Patents by Inventor Loïc HENRY

Loïc HENRY has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • ELECTRON MICROSCOPY ANALYSIS METHOD
    Publication number: 20210010956
    Abstract: The present disclosure concerns an electron microscopy method, including the emission of a precessing electron beam and the acquisition, at least partly simultaneous, of an electron diffraction pattern and of intensity values of X rays.
    Type: Application
    Filed: July 6, 2020
    Publication date: January 14, 2021
    Inventors: Nicolas BERNIER, Loïc HENRY