Patents by Inventor Lothar Houben

Lothar Houben has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20260327844
    Abstract: A nanowire having a magnetic property is disclosed. The nanowire comprising: a ternary Zintl phase of a stoichiometric formula of X3Y2Z4, wherein the ternary Zintl phase is in a crystalline state; and wherein: X is selected from Eu, Ca, Sr, and Ba; Y is In or Al; and Zis As or P.
    Type: Application
    Filed: June 13, 2024
    Publication date: October 22, 2026
    Inventors: Haim BEIDENKOPF, Man Suk SONG, Lothar HOUBEN, Hadas SHTRIKMAN
  • Patent number: 12730080
    Abstract: Some embodiments relate to a computer system for determining a structural image of a sample. The computer system is configured to receive and process raw measured data produced by a scanning microscope and being indicative of at least one scan dataset (IM)N acquired in a scan session and corresponding to a sequence of N measurements on a sample located in proximity to a focal plane of the scanning microscope. Each measurement includes data provided by M detection channels associated with M-segment detector (M?3). The computer system includes a data analyzer capable of processing at least one scan dataset to compensate image shifts induced by off-axis detection channels for sample features at defocus plane to thereby obtain data indicative of parallax corrected scan image of the sample which enables separation between phase and depth information and extraction of a depth contrast image of the sample from the single scan dataset.
    Type: Grant
    Filed: February 9, 2022
    Date of Patent: September 8, 2026
    Assignee: YEDA RESEARCH AND DEVELOPMENT CO. LTD.
    Inventors: Michael Elbaum, Shahar Seifer, Lothar Houben
  • Publication number: 20250116617
    Abstract: Some embodiments relate to a computer system for determining a structural image of a sample. The computer system is configured to receive and process raw measured data produced by a scanning microscope and being indicative of at least one scan dataset (IM)N acquired in a scan session and corresponding to a sequence of N measurements on a sample located in proximity to a focal plane of the scanning microscope. Each measurement includes data provided by M detection channels associated with M-segment detector (M?3). The computer system includes a data analyzer capable of processing at least one scan dataset to compensate image shifts induced by off-axis detection channels for sample features at defocus plane to thereby obtain data indicative of parallax corrected scan image of the sample which enables separation between phase and depth information and extraction of a depth contrast image of the sample from the single scan dataset.
    Type: Application
    Filed: February 9, 2022
    Publication date: April 10, 2025
    Inventors: Michael Elbaum, Shahar Seifer, Lothar Houben