Patents by Inventor Long-Yong Liu

Long-Yong Liu has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Testing circuit board
    Patent number: 8305276
    Abstract: An exemplary testing circuit board is used for testing an antenna performance and includes a signal circuit layer, a base layer electrically connected to the signal circuit layer, and a test unit. The signal circuit layer can transmit test signals from the antenna. The base layer is fixed with the signal circuit layer and used as a ground section to shield the test signals. The test unit is electrically connected to the signal circuit layer and the base layer and includes a signal inception port. The signal inception port is positioned on the signal circuit layer and protrudes from the base layer, and the signal inception port is capable of receiving the test signals and transmitting the test signals to the signal circuit layer.
    Type: Grant
    Filed: April 7, 2010
    Date of Patent: November 6, 2012
    Assignees: Shenzhen Futaihong Precision Industry Co., Ltd., FIH (Hong Kong) Limited
    Inventors: Ying Yang, Yan-Feng Yang, Ling-Yu Huang, Long-Yong Liu, Guo-Min Luo
  • TESTING CIRCUIT BOARD
    Publication number: 20110140974
    Abstract: An exemplary testing circuit board is used for testing an antenna performance and includes a signal circuit layer, a base layer electrically connected to the signal circuit layer, and a test unit. The signal circuit layer can transmit test signals from the antenna. The base layer is fixed with the signal circuit layer and used as a ground section to shield the test signals. The test unit is electrically connected to the signal circuit layer and the base layer and includes a signal inception port. The signal inception port is positioned on the signal circuit layer and protrudes from the base layer, and the signal inception port is capable of receiving the test signals and transmitting the test signals to the signal circuit layer.
    Type: Application
    Filed: April 7, 2010
    Publication date: June 16, 2011
    Applicants: SHENZHEN FUTAIHONG PRECISION INDUSTRY CO., LTD., FIH (HONG KONG) LIMITED
    Inventors: YING YANG, YAN-FENG YANG, LING-YU HUANG, LONG-YONG LIU, GUO-MIN LUO