Patents by Inventor Lizhen Yu

Lizhen Yu has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20240368301
    Abstract: The present invention relates to the field of biomedicine, specifically to a monoclonal antibody targeting SIRP?, and a preparation method and the use thereof. The SIRP? antibody or the antigen-binding portion thereof prepared by the present invention has a high affinity for SIRP? and a low affinity for SIRP?, which differ by two orders of magnitude. The SIRP? antibody or the antigen-binding portion thereof can efficiently block the binding of CD47 to SIRP?-V1, SIRP?-V2 and SIRP?-V8, thereby promoting the activation of macrophages, particularly enhancing the regulatory antibody-dependent cellular phagocytosis (ADCP) of a target tumor cell, bridging about innate and adaptive immune responses, and promoting the synergistic anti-cancer effect of the SIRP? antibody or the antigen-binding portion thereof with a checkpoint inhibitor PD-(L)1 monoclonal antibody. The antibody can be used for treating various cancers and microbial infectious diseases.
    Type: Application
    Filed: August 16, 2022
    Publication date: November 7, 2024
    Inventors: Lizhen HE, Pin YU, Feihu XU, Liang ZHOU, Xuancheng GUO, Yongbo PENG, Hong CHEN, Tongying WANG, Handong SUN, Chen LI
  • Publication number: 20240363645
    Abstract: An array substrate and a display device are provided. The array substrate includes: a substrate, sub-pixel units, first signal lines, and second signal lines; multiple first signal lines and multiple second signal lines intersect to define the opening areas of the sub-pixel units; each second signal line includes: multiple first parts extending along the column direction, and multiple second parts; the second part includes a portion extending along the inclination direction, and the second part connects two first parts; the angle between the inclination direction and the column direction or row direction is greater than 0; each first part is adjacent to the opening area of the sub-pixel units in the row direction, and multiple second parts respectively pass through at least of the areas between adjacent two pixel repeating unit rows, with the distance between the two first parts being greater than 0 in the row direction.
    Type: Application
    Filed: July 10, 2024
    Publication date: October 31, 2024
    Applicant: BEIJING SHIYAN TECHNOLOGY CO., LTD.
    Inventors: Jiankang SUN, Fuqiang LI, Minglei CHU, Tieshi WANG, Zhongyuan WU, Wei SUN, Kuanjun PENG, Rui LIU, Xue DONG, Dini XIE, Jiushi WANG, Libo WANG, Shunyu YAO, Jing YU, Hongrun WANG, Lizhen ZHANG, Changfeng LI
  • Patent number: 12107542
    Abstract: A method for installing a maximum power point tracking (MPPT) controller is provided. The method includes acquiring an occlusion area proportion of a photovoltaic string in a photovoltaic system, optimizing the occlusion area proportion to generate a target occlusion area proportion, determining a target position from the photovoltaic string according to the target occlusion area proportion, and installing the MPPT controller at the target position.
    Type: Grant
    Filed: June 23, 2022
    Date of Patent: October 1, 2024
    Assignees: HUANENG CLEAN ENERGY RESEARCH INSTITUTE, HUANENG GROUP R&DCENTER CO., LTD
    Inventors: Lizhen Luo, Wenbo Peng, Ping Xiao, Dongming Zhao, Xiaolei Li, Xiangrui Yu, Wenzhe Zhu, Hu Gao
  • Patent number: 8091002
    Abstract: A method for providing ordered capture clocks to detect or locate faults within N clock domains and faults crossing any two clock domains in an integrated circuit or circuit assembly in scan-test or self-test mode, where N>1, each clock domain having one capture clock and a plurality of scan cells, each capture clock comprising a plurality of capture clock pulses; said method comprising: (a) generating and shifting-in N test stimuli to all said scan cells within said N clock domains in said integrated circuit or circuit assembly during a shift-in operation; (b) applying an ordered sequence of capture clocks to all said scan cells within said N clock domains, the ordered sequence of capture clocks comprising at least a plurality of capture clock pulses from two or more selected capture clocks placed in a sequential order such that all clock domains are never triggered simultaneously during a capture operation; and (c) analyzing output responses of all said scan cells to locate any faults therein.
    Type: Grant
    Filed: June 9, 2010
    Date of Patent: January 3, 2012
    Assignee: Syntest Technologies, Inc.
    Inventors: Laung-Terng Wang, Shianling Wu, Zhigang Jiang, Jinsong Liu, Hao-Jan Chao, Lizhen Yu, Feifei Zhao, Fangfang Li, Jianping Yan
  • Publication number: 20100287430
    Abstract: A method for providing ordered capture clocks to detect or locate faults within N clock domains and faults crossing any two clock domains in an integrated circuit or circuit assembly in scan-test or self-test mode, where N>1, each clock domain having one capture clock and a plurality of scan cells, each capture clock comprising a plurality of capture clock pulses; said method comprising: (a) generating and shifting-in N test stimuli to all said scan cells within said N clock domains in said integrated circuit or circuit assembly during a shift-in operation; (b) applying an ordered sequence of capture clocks to all said scan cells within said N clock domains, the ordered sequence of capture clocks comprising at least a plurality of capture clock pulses from two or more selected capture clocks placed in a sequential order such that all clock domains are never triggered simultaneously during a capture operation; and (c) analyzing output responses of all said scan cells to locate any faults therein.
    Type: Application
    Filed: June 9, 2010
    Publication date: November 11, 2010
    Applicant: Syntest Technologies, Inc.
    Inventors: Laung-Terng WANG, Shianling Wu, Zhigang Jiang, Jinsong Liu, Hao-Jan Chao, Lizhen Yu, Feifei Zhao, Fangfang Li, Jianping Yan
  • Patent number: 7783940
    Abstract: A memory redundancy reconfiguration for N base blocks associated with k redundant blocks. The data will be written into both base blocks and defect-free redundant blocks if the base blocks are defective; k multiplexers MUXRi each having N input signals (d0 to dN?1) capable of being connected to k input signals of the redundant blocks; N multiplexers MUXi each having k+1 input signals from k redundant blocks (R0 to Rk?1) and one base block (Ni), capable of being connected to N output signals (qi); and logic means associated with each multiplexer, to convert the input signals of the multiplexer to its output signal.
    Type: Grant
    Filed: June 6, 2008
    Date of Patent: August 24, 2010
    Assignee: Syntest Technologies, Inc.
    Inventors: Lizhen Yu, Shianling Wu, Zhigang Jiang, Laung-Terng Wang
  • Publication number: 20090303815
    Abstract: A memory redundancy reconfiguration for N base blocks associated with k redundant blocks. The data will be written into both base blocks and defect-free redundant blocks if the base blocks are defective; k multiplexers MUXRi each having N input signals (d0 to dN?1) capable of being connected to k input signals of the redundant blocks; N multiplexers MUXi each having k+1 input signals from k redundant blocks (R0 to Rk?1) and one base block (Ni), capable of being connected to N output signals (qi); and logic means associated with each multiplexer, to convert the input signals of the multiplexer to its output signal.
    Type: Application
    Filed: June 6, 2008
    Publication date: December 10, 2009
    Inventors: Lizhen Yu, Shianling Wu, Zhigang Jiang, Laung-Terng Wang