Abstract: A circuit and method precharge a selected bit-line in a read only memory (ROM) array during a precharge period of a read cycle. At least one bit-line adjacent to the selected bit-line is discharged during the precharge period. After the precharge period, the selected bit-line is read such that parasitic capacitance effects on the selected bit-line are reduced.

Abstract: In an embodiment, a read-only memory array includes a plurality of word lines, a plurality of bit-lines including first and second bit-lines, and a plurality of memory cells configured to represent data values. Each memory cell can include a transistor having a control terminal coupled to one of the plurality of word lines, a drain terminal, and a source terminal. Connections associated with the drain and source terminals of a particular memory cell can determine a data value represented by the memory cell. The memory cells of the plurality of memory cells that are coupled to less than two bit-lines are configured to represent one values.

Abstract: A circuit includes a first negative feed back loop coupled to a virtual Vvdd power rail and a true Vdd power rail. A second negative feed back loop is coupled to the virtual Vvss power rail and a true Vss power rail. The virtual rail to virtual rail voltage difference is regulated at the highest threshold voltage between pull-up and pull-down transistors of a memory cell.

Abstract: A circuit and method precharge a selected bit-line in a read only memory (ROM) array during a precharge period of a read cycle. At least one bit-line adjacent to the selected bit-line is discharged during the precharge period. After the precharge period, the selected bit-line is read such that parasitic capacitance effects on the selected bit-line are reduced.