Abstract: An electrical mating system can include a first connector having a plurality of first contacts, and a second connector having a plurality of second contacts. Each one of the first contacts can pair with one of the second contacts so that they provide electrical conduction between pairs of contacts when the first connector is properly mated to the second connector. At least one of the first contacts or first connector and/or one of the second contacts and the second connector can be sized and configured such that an open circuit occurs across a specific one of the pairs of contacts when the first connector is improperly mated to the second connector.

Abstract: An electrical mating system can include a first connector having a plurality of first contacts, and a second connector having a plurality of second contacts. Each one of the first contacts can pair with one of the second contacts so that they provide electrical conduction between pairs of contacts when the first connector is properly mated to the second connector. At least one of the first contacts or first connector and/or one of the second contacts and the second connector can be sized and configured such that an open circuit occurs across a specific one of the pairs of contacts when the first connector is improperly mated to the second connector.

Abstract: A generator system can include a first generator, a first controller operatively connected to the first generator to control a first generator voltage output, a second generator, and a second controller operatively connected to the second generator to control a second generator voltage output. The first generator and the second generator can be configured in a parallel generator configuration to share load power. The first controller and the second controller can be configured to provide foldback control. The first controller and the second controller can be configured to calibrate foldback to correct for current sharing imbalance between the first generator and the second generator.

Abstract: A power distribution system and method has a controller and at least one semiconductor switch. The power distribution system additionally has an on status detector which detects the status of the semiconductor switches, and an overcurrent status circuit which checks for overcurrent conditions.

Abstract: A circuit retaining system can include a contact monitoring system configured to determine if a retainer is providing at least a selected force and/or pressure to a circuit board when the retainer is retaining the circuit board. The contact monitoring system can include a force and/or pressure sensor configured to be disposed between the retainer and the circuit board and to output a force and/or pressure sensor signal indicating a contact force and/or pressure.

Abstract: A power supply fault monitoring system can be configured to monitor for repetitive faulting of a power supply and to inhibit the power supply if repetitive faulting or a sufficiently long fault is detected. The system can include an input voltage monitor module configured to monitor input voltage to the power supply and output an input voltage status signal, an output voltage monitor module configured to monitor output voltage from the power supply and configured to output an output voltage status signal, and a fault monitor module operatively connected to the input voltage monitor module and the output voltage monitor module to receive the input voltage status signal and the output voltage status signal.

Abstract: A power distribution system and method has a controller and at least one semiconductor switch. The power distribution system additionally has an on status detector which detects the status of the semiconductor switches, and an overcurrent status circuit which checks for overcurrent conditions.

Abstract: A circuit retaining system can include a contact monitoring system configured to determine if a retainer is providing at least a selected force and/or pressure to a circuit board when the retainer is retaining the circuit board. The contact monitoring system can include a force and/or pressure sensor configured to be disposed between the retainer and the circuit board and to output a force and/or pressure sensor signal indicating a contact force and/or pressure.

Abstract: A power supply fault monitoring system can be configured to monitor for repetitive faulting of a power supply and to inhibit the power supply if repetitive faulting or a sufficiently long fault is detected. The system can include an input voltage monitor module configured to monitor input voltage to the power supply and output an input voltage status signal, an output voltage monitor module configured to monitor output voltage from the power supply and configured to output an output voltage status signal, and a fault monitor module operatively connected to the input voltage monitor module and the output voltage monitor module to receive the input voltage status signal and the output voltage status signal.

Abstract: An electrical mating system can include a first connector having a plurality of first contacts, and a second connector having a plurality of second contacts. Each one of the first contacts can pair with one of the second contacts so that they provide electrical conduction between pairs of contacts when the first connector is properly mated to the second connector. At least one of the first contacts or first connector and/or one of the second contacts and the second connector can be sized and configured such that an open circuit occurs across a specific one of the pairs of contacts when the first connector is improperly mated to the second connector.

Abstract: A fault detection circuit includes a system controller and a fault detection controller. The system controller includes at least one memory device to control at least one electrical system. The fault detection controller communicates with the system controller to detect at least one fault of the system controller and to control operation of the system controller based on comparison between a frequency of detected faults corresponding to the system controller and at least one frequency threshold value.

Abstract: A data bus system includes a processor having a data output and a transceiver connecting the data output to a data bus. The transceiver includes a bus-hold circuit configured to maintain a latest value of the data output. At least one output latch connects the data bus to at least one corresponding controlled system.

Abstract: An example data bus and testing system includes a data bus, first device, and second device. The first device is configured to transmit test data on the data bus, hold the transmitted test data on the data bus using a bus-hold feature, and read back the test data from the data bus during application of the bus-hold feature. The second device is configured to determine whether a fault condition exists on the data bus based on whether the read back test data differs from the transmitted test data. A method of testing a data bus is also disclosed.

Abstract: An input circuit includes an input line for providing input regarding state of a supply at a first node. An impedance is connected to the input line at a second node for connecting the input line to ground. A Zener diode can be connected in the input line in series between the first and second nodes to impede current flowing through the Zener diode below the Zener voltage thereof in a direction from the first node to the second node, and to allow current above the Zener voltage thereof in the direction from the first node to the second node, wherein the input line is free of any node connecting a power voltage source to the input line between the first and second nodes.

Abstract: A controller system includes a microprocessor having a sequencer configured to output at least one spare multiplexor control signal, a memory, and a plurality of sensor inputs. At least one stimulation circuit is connected to a sensor signal line. The at least one stimulation circuit being connected to the at least one spare multiplexor control signal. The stimulation circuit is configured such that a state of the at least one spare multiplexor control signal controls a state of the stimulation circuit.

Abstract: A fault detection circuit includes a system controller and a fault detection controller. The system controller includes at least one memory device to control at least one electrical system. The fault detection controller communicates with the system controller to detect at least one fault of the system controller and to control operation of the system controller based on comparison between a frequency of detected faults corresponding to the system controller and at least one frequency threshold value.

Abstract: An input circuit includes an input line for providing input regarding state of a load. A first impedance is connected to the input line at a first node for connecting a voltage source to the input line. A second impedance is connected to the input line at a second node for connecting the input line to ground. A Zener diode is connected in the input line in series between the first and second nodes to impede current flowing through the Zener diode below the Zener voltage thereof in a direction from the first node to the second node, and to allow current above the Zener voltage thereof in the direction from the first node to the second node.

Abstract: A data bus system includes a processor having a data output and a transceiver connecting the data output to a data bus. The transceiver includes a bus-hold circuit configured to maintain a latest value of the data output. At least one output latch connects the data bus to at least one corresponding controlled system.

Abstract: A controller system includes a microprocessor having a sequencer configured to output at least one spare multiplexor control signal, a memory, and a plurality of sensor inputs. At least one stimulation circuit is connected to a sensor signal line. The at least one stimulation circuit being connected to the at least one spare multiplexor control signal. The stimulation circuit is configured such that a state of the at least one spare multiplexor control signal controls a state of the stimulation circuit.

Abstract: An example data bus and testing system includes a data bus, first device, and second device. The first device is configured to transmit test data on the data bus, hold the transmitted test data on the data bus using a bus-hold feature, and read back the test data from the data bus during application of the bus-hold feature. The second device is configured to determine whether a fault condition exists on the data bus based on whether the read back test data differs from the transmitted test data. A method of testing a data bus is also disclosed.