a source line, which in turn connects to a sense amplifier and a write data loading logic block. The sense amplifier and the write data loading logic block are used in read and write operations respectively.

Abstract: A bitline selection network is composed of a plurality of bitlines and a plurality of global bitlines. The bitlines are grouped into bytes with eight bitlines per byte. The bitlines provide access to memory cells for read and write operations. A bitline is connected to a global bitline through a bitline select transistor. Each of the bitline select transistors is activated one at a time by a bitline select controller. Activation of each bitline select transistor provides a connection to a source line, which in turn connects to a sense amplifier and a write data loading logic block. The sense amplifier and the write data loading logic block are used in read and write operations respectively.

Abstract: Fuse data used to configure ancillary circuits used with a non-volatile serial memory core are stored in locations within the memory core. As a first opcode or word is sent on a serial bus to the memory, a logic circuit intercepts the word and generates read fuse enable pulses that fetch the fuse data and configure the ancillary circuits before the last bit of the first command byte arrives. If a read operation is designated, the memory circuits are configured to read. If a write operation is designated, further fuse data is fetched from the memory core to configure ancillary circuits for writing. The fuse data is written to the memory core at the time of circuit manufacture thereby obviating the need for separate storage locations.

Abstract: A multiplexer circuit in a memory organized into page-portions has a plurality of bit-select multiplexers configured to couple a plurality of page-portion global bitlines to a sense amplifier input. A plurality of column address lines organized into data bytes comprises each page-portion. A plurality of column multiplexers couple the data bytes to the page-portion global bitlines such that each of the address lines comprising the data byte is coupled to one of the page-portion global bitlines.

Abstract: Fuse data used to configure ancillary circuits used with a non-volatile serial memory core are stored in locations within the memory core. As a first opcode or word is sent on a serial bus to the memory, a logic circuit intercepts the word and generates read fuse enable pulses that fetch the fuse data and configure the ancillary circuits before the last bit of the first command byte arrives. If a read operation is designated, the memory circuits are configured to read. If a write operation is designated, further fuse data is fetched from the memory core to configure ancillary circuits for writing. The fuse data is written to the memory core at the time of circuit manufacture thereby obviating the need for separate storage locations.