Abstract: A current transformer includes a first housing including a first handle portion and a first distal portion, a second housing including a second handle portion and a second distal portion, a first core mounted in in the first distal portion, a second core mounted in the second distal portion, and a lock attached to the second handle portion at a pivot point, wherein the first housing is rotationally coupled to the second housing about a fulcrum point and the lock is rotatable about the pivot point into a closed position wherein the lock engages the first handle portion and prevents the first handle portion and the second handle portion from rotating towards each other.

Abstract: A current transformer includes a first housing including a first handle portion and a first distal portion, a second housing including a second handle portion and a second distal portion, a first core mounted in the first distal portion, a second core mounted in the second distal portion, and a lock attached to the second handle portion at a pivot point, wherein the first housing is rotationally coupled to the second housing about a fulcrum point and the lock is rotatable about the pivot point into a closed position wherein the lock engages the first handle portion and prevents the first handle portion and the second handle portion from rotating towards each other.

Abstract: According to one embodiment, an apparatus has first and second connectors configured for removably connecting to one another. The first connector circuit has a first differential amplifier, a first differential signal path, a first capacitor section capacitively coupling the first differential amplifier to the first differential signal path, and a first DC biasing circuit for imparting a first DC bias to the first differential signal path opposite the first capacitor section. The second connector circuit has a second differential amplifier, a second differential signal path, a second capacitor section capacitively coupling the second differential amplifier to the second differential signal path, and a second DC biasing circuit for imparting a second DC bias to the second differential signal path opposite the second capacitor section having a different magnitude than the first DC bias when the first and second connector are not connected.

Abstract: A method and system for testing a computer is presented. The temperature of the computer is controlled by one or more on-board fans inside the computer's enclosure. Voltages are controlled at the Voltage Regulator Module (VRM) level. A test program is then run under varying temperature and VRM voltages, and the results of the test program are logged. The present invention can be used either at the manufacturer's location or the customer's site, either under local or remote control.

Abstract: A system and method are used for electronically detecting the accumulation of dust within a computer system using a capacitive dust sensor. The dust detection system may be implemented on a smaller computer, such as an individual PC, or in a more expansive system, such as a rack-based server system (“rack system”) having multiple servers and other hardware devices. In one embodiment, each server in a rack system includes a capacitive sensor responsive to the accumulation of dust. The capacitive sensor may include one or more capacitive plates integral with a heatsink. As dust collects on the capacitive plates, the capacitance increases. When a capacitance setpoint is reached, indicating the dust has reached a critical level, an alert is generated. The alerts may be received by a management console for the attention of a system administrator. Each alert may contain the identity of the server generating the alert, so that the system administrator knows which server(s) are to be removed for cleaning.

Abstract: According to one embodiment, an apparatus has first and second connectors configured for removably connecting to one another. The first connector circuit has a first differential amplifier, a first differential signal path, a first capacitor section capacitively coupling the first differential amplifier to the first differential signal path, and a first DC biasing circuit for imparting a first DC bias to the first differential signal path opposite the first capacitor section. The second connector circuit has a second differential amplifier, a second differential signal path, a second capacitor section capacitively coupling the second differential amplifier to the second differential signal path, and a second DC biasing circuit for imparting a second DC bias to the second differential signal path opposite the second capacitor section having a different magnitude than the first DC bias when the first and second connector are not connected.

Abstract: A system and method are used for electronically detecting the accumulation of dust within a computer system using a capacitive dust sensor. The dust detection system may be implemented on a smaller computer, such as an individual PC, or in a more expansive system, such as a rack-based server system (“rack system”) having multiple servers and other hardware devices. In one embodiment, each server in a rack system includes a capacitive sensor responsive to the accumulation of dust. The capacitive sensor may include one or more capacitive plates integral with a heatsink. As dust collects on the capacitive plates, the capacitance increases. When a capacitance setpoint is reached, indicating the dust has reached a critical level, an alert is generated. The alerts may be received by a management console for the attention of a system administrator. Each alert may contain the identity of the server generating the alert, so that the system administrator knows which server(s) are to be removed for cleaning.

Abstract: A system and method for electronically detecting the accumulation of dust within a computer system using a capacitive dust sensor. The dust detection system may be implemented on a smaller computer, such as an individual PC, or in a more expansive system, such as a rack-based server system (“rack system”) having multiple servers and other hardware devices. In one embodiment, each server in a rack system includes a capacitive sensor responsive to the accumulation of dust. The capacitive sensor may include one or more capacitive plates integral with a heatsink. As dust collects on the capacitive plates, the capacitance increases. When a capacitance setpoint is reached, indicating the dust has reached a critical level, an alert is generated. The alerts may be received by a management console for the attention of a system administrator. Each alert may contain the identity of the server generating the alert, so that the system administrator knows which server(s) are to be removed for cleaning.

Abstract: Airflow control and dust removal systems and methods are disclosed. In one embodiment, a plurality of blade servers is mounted in a chassis. A blower generates airflow through the chassis. Air enters the chassis uniformly across the blade servers and flows in parallel through the servers. An airflow directing mechanism is provided for allowing airflow through a selected one of the blade servers while reducing or closing airflow to the other blade servers, to individually clean and remove dust from the selected blade server. The airflow directing mechanism may include a movable vane actuated by a rotary or linear solenoid to selectively block airflow ports of the servers. The vane may be held in a closed position, assisted by an electromagnet. The airflow directing mechanism may alternatively comprise a rolled shade having a pattern of openings. The position of the rolled shade may be controlled to align openings in the shade with airflow ports in the servers, to control which servers airflow may pass through.

Abstract: Apparatus for use in operating a dental drill is disclosed in which the air, water and light for the hand-held drill member are each delivered from an associated supply source, all of which are adapted to be located at a position remote from the working end of the drill and are coupled to the drill through a conduit cable, and in which control means for the selective energization of the light supply source is located within easy reach of the operator to permit turn-on and/or turn-off of the light supply source through simple fingertip control provided within a remote control unit which is totally electrically isolated from the high voltage present in the light supply source to protect both the operator and the patient from shock or injury. The light supply source may be automatically energized merely by lifting the instrument containing the dental fiber optics.The light unit may be independent of the dental drill to permit a wide variety of uses independently of its use with the dental drill.

Abstract: Method for the quick determination of the susceptibilities of various unidentified bacteria contained in an aqueous physiological fluid sample, particularly urine, to one or more antibiotics. A bacterial adenosine triphosphate (ATP) assay is carried out after the elimination of non-bacterial ATP to determine whether an infection exists. If an infection does exist, a portion of the sample is further processed, including subjecting parts of the portion to one or more antibiotics. Growth of the bacteria in the parts are determined, again by an ATP assay, to determine whether the unidentified bacteria in the sample are susceptible to the antibiotic or antibiotics under test.

Abstract: The susceptibility of bacteria, particularly those derived from body fluids, to antimicrobial agents is determined in terms of an ATP index measured by culturing a bacterium in a growth medium, assaying the amount of ATP in a sample of the cultured bacterium by measuring the amount of luminescent light emitted when the bacterial ATP is reacted with a luciferase-luciferin mixture, subjecting the sample of the cultured bacterium to an antibiotic agent and assaying the amount of bacterial adenosine triphosphate after treatment with the antibiotic by measuring the luminescent light resulting from the reaction, whereby the ATP index is determined from the values obtained from the assay procedures.