Abstract: Systems and methods efficiently bring additional variables into a Pseudo-Random Pattern Generator (“PRPG”) in the early cycles of an automatic test pattern generation (“ATPG”) process without utilizing any additional hardware or control pins. Overscanning (e.g., scanning longer than the length of the longest channel) for some additional cycles brings in enough variables into the PRPG. Data corresponding to earlier cycles of the ATPG process is removed.

Abstract: Systems and methods disclosed herein provide for utilizing extra variables in the decompression equation set of an ATPG process for test patterns requiring an excess number of care bits than can be supported efficiently by the current hardware. An elastic interface is utilized between a tester and a decompressor network (e.g., sequential and combinational decompressors) in order to expand the test pattern length and/or the number of input variables. The systems and methods also provide care bits in early scan cycles of the ATPG process for sequential decompressors starting from a fixed state.

Abstract: Disclosed is an integrated microprocessor chip. The chip includes a digital video decoder Inverse Discrete Cosine Transform element and an on chip Read Only Memory. The on chip Read Only Memory includes (a) a shift register latch for receiving data from off chip pull-up resistors, (b) a register for storing data, (c) a selector and a decoder for selecting memory cells to be read from the register, and (d) a Read Only Memory data output.