Patents by Inventor Lokesh Kumar Sambasivan

Lokesh Kumar Sambasivan has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 12314125
    Abstract: Systems and methods of anomaly detection in time-series are disclosed. A time-series dataset is received and a set of segments is iteratively defined from the time-series dataset by identifying a set of changepoints in the time-series dataset based on a changepoint type and a sensitivity parameter, determining whether the set of segments defined by the changepoints satisfy at least one threshold criteria, and modifying the sensitivity parameter when the threshold criteria is not met or outputting the set of segments when the threshold criteria is met. A segment-specific anomaly detection threshold is determined for each segment in the set of segments and a set of anomaly-flagged segments is generated. The set of anomaly flagged segments are generated by an anomaly detection process based on the segment-specific anomaly detection threshold for a corresponding segment. An anomaly-flagged time-series is generated by combining the set of anomaly-flagged segments.
    Type: Grant
    Filed: July 27, 2023
    Date of Patent: May 27, 2025
    Assignee: Walmart Apollo, LLC
    Inventors: Manjunath Channappagoudar, Arvind Shyam Verma, Mohit Choudhary, Jingying Zhang, Juan Gomez, Lokesh Kumar Sambasivan
  • Publication number: 20250103984
    Abstract: Systems and methods for simulation forecasting in target networks including dynamic realignment are disclosed. A set of target nodes including at least one demand node realignment representative of a demand volume shift for at least one corresponding distribution node in a predetermined time period is received. When the demand volume shift is equal to or above a predetermined threshold, an estimated volume feature for the at least one corresponding distribution node is generated. When the demand volume shift is below the predetermined threshold, an actual volume feature for the at least one corresponding distribution node is generated. The generated one of the estimated volume feature or the actual volume feature is provided to a trained forecasting model to generate a demand forecast data structure based on the generated one of the estimated volume feature or the actual volume feature.
    Type: Application
    Filed: September 26, 2023
    Publication date: March 27, 2025
    Inventors: Samrat Chowdhury, Gayathri Sanjeev Somarajan, Anupa Saxena, Ying Cao, Rajat Kumar Gupta, Debdut Hazra Banerjee, Jingying Zhang, Lokesh Kumar Sambasivan
  • Publication number: 20250036508
    Abstract: Systems and methods of anomaly detection in time-series are disclosed. A time-series dataset is received and a set of segments is iteratively defined from the time-series dataset by identifying a set of changepoints in the time-series dataset based on a changepoint type and a sensitivity parameter, determining whether the set of segments defined by the changepoints satisfy at least one threshold criteria, and modifying the sensitivity parameter when the threshold criteria is not met or outputting the set of segments when the threshold criteria is met. A segment-specific anomaly detection threshold is determined for each segment in the set of segments and a set of anomaly-flagged segments is generated. The set of anomaly flagged segments are generated by an anomaly detection process based on the segment-specific anomaly detection threshold for a corresponding segment. An anomaly-flagged time-series is generated by combining the set of anomaly-flagged segments.
    Type: Application
    Filed: July 27, 2023
    Publication date: January 30, 2025
    Inventors: Manjunath Channappagoudar, Arvind Shyam Verma, Mohit Choudhary, Jingying Zhang, Juan Gomez, Lokesh Kumar Sambasivan
  • Patent number: 12175476
    Abstract: Systems and methods for assessing quality of and detecting defects in retail products include a housing having an interior, a product holding surface, an image capture device configured to capture an image of the product, a lighting element configured to provide lighting within the housing, an electronic database configured to store electronic data including reference image data associated with the product and representing the product in various sizes and various quality states, and a processor-based control circuit in communication with the first image capture device and the electronic database. The control circuit is configured to obtain image data representing the image of the product, obtain the reference image data, analyze the image data and the reference image data to identify the product and identify a size of a defect present on the product, and output a notification indicating whether or not the product is of acceptable quality.
    Type: Grant
    Filed: January 31, 2022
    Date of Patent: December 24, 2024
    Assignee: Walmart Apollo, LLC
    Inventors: Lokesh Kumar Sambasivan, Sandeep Jaywant Tendulkar, Shivani S. Naik, Pushkar Pushp, Soumabrata Arup Chakraborty, Abhishek Kushwaha, Maxine Caballero Perales, Chuck E. Tilmon, Geronimo Valenzuela, Ray L Baber, Daniel J. Forsgren, Chuck S. Rorie, Raghuram Sathyamurthy, Nicholas G. Van Voorst
  • Publication number: 20230245133
    Abstract: Systems and methods for assessing quality of and detecting defects in retail products include a housing having an interior, a product holding surface, an image capture device configured to capture an image of the product, a lighting element configured to provide lighting within the housing, an electronic database configured to store electronic data including reference image data associated with the product and representing the product in various sizes and various quality states, and a processor-based control circuit in communication with the first image capture device and the electronic database. The control circuit is configured to obtain image data representing the image of the product, obtain the reference image data, analyze the image data and the reference image data to identify the product and identify a size of a defect present on the product, and output a notification indicating whether or not the product is of acceptable quality.
    Type: Application
    Filed: January 31, 2022
    Publication date: August 3, 2023
    Inventors: Lokesh Kumar Sambasivan, Sandeep Jaywant Tendulkar, Shivani S. Naik, Pushkar Pushp, Soumabrata Arup Chakraborty, Abhishek Kushwaha, Maxine Caballero Perales, Chuck E. Tilmon, Geronimo Valenzuela, Ray L. Baber, Daniel J. Forsgren, Chuck S. Rorie, Raghuram Sathyamurthy, Nicholas G. Van Voorst