Patents by Inventor Liyon Chen

Liyon Chen has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Spatial transforms from displayed codes
    Patent number: 7477784
    Abstract: A method and apparatus for performing EIC pattern analysis is described. Pattern feature extraction is performed followed by EIC symbol segmentation. A system may later use the result from the pattern analysis to determine a location of a captured image in relation to a larger array of EIC symbols.
    Type: Grant
    Filed: March 1, 2005
    Date of Patent: January 13, 2009
    Assignee: Microsoft Corporation
    Inventors: Jian Wang, Liyon Chen, Yihua Xu, Yingnong Dang, Zhouchen Lin
  • Spatial transforms from displayed codes
    Publication number: 20060204101
    Abstract: A method and apparatus for performing EIC pattern analysis is described. Pattern feature extraction is performed followed by EIC symbol segmentation. A system may later use the result from the pattern analysis to determine a location of a captured image in relation to a larger array of EIC symbols.
    Type: Application
    Filed: March 1, 2005
    Publication date: September 14, 2006
    Applicant: Microsoft Corporation
    Inventors: Jian Wang, Liyon Chen, Yihua Xu, Yingnong Dang, Zhouchen Lin