Patents by Inventor Lorenzo Bassi

Lorenzo Bassi has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11907793
    Abstract: A computer-implemented system and process of producing a metric quality grade profile for use during inspection of DPM symbol marked on parts may include storing average metrics measured in a controlled environment for a “golden” sample. Measurements of the DPM symbol of the “golden” sample may be performed. Measurements of the metrics of the “golden” sample in an uncontrolled environment may be performed. Average metrics from the uncontrolled environment may be calculated. The averaged metrics from the controlled and uncontrolled environment may be compared. The user may be enabled to set an acceptable grade for the individual metrics. The acceptable grades for the individual metrics as a profile of the DPM symbol in memory.
    Type: Grant
    Filed: December 20, 2018
    Date of Patent: February 20, 2024
    Assignee: Datalogic IP Tech S.R.L.
    Inventors: Rinaldo Zocca, Lorenzo Bassi, Clemente Iannone
  • Patent number: 11679451
    Abstract: A system and method for performing laser marking may include identifying an event performed by a laser marking system. A laser marking unit may be driven to mark the feature on the part. The part may be illuminated with a visible illumination signal to indicate an occurrence of the event in response to identifying the event.
    Type: Grant
    Filed: January 28, 2019
    Date of Patent: June 20, 2023
    Assignee: Datalogic IP Tech S.r.l.
    Inventor: Lorenzo Bassi
  • Publication number: 20210086523
    Abstract: A system and method for performing laser marking may include identifying an event performed by a laser marking system. A laser marking unit may be driven to mark the feature on the part. The part may be illuminated with a visible illumination signal to indicate an occurrence of the event in response to identifying the event.
    Type: Application
    Filed: January 28, 2019
    Publication date: March 25, 2021
    Inventor: Lorenzo BASSI
  • Publication number: 20210065093
    Abstract: A computer-implemented system and process of producing a metric quality grade profile for use during inspection of DPM symbol marked on parts may include storing average metrics measured in a controlled environment for a “golden” sample. Measurements of the DPM symbol of the “golden” sample may be performed. Measurements of the metrics of the “golden” sample in an uncontrolled environment may be performed. Average metrics from the uncontrolled environment may be calculated. The averaged metrics from the controlled and uncontrolled environment may be compared. The user may be enabled to set an acceptable grade for the individual metrics. The acceptable grades for the individual metrics as a profile of the DPM symbol in memory.
    Type: Application
    Filed: December 20, 2018
    Publication date: March 4, 2021
    Inventors: Rinaldo Zocca, Lorenzo Bassi, Clemente Iannone