Patents by Inventor Lothar F. Bieg

Lothar F. Bieg has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 6675671
    Abstract: A multiple degree of freedom platform assembly formed from a plurality of thin films on a substrate can, when activated, move out of the plane of the substrate without additional manufacturing steps. The platform is connected to the substrate by at least three linkages, each linkage being pivotally connected to the platform and the base. At least two of the base connections are to powered traveling devices that are manufactured at one end of a path and which may be moved to locations along the path to cause the platform to move to predetermined positions. The entire assembly, including hinges, is manufactured as planar structures; preferably by a thin film technology such as MEMS.
    Type: Grant
    Filed: May 22, 2002
    Date of Patent: January 13, 2004
    Assignee: Sandia Corporation
    Inventors: Bernhard Jokiel, Jr., Gilbert L. Benavides, Lothar F. Bieg, James J. Allen
  • Patent number: 6668466
    Abstract: Disclosed is a highly accurate articulated coordinate measuring machine, comprising a revolute joint, comprising a circular encoder wheel, having an axis of rotation; a plurality of marks disposed around at least a portion of the circumference of the encoder wheel; bearing means for supporting the encoder wheel, while permitting free rotation of the encoder wheel about the wheel's axis of rotation; and a sensor, rigidly attached to the bearing means, for detecting the motion of at least some of the marks as the encoder wheel rotates; a probe arm, having a proximal end rigidly attached to the encoder wheel, and having a distal end with a probe tip attached thereto; and coordinate processing means, operatively connected to the sensor, for converting the output of the sensor into a set of cylindrical coordinates representing the position of the probe tip relative to a reference cylindrical coordinate system.
    Type: Grant
    Filed: October 19, 2000
    Date of Patent: December 30, 2003
    Assignee: Sandia Corporation
    Inventors: Lothar F. Bieg, Bernhard Jokiel, Jr., Mark T. Ensz, Robert D. Watson
  • Patent number: 6640452
    Abstract: A bi-directional slide mechanism. A pair of master and slave disks engages opposite sides of the platform. Rotational drivers are connected to master disks so the disks rotate eccentrically about their respective axes of rotation. Opposing slave disks are connected to master disks on opposite sides of the platform by a circuitous mechanical linkage, or are electronically synchronized together using stepper motors, to effect coordinated motion. The synchronized eccentric motion of the pairs of master/slave disks compels smooth linear motion of the platform forwards and backwards without backlash. The apparatus can be incorporated in a MEMS device.
    Type: Grant
    Filed: August 20, 2002
    Date of Patent: November 4, 2003
    Assignee: Sandia Corporation
    Inventor: Lothar F. Bieg
  • Patent number: 6519860
    Abstract: Disclosed is a system and method for independently evaluating the spatial positional performance of a machine having a movable member, comprising an articulated coordinate measuring machine comprising: a first revolute joint; a probe arm, having a proximal end rigidly attached to the first joint, and having a distal end with a probe tip attached thereto, wherein the probe tip is pivotally mounted to the movable machine member; a second revolute joint; a first support arm serially connecting the first joint to the second joint; and coordinate processing means, operatively connected to the first and second revolute joints, for calculating the spatial coordinates of the probe tip; means for kinematically constraining the articulated coordinate measuring machine to a working surface; and comparator means, in operative association with the coordinate processing means and with the movable machine, for comparing the true position of the movable machine member, as measured by the true position of the probe tip, with
    Type: Grant
    Filed: October 19, 2000
    Date of Patent: February 18, 2003
    Assignee: Sandia Corporation
    Inventors: Lothar F. Bieg, Bernhard Jokiel, Jr., Mark T. Ensz, Robert D. Watson
  • Patent number: 6463664
    Abstract: An apparatus for positioning an item that provides two-dimensional, independent orthogonal motion of a platform in a X-Y plane. A pair of master and slave disks engages opposite sides of the platform. Rotational drivers are connected to master disks so the disks rotate eccentrically about axes of rotation. Opposing slave disks are connected to master disks on opposite sides of the platform by a timing belt, or are electronically synchronized together using stepper motors, to effect coordinated motion. The coordinated eccentric motion of the pairs of master/slave disks compels smooth linear motion of the platform in the X-Y plane without backlash. The apparatus can be a planar mechanism implemented in a MEMS device.
    Type: Grant
    Filed: October 19, 2000
    Date of Patent: October 15, 2002
    Assignee: Sandia Corporation
    Inventor: Lothar F. Bieg
  • Patent number: 6409413
    Abstract: A new class of spherical joints has a very large accessible full cone angle, a property which is beneficial for a wide range of applications. Despite the large cone angles, these joints move freely without singularities.
    Type: Grant
    Filed: June 18, 1999
    Date of Patent: June 25, 2002
    Assignee: Sandia Corporation
    Inventors: Lothar F. Bieg, Gilbert L. Benavides
  • Patent number: 6234703
    Abstract: A new class of spherical joints is disclosed. These spherical joints are capable of extremely large angular displacements (full cone angles in excess of 270°), while exhibiting no singularities or dead spots in their range of motion. These joints can improve or simplify a wide range of mechanical devices.
    Type: Grant
    Filed: June 18, 1999
    Date of Patent: May 22, 2001
    Assignee: Sandia Corporation
    Inventors: Lothar F. Bieg, Gilbert L. Benavides
  • Patent number: 6028304
    Abstract: A precision displacement reference system is described, which enables real time accountability over the applied displacement feedback system to precision machine tools, positioning mechanisms, motion devices, and related operations. As independent measurements of tool location is taken by a displacement feedback system, a rotating reference disk compares feedback counts with performed motion. These measurements are compared to characterize and analyze real time mechanical and control performance during operation.
