Patents by Inventor Loic A. BABOULAZ

Loic A. BABOULAZ has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method, system and computer program for determining a reflectance distribution function of an object
    Patent number: 10107747
    Abstract: The invention refers to a method for analyzing reflected light of an object. First a light angle distribution for a point of the object is determined. Then a plenoptic projector is controlled to illuminate the point of the object with the determined light angle distribution. Then the reflected light intensity of the point of the object is measured and the measured reflected light is analyzed in dependence of the determined light angle distribution.
    Type: Grant
    Filed: May 31, 2013
    Date of Patent: October 23, 2018
    Assignee: Ecole Polytechnique Federale de Lausanne (EPFL)
    Inventors: Loic A. Baboulaz, Martin Vetterli, Paolo Prandoni
  • METHOD, SYSTEM AND COMPUTER PROGRAM FOR DETERMINING A REFLECTANCE DISTRIBUTION FUNCTION OF AN OBJECT
    Publication number: 20140354801
    Abstract: The invention refers to a method for analysing reflected light of an object. First a light angle distribution for a point of the object is determined. Then a plenoptic projector is controlled to illuminate the point of the object with the determined light angle distribution. Then the reflected light intensity of the point of the object is measured and the measured reflected light is analysed in dependence of the determined light angle distribution.
    Type: Application
    Filed: May 31, 2013
    Publication date: December 4, 2014
    Inventors: Loic A. BABOULAZ, Martin Vetterli, Paolo Prandoni