Abstract: A method and system of designing an electronic circuit includes dividing a chip area of a design into a plurality of bins, identifying a candidate bin in the plurality of bins, and performing an area reduction on the candidate bin.

Abstract: A method and system of designing an electronic circuit includes dividing a chip area of a design into a plurality of bins, identifying a candidate bin in the plurality of bins, and performing an area reduction on the candidate bin.

Abstract: A method and system of designing an electronic circuit includes dividing a chip area of a design into a plurality of bins, identifying a candidate bin in the plurality of bins, and performing an area reduction on the candidate bin.

Abstract: A solution for managing a circuit design, which enables a cell to be incrementally placed in the circuit design based on a resulting wiring distance is provided. A cell to be placed in the circuit design is obtained along with a corresponding set of nets in the circuit design to which the cell is to be connected. A routing grid, which defines a plurality of tiles in the circuit design for consideration in placing the cell, can be generated based on the set of nets for the cell. A wire distance measure can be calculated for each of the tiles in the routing grid using the set of nets. The wire distance measure is then used to identify a target tile for placing the cell. The target tile can be used to find an exact and/or rough placement for the cell.

Abstract: A method and system of designing an electronic circuit includes dividing a chip area of a design into a plurality of bins, identifying a candidate bin in the plurality of bins, and performing an area reduction on the candidate bin.

Abstract: The present invention provides a method, system and program product for mitigating effects of interconnect variability during a design stage of a chip. Under the technique of the present invention, a global and detailed routing of interconnects of the chip are determined. Thereafter, a dummy fill estimation and a grid based metal density estimation are performed. Then, based on a CMP model, a variable map of metal thicknesses is obtained. Based on the variable map, wiring nets of the chip that are sensitive to metal variability (e.g., that fail to meet timing closure due to metal thickness loss/gain in the CMP process) are identified. These wiring nets are then re-routed for optimization of the chip.

Abstract: A method, system and program product are described for generating a clock distribution network on an integrated circuit by determining an allowable placement region for each of a set of clock tree leaf elements in the integrated circuit. This allowable placement region is generated by determining and intersecting a set of sub-regions under different constraints, each of which identifies an area in which the clock tree leaf element is placed to satisfy the respective constraint. Constraints for which sub-regions are determined include timing constraints in the form of slacks and congestion constraints. After allowable placement regions have been determined, the clock tree leaf elements are clustered, and each clock tree leaf element is placed at a location within its allowable placement region which minimizes some cost function for that clustering.

Abstract: A system and method for correcting wiring congestion in a placed and partially or fully globally-routed VLSI chip design while avoiding adding new timing or electrical violations or other design constraints. Globally-congested areas are identified along with determining terminated and non-terminated wires in the congested areas. The process includes optimizing the identified congestion areas, incrementally rerouting affected nets, testing the resultant design legality and congestion metrics, and committing or reversing the optimizations and reroutings. The optimizations further includes the movement of logic cells and decomposition, recomposition or any other modification of logic cell structures (possibly combined with cell movement) to move terminated wires to less congested grid edges, rearrangement of commutative connections within or between cells, or addition of buffers to cause reroutes of feedthrough wires.