    Type: Grant
    Filed: January 21, 1998
    Date of Patent: February 22, 2000
    Assignee: Sandia Corporation
    Inventors: Lothar F. Bieg, Robert R. Dubois, Jerry D. Strother
  • Patent number: 5419222
    Abstract: A method for measuring the contour of a machined part with a contour gage apparatus, having a probe assembly including a probe tip for providing a measure of linear displacement of the tip on the surface of the part. The contour gage apparatus may be moved into and out of position for measuring the part while the part is still carried on the machining apparatus. Relative positions between the part and the probe tip may be changed, and a scanning operation is performed on the machined part by sweeping the part with the probe tip, whereby data points representing linear positions of the probe tip at prescribed rotation intervals in the position changes between the part and the probe tip are recorded. The method further allows real-time adjustment of the apparatus machining the part, including real-time adjustment of the machining apparatus in response to wear of the tool that occurs during machining.
    Type: Grant
    Filed: November 4, 1993
    Date of Patent: May 30, 1995
    Assignee: The United States of America as represented by the United States Department of Energy
    Inventor: Lothar F. Bieg
  • Patent number: 5341574
    Abstract: A coordinate measuring machine test standard apparatus and method which iudes a rotary spindle having an upper phase plate and an axis of rotation, a kinematic ball mount attached to the phase plate concentric with the axis of rotation of the phase plate, a groove mounted at the circumference of the phase plate, and an arm assembly which rests in the groove. The arm assembly has a small sphere at one end and a large sphere at the other end. The small sphere may be a coordinate measuring machine probe tip and may have variable diameters. The large sphere is secured in the kinematic ball mount and the arm is held in the groove. The kinematic ball mount includes at least three mounting spheres and the groove is an angular locating groove including at least two locking spheres. The arm may have a hollow inner core and an outer layer. The rotary spindle may be a ratio reducer.
    Type: Grant
    Filed: June 29, 1993
    Date of Patent: August 30, 1994
    Assignee: The United States of America as represented by the Department of Energy
    Inventor: Lothar F. Bieg
  • Patent number: 5203509
    Abstract: Apparatus for collecting, segmenting and conveying metal chips from machining operations utilizes a compressed gas driven vortex nozzle for receiving the chip and twisting it to cause the chip to segment through the application of torsional forces to the chip. The vortex nozzle is open ended and generally tubular in shape with a converging inlet end, a constant diameter throat section and a diverging exhaust end. Compressed gas is discharged through angled vortex ports in the nozzle throat section to create vortex flow in the nozzle and through an annular inlet at the entrance to the converging inlet end to create suction at the nozzle inlet and cause ambient air to enter the nozzle. The vortex flow in the nozzle causes the metal chip to segment and the segments thus formed to pass out of the discharge end of the nozzle where they are collected, cleaned and compacted as needed.
    Type: Grant
    Filed: April 3, 1992
    Date of Patent: April 20, 1993
    Assignee: The United State of America as represented by the United States Department of Energy
    Inventor: Lothar F. Bieg
  • Patent number: 5178498
    Abstract: A method for machining a workpiece. The method includes the use of a rotary cutting tool mounted on the end of a movable arm. The arm is adapted to move in a plane perpendicular to the axis of rotation of the cutting tool. The cutting tool has cutting teeth to cut chips of material off of the workpiece in a predetermined size and shape to facilitate better removal of the chips from the workpiece. The teeth can be of different type and length to permit the tool to both rough cut and finish cut the workpiece during machining. The total depth of cut is divided by the number of tool teeth, so that the longest tool always performs the finishing cut.
    Type: Grant
    Filed: June 11, 1991
    Date of Patent: January 12, 1993
    Assignee: The United States of America as represented by the United States Department of Energy
    Inventor: Lothar F. Bieg
  • Patent number: 4977777
    Abstract: A fluid probe for measuring the surface contour of a machined part is provided whereby the machined part can remain on the machining apparatus during surface contour measurement. A measuring nozzle in a measuring probe directs a measuring fluid flow onto the surface. The measuring nozzle is on the probe situated midway between two guide nozzles that direct guide fluid flows onto the surface. When the guide fluid flows interact with the surface, they cause the measuring flow and measuring probe to be oriented perpendicular to the surface. The measuring probe includes a pressure chamber whose pressure is monitored. As the measuring fluid flow encounters changes in surface contour, pressure changes occur in the pressure chamber. The surface contour is represented as data corresponding to pressure changes in the pressure chamber as the surface is scanned.
    Type: Grant
    Filed: February 9, 1989
    Date of Patent: December 18, 1990
    Assignee: The United States of America as Represented by the United States Department of Energy
    Inventor: Lothar F. Bieg
  • Patent number: 4976043
    Abstract: An apparatus for gaging the contour of a machined part includes a rotary slide assembly, a kinematic mount to move the apparatus into and out of position for measuring the part while the part is still on the machining apparatus, a linear probe assembly with a suspension arm and a probe assembly including as probe tip for providing a measure of linear displacement of the tip on the surface of the part, a means for changing relative positions between the part and the probe tip, and a means for recording data points representing linear positions of the probe tip at prescribed rotation intervals in the position changes between the part and the probe tip.
    Type: Grant
    Filed: February 9, 1989
    Date of Patent: December 11, 1990
    Assignee: The United States of America as represented by the United States Department of Energy
    Inventor: Lothar F. Bieg