Abstract: A critical parameter/requirements management process model for managing a development program for a product and an associated product structure-driven critical parameter/requirements management tool and environment is provided. In one embodiment, the process includes a product structure classification scheme, a parameter/requirements classification scheme, a parameter/requirements process and maturity model, and in-process and requirements conformance views. In one embodiment, the tool includes a user interface layer, a business layer, a data layer, and a database. The user interface layer may include a product structure feature group, an add/edit/link feature group, a manage maturity feature group, and a manage conformance feature group. The tool may be implemented as a web server accessible to user workstations operating as thin clients.

Abstract: A high voltage measuring circuit for broadband measurement of transient signals occurring in high voltage apparatus. The measuring circuit is housed in a shielded housing having an input sensing circuit for connection to a capacitive grounded tap of the high voltage apparatus. The sensing circuit is connected to an output circuit through an electrical shielded connection. The measuring circuit generates output signals which are replicas of the transient signals appearing on the bushing of the high voltage apparatus. The broadband of the measuring circuit extends over a frequency range of from about 1 Hz to 1 MHz and has a signal level higher than background noise.