Patents by Inventor Louis J. Gullo

Louis J. Gullo has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20210062764
    Abstract: An effector health monitor system is configured for coupling with an energetic component. The effector health monitor system includes a characteristic sensor suite including at least first and second characteristic sensors. The first characteristic sensor is proximate to the energetic component and configured to measure a failure characteristic of the energetic component. The second characteristic sensor is configured to measure at least one environmental characteristic proximate to the energetic component. A communication hub is coupled with the first and second characteristic sensors, and is configured to communicate the measured failure and environmental characteristics outside of an effector body. A failure identification module compares the measured failure characteristic with a failure threshold and identifies a failure event.
    Type: Application
    Filed: August 20, 2019
    Publication date: March 4, 2021
    Inventors: Louis J. Gullo, Mark T. Langhenry, Thomas R. Berger
  • Publication number: 20190383874
    Abstract: Presented herein are alternatives to design of experiments. A method can include sampling a model that explains a measurement corpus of measurement data to generate a sampled model, identifying an invalid region of the sampled model, determining whether a device will operate within the identified invalid region, if the device will operate within the identified invalid region, causing further measurement data to be captured in the identified invalid region, and generating a new model, based only on the further measurement data, to explain device operation within the identified invalid region that augments the sampled model to explain the device behavior.
    Type: Application
    Filed: August 28, 2019
    Publication date: December 19, 2019
    Inventors: Holger M. Jaenisch, James W. Handley, Louis J. Gullo
  • Patent number: 6684349
    Abstract: A system and method for reliability assessment and prediction of end items is provided herein. A reliability assessment program (RAP) in accordance with the present invention provides a reliability assessment of the new equipment and/or parts designed for in-field use by assessing the similarities and differences between the new equipment and the predecessor equipment. Predecessor end item field failure data is collected and analyzed to compare the degree of similarity between the predecessor fielded end item and the new design. Based on this comparison, an appropriate method of assessment is determined, for example, a similarity analysis process or a failure cause model. Both methods use models for comparison and generate an appropriate report expressing the failure rate prediction of the new design and/or the mean-time-between-failure (MTBF).
    Type: Grant
    Filed: January 18, 2001
    Date of Patent: January 27, 2004
    Assignee: Honeywell International Inc.
    Inventors: Louis J. Gullo, Leon Musil, Bruce G. Johnson
  • Publication number: 20020078403
    Abstract: A system and method for reliability assessment and prediction of end items is provided herein. A reliability assessment program (RAP) in accordance with the present invention provides a reliability assessment of the new equipment and/or parts designed for in-field use by assessing the similarities and differences between the new equipment and the predecessor equipment. Predecessor end item field failure data is collected and analyzed to compare the degree of similarity between the predecessor fielded end item and the new design. Based on this comparison, an appropriate method of assessment is determined, for example, a similarity analysis process or a failure cause model. Both methods use models for comparison and generate an appropriate report expressing the failure rate prediction of the new design and/or the mean-time-between-failure (MTBF).
    Type: Application
    Filed: January 18, 2001
    Publication date: June 20, 2002
    Inventors: Louis J. Gullo, Leon Musil, Bruce G. Johnson