Patents by Inventor Louis P. Domingues

Louis P. Domingues has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 4980246
    Abstract: A method of fine-tuning the dielectric constant value of an insulating ceramic alloy, and the resulting alloy, and uses thereof, are disclosed. The alloy has the general formula:Mg.sub.x Al.sub.y Ti.sub.z O.sub.4whereinx+y+z=3x=1-2y=0.1-1.9z=0.1-0.9and is preferably made from 10 to 90 mol percent of magnesium titanate and 90 to 10 mol percent of magnesium aluminate. The mole ratio of the titanate to the aluminate in the alloy is varied in order to vary the value of the dielectric constant of the alloy. The alloy has a density which is at least 98% of the theoretical density of the alloy, and a dielectric constant of 8.5 to 13.8.The alloy can be used in applications wherein dielectric materials have previously been utilized, such as a substrate for an electrical circuit.
    Type: Grant
    Filed: May 10, 1990
    Date of Patent: December 25, 1990
    Assignee: Alpha Industries
    Inventors: Taki Negas, Louis P. Domingues
  • Patent number: 4942146
    Abstract: A method of fine-tuning the dielectric constant value of an insulating ceramic alloy, and the resulting alloy, and uses thereof, are disclosed. The alloy has the general formula:Mg.sub.x Al.sub.y Ti.sub.z O.sub.4whereinx+y+z=3x=1-2y=0.1-1.9z=0.1-0.9and is preferably made from 10 to 90 mol percent of magnesium titanate and 90 to 10 mol percent of magnesium aluminate. The mole ratio of the titanate to the aluminate in the alloy is varied in order to vary the value of the dielectric constant of the alloy. The alloy has a density which is at least 98% of the theoretical density of the alloy, and a dielectric constant of 8.5 to 13.8.The alloy can be used in applications wherein dielectric materials have previously been utilized, such as a substrate for an electrical circuit.
    Type: Grant
    Filed: May 15, 1987
    Date of Patent: July 17, 1990
    Assignee: Alpha Industries
    Inventors: Taki Negas, Louis P. Domingues
  • Patent number: 4264423
    Abstract: A device for measuring the fugacity of a material, without requiring a separate device to measure temperature, is disclosed, wherein the device is a solid electrolyte probe, with the probe having a passageway therein, and metallic conductor leads on the outside of the probe and on the inside of the probe in the passageway. The metallic conductor leads are in contact with an E.M.F. measuring circuit, with the reference fluid being passed through the passageway. The passageway also includes a capillary restriction therein, and measuring devices are provided to measure the pressure drop of the reference fluid when flowing through the capillary, thereby permitting determination of temperature. The temperature determination combined with the E.M.F. measurement permit determination of the fugacity of the material.
    Type: Grant
    Filed: September 17, 1979
    Date of Patent: April 28, 1981
    Assignee: The United States of America as represented by the Secretary of the Army
    Inventors: Taki Negas, Louis P. Domingues, Tadeusz M. Drzewiecki, Richard M. Phillippi