Patents by Inventor Lisha PENG

Lisha PENG has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11378548
    Abstract: A device and a method for testing a steel defect based on internal and external magnetic perturbation. The device includes: a magnetizer comprising a magnetization source and a magnet yoke, arranged on a surface of a sample, and configured to generate two types of typical magnetic field regions applied to testing based on internal and external magnetic perturbation; a double-row magnetic sensor probe, configured to collect internal and external magnetic perturbation data; a master controller, configured to perform pre-processing on the internal and external magnetic perturbation data, and store the pre-processed data; scanner wheels, configured to generate a sampling trigger pulse during scanning to enable the master controller to receive the internal and external magnetic perturbation data from the probes; and a host computer, configured to analyze the pre-processed data uploaded by the master controller to obtain a defect quantitative result.
    Type: Grant
    Filed: January 12, 2021
    Date of Patent: July 5, 2022
    Assignee: TSINGHUA UNIVERSITY
    Inventors: Songling Huang, Wenzhi Wang, Wei Zhao, Shen Wang, Zijing Huang, Xiaochun Song, Lisha Peng
  • Publication number: 20210396711
    Abstract: The present disclosure provides a device and a method for testing a steel defect based on internal and external magnetic perturbation. The device includes: a magnetizer comprising a magnetization source and a magnet yoke, arranged on a surface of a sample, and configured to generate two types of typical magnetic field regions applied to testing based on internal and external magnetic perturbation; a double-row magnetic sensor probe, configured to collect internal and external magnetic perturbation data; a master controller, configured to perform pre-processing on the internal and external magnetic perturbation data, and store the pre-processed data; scanner wheels, configured to generate a sampling trigger pulse during scanning to enable the master controller to receive the internal and external magnetic perturbation data from the probes; and a host computer, configured to analyze the pre-processed data uploaded by the master controller to obtain a defect quantitative result.
    Type: Application
    Filed: January 12, 2021
    Publication date: December 23, 2021
    Inventors: Songling HUANG, Wenzhi WANG, Wei ZHAO, Shen WANG, Zijing HUANG, Xiaochun SONG, Lisha PENG
  • Patent number: 11150311
    Abstract: A device and a method for detecting a defect contour with omnidirectionally equal sensitivity based on magnetic excitation are provided. The device includes a magnetic sensor array arranged in a spatially uniform magnetic field and configured to collect a magnetic field signal, and a data analysis module configured to analyze the magnetic field signal, extract a distorted magnetic field signal, and obtain an image of the defect contour based on the distorted magnetic field signal.
    Type: Grant
    Filed: June 17, 2020
    Date of Patent: October 19, 2021
    Assignee: TSINGHUA UNIVERSITY
    Inventors: Songling Huang, Wenzhi Wang, Lisha Peng, Wei Zhao, Shen Wang, Zijing Huang
  • Patent number: 11099156
    Abstract: The present disclosure provides a method and a device for detecting and evaluating a defect with electromagnetic multi-field coupling. The method includes magnetizing a pipeline with the electromagnetic multi-field coupling; detecting a defect of the pipeline along an axial direction of the pipeline at a constant speed; collecting signals at a position of the defect to obtain magnetic leakage signals in three dimensions and an electrical impedance signal; pre-processing the collected signals; decoupling the pre-processed signals, to obtain decoupled magnetic leakage signals and a decoupled electrical impedance signal; performing impedance analysis on the decoupled electrical impedance signal, and determining a type of the defect based on a phase angle of the decoupled electrical impedance signal; and performing quantification analysis on the decoupled magnetic leakage signals and performing quantification evaluation on a size of the defect using a neural network defect quantification method.
    Type: Grant
    Filed: May 6, 2019
    Date of Patent: August 24, 2021
    Assignee: TSINGHUA UNIVERSITY
    Inventors: Songling Huang, Wei Zhao, Shen Wang, Xinjie Yu, Lisha Peng, Jun Zou, Fuping Wang, Jiarui Dong, Lin Gui, Yue Long
  • Publication number: 20210181270
    Abstract: A device and a method for detecting a defect contour with omnidirectionally equal sensitivity based on magnetic excitation are provided. The device includes a magnetic sensor array arranged in a spatially uniform magnetic field and configured to collect a magnetic field signal, and a data analysis module configured to analyze the magnetic field signal, extract a distorted magnetic field signal, and obtain an image of the defect contour based on the distorted magnetic field signal.
