Abstract: Apparatuses and systems for damping vibration of a vacuum vessel mounted with a pump include a pump body and a damping element coupled to the pump body, wherein the pump body and the damping element form a mass-based damper, and wherein the pump body forms a mass component of the mass-based damper; and the damping element forms a damping component of the mass-based damper. The apparatuses and systems also include a pump body configured to be secured to a column of a charged-particle inspection apparatus, a sensor coupled to the pump body, an actuator coupled to the pump body, and a circuitry communicatively coupled to the sensor and the actuator for receiving motion data indicative of a vibration of the column; determining a damping based on the motion data; and actuate the actuator to react to the vibration of the column in accordance with the damping.

Abstract: Systems and methods for irradiating a sample with a charged-particle beam are disclosed. The charged-particle beam system may comprise a stage configured to hold a sample and is movable in at least one of X-Y-Z axes. The charged-particle beam system may further comprise a position sensing system to determine a lateral and vertical displacement of the stage, and a beam deflection controller configured to apply a first signal to deflect a primary charged-particle beam incident on the sample to at least partly compensate for the lateral displacement, and to apply a second signal to adjust a focus of the deflected charged-particle beam incident on the sample to at least partly compensate for the vertical displacement of the stage. The first and second signals may comprise an electrical signal having a high bandwidth in a range of 10 kHz to 50 kHz, and 50 kHz to 200 kHz, respectively.

Abstract: Systems and methods for irradiating a sample with a charged-particle beam are disclosed. The charged-particle beam system may comprise a stage configured to hold a sample and is movable in at least one of X-Y-Z axes. The charged-particle beam system may further comprise a position sensing system to determine a lateral and vertical displacement of the stage, and a beam deflection controller configured to apply a first signal to deflect a primary charged-particle beam incident on the sample to at least partly compensate for the lateral displacement, and to apply a second signal to adjust a focus of the deflected charged-particle beam incident on the sample to at least partly compensate for the vertical displacement of the stage. The first and second signals may comprise an electrical signal having a high bandwidth in a range of 10 kHz to 50 kHz, and 50 kHz to 200 kHz, respectively.

Abstract: A urine collecting and analyzing apparatus for a toilet, the apparatus including a housing with a seat riser that mounts to the toilet rim and a measurement chamber that extends downwardly into the bowl, a urine collecting basin, a flushing system to clean the apparatus, and a controller for data processing and transmission. The basin has a bowl shape to collect urine for testing and is composed of two side panels or two side panels and a front panel. The panels are moved between a storage position along the housing and a collecting position forming the basin by a motorized mechanism. A transfer tube with a flow rate sensor and pump connects the basin to the measurement chamber. The flushing system feeds water through a flushing tube into the basin through an array of nozzles and cleans the entire surface of the basin.

Abstract: A urine collecting and analyzing apparatus for a toilet. the apparatus including a housing with a seat riser that mounts to the toilet rim and a measurement chamber that extends downwardly into the bowl. a urine collecting basin. a flushing system to clean the apparatus. and a controller for data processing and transmission. The basin has a bowl shape to collect urine for testing and is composed of two side panels or two side panels and a front panel. The panels are moved between a storage position along the housing and a collecting position forming the basin by a motorized mechanism. A transfer tube with a flow rate sensor and pump connects the basin to the measurement chamber. The flushing system feeds water through a flushing tube into the basin through an array of nozzles and cleans the entire surface of the basin.

Abstract: Apparatuses and systems for damping vibration of a vacuum vessel mounted with a pump include a pump body and a damping element coupled to the pump body, wherein the pump body and the damping element form a mass-based damper, and wherein the pump body forms a mass component of the mass-based damper; and the damping element forms a damping component of the mass-based damper. The apparatuses and systems also include a pump body configured to be secured to a column of a charged-particle inspection apparatus, a sensor coupled to the pump body, an actuator coupled to the pump body, and a circuitry communicatively coupled to the sensor and the actuator for receiving motion data indicative of a vibration of the column; determining a damping based on the motion data; and actuate the actuator to react to the vibration of the column in accordance with the damping.

Abstract: Systems and methods for irradiating a sample with a charged-particle beam are disclosed. The charged-particle beam system may comprise a stage configured to hold a sample and is movable in at least one of X-Y-Z axes. The charged-particle beam system may further comprise a position sensing system to determine a lateral and vertical displacement of the stage, and a beam deflection controller configured to apply a first signal to deflect a primary charged-particle beam incident on the sample to at least partly compensate for the lateral displacement, and to apply a second signal to adjust a focus of the deflected charged-particle beam incident on the sample to at least partly compensate for the vertical displacement of the stage. The first and second signals may comprise an electrical signal having a high bandwidth in a range of 10 kHz to 50 kHz, and 50 kHz to 200 kHz, respectively.

Abstract: A urine collecting and analyzing apparatus that mounts on a toilet. The apparatus has a housing that mounts to or is integrated into the rim of the toilet bowl and has an opening for access to the bowl. The housing has a collector compartment and a controller compartment. A collector cup fits under the collector compartment extends over the bowl in a retracted position and in a collecting position. When in the collecting position, the cup captures urine released by a user. The cup is connected to a measurement chamber by a transfer tube. The urine moves through the transfer tube from the cup to the measurement chamber to a predetermined threshold volume and level. A controller in the controller compartment reads sensors and transmits sensor data to a device for storage and display.

Abstract: A urine collecting and analyzing apparatus that mounts on a toilet. The apparatus has a housing that mounts to or is integrated into the rim of the toilet bowl and has an opening for access to the bowl. The housing has a collector compartment and a controller compartment. A collector cup fits under the collector compartment extends over the bowl in a retracted position and in a collecting position. When in the collecting position, the cup captures urine released by a user. The cup is connected to a measurement chamber by a transfer tube. The urine moves through the transfer tube from the cup to the measurement chamber to a predetermined threshold volume and level. A controller in the controller compartment reads sensors and transmits sensor data to a device for storage and display.