Patents by Inventor Long Chieu

Long Chieu has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • System and method for adaptive testing of semiconductor product
    Patent number: 10393802
    Abstract: A method for testing a plurality of electronic devices includes performing tests of up to m devices at a time to measure device parameters on a device tester configured to test up to m devices at a time, where m is an integer. After each test, the method includes performing statistical analysis of the measured device parameters for all tested devices to determine statistical data, including updated mean and standard deviation for each parameter, and storing only the statistical data, and not the measured device parameters. The method further includes determining new pass/fail limits for each device parameter based on the updated mean and standard deviation, and determining pass or fail of each device based on the new pass/fail limits for each device parameter.
    Type: Grant
    Filed: June 14, 2017
    Date of Patent: August 27, 2019
    Assignee: NUVOTON TECHNOLOGY CORPORATION
    Inventor: Long Chieu
  • SYSTEM AND METHOD FOR ADAPTIVE TESTING OF SEMICONDUCTOR PRODUCT
    Publication number: 20180364302
    Abstract: A method for testing a plurality of electronic devices includes performing tests of up to m devices at a time to measure device parameters on a device tester configured to test up to m devices at a time, where m is an integer. After each test, the method includes performing statistical analysis of the measured device parameters for all tested devices to determine statistical data, including updated mean and standard deviation for each parameter, and storing only the statistical data, and not the measured device parameters. The method further includes determining new pass/fail limits for each device parameter based on the updated mean and standard deviation, and determining pass or fail of each device based on the new pass/fail limits for each device parameter.
    Type: Application
    Filed: June 14, 2017
    Publication date: December 20, 2018
    Inventor: Long Chieu