    Type: Application
    Filed: June 17, 2020
    Publication date: June 17, 2021
    Inventors: Songling HUANG, Wenzhi WANG, Lisha PENG, Wei ZHAO, Shen WANG, Zijing HUANG
  • Patent number: 10935520
    Abstract: A method for reconstructing a defect includes: S1, establishing a database of magnetic flux leakage signals of a unit defect and acquiring a magnetic flux leakage signal of the unit defect; S2, acquiring a target magnetic flux leakage signal; S3, initially setting a scaling factor k; S4, constructing a forward model; S5, inputting the k into the forward model and performing forward prediction according to the k to acquire a predicted magnetic flux leakage signal for the defect to be detected; S6, calculating an error between the target magnetic flux leakage signal and the predicted magnetic flux leakage signal, and determining whether the error is smaller than an error threshold ?, if yes, executing S7; otherwise, executing S5 after the k is corrected; and S7, scaling the unit defect according to the k to acquire a final size of the defect to be detected.
    Type: Grant
    Filed: March 2, 2018
    Date of Patent: March 2, 2021
    Assignee: TSINGHUA UNIVERSITY
    Inventors: Songling Huang, Wei Zhao, Lisha Peng, Shen Wang, Di Cheng, Jiarui Dong
  • Patent number: 10788454
    Abstract: A method for identifying a defect opening profile includes: acquiring a vertical component of a magnetic flux leakage signal of a defect; identifying right-angle features and corresponding right-angle position points of the defect from the vertical component; obtaining all possible right-angle types at each right-angle position point of the defect according to the corresponding right-angle feature of the vertical component; traversing all the possible right-angle types at each right-angle position point to determine respective optimal right-angle type at each right-angle position point; and drawing the defect opening profile according to the respective optimal right-angle type at each right-angle position point.
    Type: Grant
    Filed: July 25, 2018
    Date of Patent: September 29, 2020
    Assignees: HUBEI UNIVERSITY OF TECHNOLOGY, TSINGHUA UNIVERSITY
    Inventors: Songling Huang, Xiaochun Song, Lisha Peng, Wei Zhao, Shen Wang, Xinjie Yu, Shisong Li
  • Publication number: 20200003729
    Abstract: The present disclosure provides a method and a device for detecting and evaluating a defect with electromagnetic multi-field coupling. The method includes magnetizing a pipeline with the electromagnetic multi-field coupling; detecting a defect of the pipeline along an axial direction of the pipeline at a constant speed; collecting signals at a position of the defect to obtain magnetic leakage signals in three dimensions and an electrical impedance signal; pre-processing the collected signals; decoupling the pre-processed signals, to obtain decoupled magnetic leakage signals and a decoupled electrical impedance signal; performing impedance analysis on the decoupled electrical impedance signal, and determining a type of the defect based on a phase angle of the decoupled electrical impedance signal; and performing quantification analysis on the decoupled magnetic leakage signals and performing quantification evaluation on a size of the defect using a neural network defect quantification method.
    Type: Application
    Filed: May 6, 2019
    Publication date: January 2, 2020
    Inventors: Songling HUANG, Wei ZHAO, Shen WANG, Xinjie YU, Lisha PENG, Jun ZOU, Fuping WANG, Jiarui DONG, Lin GUI, Yue LONG
  • Patent number: 10338160
    Abstract: A high-precision imaging and detecting device for detecting a small defect of a pipeline by a helical magnetic matrix. The device includes: a helical excitation module including a helical excitation coil; a magnetic matrix detection module, disposed at an inner side of the helical excitation coil and including at least one magnetic sensor group arranged at intervals along an axial direction of the helical excitation coil, group including a plurality of magnetic sensors evenly spaced apart and arranged along a circumferential direction of the helical excitation coil, and the magnetic sensor being configured to detect an induction magnetic field of the pipeline; a signal processing module, connected with the magnetic matrix detection module, and configured to receive, process and output an induction magnetic field signal of the pipeline detected by the magnetic sensor.
