Patents by Inventor Louis H. Faure

Louis H. Faure has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 5600883
    Abstract: Testing probes in a testing apparatus are supported in a unitary structure to provide rigidity of the supports for the probes in testing. The spring probes have a contact head at the distal end from the probe tip with a set of antirotation tabs which lock in a cooperating antirotation slot in the probe guide. The contact head has a cone-shaped pilot at its tip which is engaged with a gold-plated contact spring. The inner diameter is integrally in contact with the pilot by mechanical engagement or bonding by soldering or laser welding or the like.
    Type: Grant
    Filed: June 5, 1995
    Date of Patent: February 11, 1997
    Assignee: International Business Machines Corporation
    Inventors: Louis H. Faure, Terence W. Spoor
  • Patent number: 5521519
    Abstract: Testing probes in a testing apparatus are supported in a unitary structure to provide rigidity of the supports for the probes in testing. The spring probes have a contact head at the distal end from the probe tip with a set of antirotation tabs which lock in a cooperating antirotation slot in the probe guide. The contact head has a cone-shaped pilot at its tip which is engaged with a gold-plated contact spring. The inner diameter is integrally in contact with the pilot by mechanical engagement or bonding by soldering or laser welding or the like.
    Type: Grant
    Filed: December 29, 1993
    Date of Patent: May 28, 1996
    Assignee: International Business Machines Corporation
    Inventors: Louis H. Faure, Terence W. Spoor
  • Patent number: 5367254
    Abstract: A test probe assembly is disclosed having bucking beam displacement test probe units which are easily replaceable. Each test probe unit includes a wire and a slotted tube containing the wire,one end of the wire being attached to one end of the tube and the other end of the wire protruding from the other end of the tube. The wire slidably engages an inner diameter of the tube. Each tube is slotted at a plurality of locations along the longitudinal axis thereof to provide spaces for the buckling beam displacement of the respective wire when the protruding end of the wire is brought to bear against a device point to be tested. The slots are staggered so that adjacent ones are disposed radially opposite to each other with some overlap along the longitudinal axis of the tube. The test probe units are inserted in predetermined respective holes of an apertured block of insulating material in accordance with a pattern of device points to be tested.
    Type: Grant
    Filed: February 1, 1993
    Date of Patent: November 22, 1994
    Assignee: International Business Machines Corporation
    Inventors: Louis H. Faure, Terence W. Spoor
  • Patent number: 4554506
    Abstract: A test probe employing a buckling beam array for testing integrated circuits. A pair of identical sets of guides are positioned on either side of a centerpost to align the buckling beams. In one embodiment the holes in one set of guides is offset by a key to induce prebow in the beams. In another embodiment prebow is induced by a floating asymmetric separator positioned on the centerpost between the guide sets. When a force is applied to the probe, the beams deflect in the direction but to different extents so that a uniform force is applied to the surface of the IC irrespective of variations in height.
    Type: Grant
    Filed: December 10, 1984
    Date of Patent: November 19, 1985
    Assignee: International Business Machines Corporation
    Inventors: Louis H. Faure, Dana R. Townsend, Thomas J. Walsh
  • Patent number: 4227149
    Abstract: A sensing apparatus for determining the precise location of a conductive feature on an insulating substrate which has a base, a plurality of flexible flat elongated contact blade elements having end portions for contacting and establishing electrical contact to a conductive surface feature, insulating means between the blade elements, and a base member for supporting the blade elements in a bowed condition with the end portions arranged in a plane parallel to the plane of the top surface of the insulating substrate.
    Type: Grant
    Filed: May 30, 1978
    Date of Patent: October 7, 1980
    Assignee: International Business Machines Corporation
    Inventors: Louis H. Faure, Philo B. Hodge
  • Patent number: 4161817
    Abstract: A method of fabricating a semiconductor device mounting element embodying a wire fan-out wherein the ends of a plurality of insulated wires are supported in a spatial parallel arrangement of columns and rows between two spaced apertured die elements, the spacing of the wires is reduced at a first location between the die elements while maintaining the spatial arrangement of columns and rows, forming an enclosure about the wire portions positioned adjacent one of the die elements and the location where the spacing of the wires is reduced, injecting an organic hardenable resin material into the enclosure thereby encapsulating the wires positioned within, severing the wires, and removing the die.
    Type: Grant
    Filed: March 31, 1978
    Date of Patent: July 24, 1979
    Assignee: International Business Machines Corporation
    Inventors: Edward T. Bernardo, Louis H. Faure, Alfred H. Johnson, Donald G. Pittwood
  • Patent number: 4066312
    Abstract: A connector for forming a plurality of electrical wiring connections having a first mateable coupling member with a flat surface and a plurality of openings arranged in a predetermined configuration, a plurality of headed elements disposed in the openings, a second mateable coupling member provided with a flat surface, a set of elongated axially flexible metal buckling beam elements supported on the mateable coupling member and arranged in a predetermined configuration, corresponding to the headed elements on the first member, a means for supporting the buckling beam elements in a position generally perpendicular to the flat surface on the second member, with the ends of the buckling beam elements protruding slightly beyond the flat surface, a means for aligning the first and second members in mateable relation with the respective flat surfaces in opposed relation, and means for securing and maintaining the first and second members in mateable relation with the ends of the beam elements in a flexed position a
    Type: Grant
    Filed: June 28, 1976
    Date of Patent: January 3, 1978
    Assignee: International Business Machines Corporation
    Inventor: Louis H. Faure