Patents by Inventor Longlong TANG

Longlong TANG has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • HALFWAY CUTTER CHANGING METHOD FOR LARGE-AREA MICROSTRUCTURE CUTTING BASED ON IN-SITUATION FILM THICKNESS MEASUREMENT
    Publication number: 20200023441
    Abstract: The present invention demonstrates a halfway cutter changing method for large-area microstructure cutting based on in-situation film thickness measurement, including the following steps: step 110: preparatory work; step 120: workpiece preliminary machining; step 130: transparent film coating; step 140: film thickness detection; step 150: halfway cutter changing; and step 160: machining completion. The halfway cutter changing method for the large-area microstructure cutting based on the in-situation film thickness measurement provided by the present invention implements machining of a microstructure with large area, high quality and high uniformity.
    Type: Application
    Filed: February 18, 2019
    Publication date: January 23, 2020
    Inventors: Tianfeng ZHOU, Benshuai RUAN, Jia ZHOU, Longlong TANG, Zhiqiang LIANG, Li JIAO, Zhibing LIU, Lijing XIE, Pei YA N, Xibin WANG