    Type: Grant
    Filed: December 13, 2017
    Date of Patent: July 2, 2019
    Assignee: TSINGHUA UNIVERSITY
    Inventors: Songling Huang, Wei Zhao, Shen Wang, Lisha Peng, Yu Zhang, Xinjie Yu, Jun Zou, Lin Gui, Fuping Wang
  • Publication number: 20190049409
    Abstract: A method for identifying a defect opening profile includes: acquiring a vertical component of a magnetic flux leakage signal of a defect; identifying right-angle features and corresponding right-angle position points of the defect from the vertical component; obtaining all possible right-angle types at each right-angle position point of the defect according to the corresponding right-angle feature of the vertical component; traversing all the possible right-angle types at each right-angle position point to determine respective optimal right-angle type at each right-angle position point; and drawing the defect opening profile according to the respective optimal right-angle type at each right-angle position point.
    Type: Application
    Filed: July 25, 2018
    Publication date: February 14, 2019
    Inventors: Songling HUANG, Xiaochun SONG, Lisha PENG, Wei ZHAO, Shen WANG, Xinjie YU, Shisong LI
  • Publication number: 20190004124
    Abstract: A high-precision imaging and detecting device for detecting a small defect of a pipeline by a helical magnetic matrix. The device includes: a helical excitation module including a helical excitation coil; a magnetic matrix detection module, disposed at an inner side of the helical excitation coil and including at least one magnetic sensor group arranged at intervals along an axial direction of the helical excitation coil, group including a plurality of magnetic sensors evenly spaced apart and arranged along a circumferential direction of the helical excitation coil, and the magnetic sensor being configured to detect an induction magnetic field of the pipeline; a signal processing module, connected with the magnetic matrix detection module, and configured to receive, process and output an induction magnetic field signal of the pipeline detected by the magnetic sensor.
    Type: Application
    Filed: December 13, 2017
    Publication date: January 3, 2019
    Inventors: Songling HUANG, Wei Zhao, Shen Wang, Lisha Peng, Yu Zhang, Xinjie Yu, Jun Zou, Lin Gui, Fuping Wang
  • Publication number: 20180299516
    Abstract: The method for calculating an MFL signal of a defect includes: determining sizes l0, w0 and d0 of an element defect according to sizes l, w and d of a target defect, acquiring an MFL signal HE (x, y, z) of the element defect; subjecting the MFL signal HE(x, y, z) to a three-dimensional Fourier transformation to acquire a frequency domain signal FE(?, ?, ?); subjecting the FE(?, ?, ?) to a translation transformation in the magnetization direction to acquire two frequency domain signals FE??(?, ?, ?) and FE?+(?, ?, ?); combining the FE??(?, ?, ?) and FE?+(?, ?, ?) to acquire a combined frequency domain signal FEcombine(?, ?, ?); subjecting the combined frequency domain signal FEcombine(?, ?, ?) to a three-dimensional inverse Fourier transformation to acquire an MFL signal HT(x, y, z) of the target defect.
    Type: Application
    Filed: April 4, 2018
    Publication date: October 18, 2018
    Inventors: Songling HUANG, Xiaochun SONG, Wei ZHAO, Lisha PENG, Jia YU
  • Publication number: 20180275099
    Abstract: A method for reconstructing a defect includes: S1, establishing a database of magnetic flux leakage signals of a unit defect and acquiring a magnetic flux leakage signal of the unit defect; S2, acquiring a target magnetic flux leakage signal; S3, initially setting a scaling factor k; S4, constructing a forward model; S5, inputting the k into the forward model and performing forward prediction according to the k to acquire a predicted magnetic flux leakage signal for the defect to be detected; S6, calculating an error between the target magnetic flux leakage signal and the predicted magnetic flux leakage signal, and determining whether the error is smaller than an error threshold ?, if yes, executing S7; otherwise, executing S5 after the k is corrected; and S7, scaling the unit defect according to the k to acquire a final size of the defect to be detected.
    Type: Application
    Filed: March 2, 2018
    Publication date: September 27, 2018
    Inventors: Songling HUANG, Wei ZHAO, Lisha PENG, Shen WANG, Di CHENG, Jiarui DONG