Patents by Inventor Lloyd Bumm

Lloyd Bumm has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • System and method for detecting local mechanical stress in integreated devices
    Patent number: 7944550
    Abstract: A method of detecting local mechanical stress in integrated devices is provided, the method comprising: enabling the detection of a photovoltage difference between a scan probe device and a surface portion of an integrated device, the scan probe device being configured to deflect in response to the photovoltage difference; measuring the deflection of the scan probe device in response to the photovoltage difference between the scan probe device and the surface portion of the integrated device; and calculating a local stress level within the integrated device by determining a local work function of the surface portion of the integrated device based upon the deflection of the scan probe device.
    Type: Grant
    Filed: February 29, 2008
    Date of Patent: May 17, 2011
    Assignee: International Business Machines Corporation
    Inventors: Lloyd Bumm, Daminda Dahayanaka, Philip V. Kaszuba, Leon Moszkowicz, James A. Slinkman
  • SYSTEM AND METHOD FOR DETECTING LOCAL MECHANICAL STRESS IN INTEGREATED DEVICES
    Publication number: 20090219508
    Abstract: A method of detecting local mechanical stress in integrated devices is provided, the method comprising: enabling the detection of a photovoltage difference between a scan probe device and a surface portion of an integrated device, the scan probe device being configured to deflect in response to the photovoltage difference; measuring the deflection of the scan probe device in response to the photovoltage difference between the scan probe device and the surface portion of the integrated device; and calculating a local stress level within the integrated device by determining a local work function of the surface portion of the integrated device based upon the deflection of the scan probe device.
    Type: Application
    Filed: February 29, 2008
    Publication date: September 3, 2009
    Inventors: Lloyd Bumm, Daminda Dahayanaka, Philip V. Kaszuba, Leon Moszkowicz, James A. Slinkman