Patents by Inventor Locke Lowman

Locke Lowman has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method and machine for repetitive testing of an electrical component
    Patent number: 7173432
    Abstract: A method automatically tests a parameter of an electronic component to determine whether the component has an acceptable value. The method employs an automatic electronic component testing machine having at least first and second measurement positions where the parameter can be measured. The testing process itself may falsely cause the value to appear to be unacceptable when the value is actually acceptable. The method places the component in a first measurement position and measures the parameter in the first position, thereby generating a first measured parameter value. The method also places the component in a second measurement position and measures the parameter in the second position, thereby generating a second measured parameter value. The method rejects the component only if all measured values are unacceptable, whereby the probability of falsely rejecting the component is less than if only a single measuring step were performed.
    Type: Grant
    Filed: November 21, 2005
    Date of Patent: February 6, 2007
    Assignee: Electro Scientific Industries, Inc.
    Inventors: Douglas John Garcia, Kyung Young Kim, Locke Lowman
  • Method and machine for repetitive testing of an electrical component
    Publication number: 20060232279
    Abstract: A method automatically tests a parameter of an electronic component to determine whether the component has an acceptable value. The method employs an automatic electronic component testing machine having at least first and second measurement positions where the parameter can be measured. The testing process itself may falsely cause the value to appear to be unacceptable when the value is actually acceptable. The method places the component in a first measurement position and measures the parameter in the first position, thereby generating a first measured parameter value. The method also places the component in a second measurement position and measures the parameter in the second position, thereby generating a second measured parameter value. The method rejects the component only if all measured values are unacceptable, whereby the probability of falsely rejecting the component is less than if only a single measuring step were performed.
    Type: Application
    Filed: November 21, 2005
    Publication date: October 19, 2006
    Inventors: Douglas Garcia, Kyung Kim, Locke Lowman