Patents by Inventor Lluis Yedra Cardona

Lluis Yedra Cardona has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method and system for improving characteristic peak signals in analytical electron microscopy
    Patent number: 9406496
    Abstract: A method and system are disclosed for improving characteristic peak signals in electron energy loss spectroscopy (EELS) and energy dispersive x-ray spectroscopy (EDS) measurements of crystalline materials. A beam scanning protocol is applied which varies the inclination, azimuthal angle, or a combination thereof of the incident beam while spectroscopic data is acquired. The method and system may be applied to compositional mapping.
    Type: Grant
    Filed: November 19, 2012
    Date of Patent: August 2, 2016
    Assignees: UNIVERSITAT DE BARCELONA, NANOMEGAS SPRL, APPFIVE LLC
    Inventors: Sonia Estrade Albiol, Joaquin Portillo Serra, Francisca Peiró Martinez, José Manuel Rebled Corsellas, Lluís Yedra Cardona, Stavros Nicolopoulos, Steven Kim, Jon Karl Weiss
  • METHOD AND SYSTEM FOR IMPROVING CHARACTERISTIC PEAK SIGNALS IN ANALYTICAL ELECTRON MICROSCOPY
    Publication number: 20130240728
    Abstract: A method and system are disclosed for improving characteristic peak signals in electron energy loss spectroscopy (EELS) and energy dispersive x-ray spectroscopy (EDS) measurements of crystalline materials. A beam scanning protocol is applied which varies the inclination, azimuthal angle, or a combination thereof of the incident beam while spectroscopic data is acquired. The method and system may be applied to compositional mapping.
    Type: Application
    Filed: November 19, 2012
    Publication date: September 19, 2013
    Applicants: Universitat de Barcelona, AppFive LLC, Nanomegas SPRL
    Inventors: Sonia Estrade Albiol, Joaquin Portillo Serra, Francisca Peiro Martinez, José Manuel Rebled Corsellas, Lluis Yedra Cardona, Stavros Nicolopoulos, Steven Kim, Jon Karl Weiss