Patents by Inventor Liquan Fang

Liquan Fang has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8527822
    Abstract: An electronic circuit having a boundary scan test circuit receives, though one pin, an embedded clock encoded test signal having an encoded bit stream having occurrences of a first header followed by at least one encoded boundary scan mode bit and an encoded second header followed by at least one boundary scan test input bit. The bit stream and the clock are extracted and occurrences of the first header and second header are detected. Based on the detected occurrences the boundary scan mode bits and boundary scan input bits are identified and distributed to the electronic circuit, along with the extracted clock, and boundary scan test is performed.
    Type: Grant
    Filed: October 19, 2009
    Date of Patent: September 3, 2013
    Assignee: NXP B.V.
    Inventors: Henk Boezen, Leon Van de Logt, Liquan Fang
  • Publication number: 20110093751
    Abstract: An electronic circuit having a boundary scan test circuit receives, though one pin, an embedded clock encoded test signal having an encoded bit stream having occurrences of a first header followed by at least one encoded boundary scan mode bit and an encoded second header followed by at least one boundary scan test input bit. The bit stream and the clock are extracted and occurrences of the first header and second header are detected. Based on the detected occurrences the boundary scan mode bits and boundary scan input bits are identified and distributed to the electronic circuit, along with the extracted clock, and boundary scan test is performed.
    Type: Application
    Filed: October 19, 2009
    Publication date: April 21, 2011
    Applicant: NXP B.V.
    Inventors: Henk Boezen, Leon Van de Logt, Liquan Fang