Abstract: Disclosed are curved electrochromic devices comprising an electrochromic apparatus disposed between first and second curved layers of transparent material, and the first and second curved layers have exterior and inner surfaces, wherein the inner surfaces face the electrochromic apparatus. Also disclosed are processes for manufacturing the disclosed bubble visors.

Abstract: Disclosed are curved electrochromic devices comprising an electrochromic apparatus disposed between first and second curved layers of transparent material, and the first and second curved layers have exterior and inner surfaces, wherein the inner surfaces face the electrochromic apparatus. Also disclosed are processes for manufacturing the disclosed bubble visors.

Abstract: A specular variable angle absolute reflectometer includes a light source and a mirror system in a light path of the light source. The mirror system is configured to reflect a light beam from the light source towards a sample that is optically reflective. The device also includes an elliptical roof mirror disposed in the light path after the sample having an ellipsoidal reflector surface configured to reflect the light beam back towards the sample. The device also includes a mechanism connected to the elliptical roof mirror. The mechanism is configured to rotate the elliptical roof mirror about an axis of the sample. The device also includes a detector in the light path after the elliptical roof mirror such that the detector receives light that has been reflected from the elliptical roof mirror, thence back to the sample, thence back to the mirror system, and thence to the detector.

Abstract: Disclosed are curved electrochromic devices comprising an electrochromic apparatus disposed between first and second curved layers of transparent material, and the first and second curved layers have exterior and inner surfaces, wherein the inner surfaces face the electrochromic apparatus. Also disclosed are processes for manufacturing the disclosed bubble visors.

Abstract: A filter comprises a support substrate. A film is disposed on the support substrate, the film comprising a polymer matrix material and a filler. The filler has a particle size distribution configured to filter a desired range of wavelengths of light, the particle size distribution having been achieved by extrusion. An extrudable composition is also disclosed. The extrudable composition comprises a polymer matrix material and a filler. The filler has an average particle size ranging from about 1 nm to about 700 nm and a concentration ranging from 0.001 weight % to 0.3 weight %, relative to the total weight of the extrudable composition.

Abstract: A specular variable angle absolute reflectometer includes a light source and a mirror system in a light path of the light source. The mirror system is configured to reflect a light beam from the light source towards a sample that is optically reflective. The device also includes an elliptical roof mirror disposed in the light path after the sample having an ellipsoidal reflector surface configured to reflect the light beam back towards the sample. The device also includes a mechanism connected to the elliptical roof mirror. The mechanism is configured to rotate the elliptical roof mirror about an axis of the sample. The device also includes a detector in the light path after the elliptical roof mirror such that the detector receives light that has been reflected from the elliptical roof mirror, thence back to the sample, thence back to the mirror system, and thence to the detector.

Abstract: A method of controlling a particle size distribution of a filler in an extrudable composition comprises introducing an extrudable composition comprising a polymer matrix material and a filler into an extruder, the filler having a first average particle size that is larger than a target average particle size. The extrudable composition is extruded one or more times using the extruder to reduce the size of the filler from the first average particle size to a reduced average particle size, the reduced average particle size being within 10% of the target average particle size.

Abstract: A method of controlling a particle size distribution of a filler in an extrudable composition comprises introducing an extrudable composition comprising a polymer matrix material and a filler into an extruder, the filler having a first average particle size that is larger than a target average particle size. The extrudable composition is extruded one or more times using the extruder to reduce the size of the filler from the first average particle size to a reduced average particle size, the reduced average particle size being within 10% of the target average particle size.

Abstract: A specular variable angle absolute reflectometer. The device includes a light source and a mirror system in a light path of the light source. The mirror system is configured to reflect a light beam from the light source towards a sample that is optically reflective. The device also includes a roof mirror disposed in the light path after the sample. The roof mirror is configured to reflect the light beam back towards the sample. The device also includes a mechanism connected to the roof mirror. The mechanism is configured to rotate the roof mirror about an axis of the sample. The device also includes a detector in the light path after the roof mirror such that the detector receives light that has been reflected from the roof mirror, thence back to the sample, thence back to the mirror system, and thence to the detector.

Abstract: A specular variable angle absolute reflectometer. The device includes a light source and a mirror system in a light path of the light source. The mirror system is configured to reflect a light beam from the light source towards a sample that is optically reflective. The device also includes a roof mirror disposed in the light path after the sample. The roof mirror is configured to reflect the light beam back towards the sample. The device also includes a mechanism connected to the roof mirror. The mechanism is configured to rotate the roof mirror about an axis of the sample. The device also includes a detector in the light path after the roof mirror such that the detector receives light that has been reflected from the roof mirror, thence back to the sample, thence back to the mirror system, and thence to the detector.

Abstract: A method involves determining multiple temperatures of an object from spectral data collected from the object. The spectral data covers a plurality of wavelengths. The method comprises using a computer to (a) assign an initial value for residual radiation; (b) identify a black body profile that best fits the spectral data over the plurality of wavelengths; (c) remove radiation corresponding to the identified profile from the residual radiation; and (d) return to (b) until the residual radiation reaches a termination criterion.

Abstract: Systems and methods are provided for measuring spectral hemispherical reflectance. One embodiment is a system that includes a laser that emits a beam of light, and an optical chopper disposed between the laser and a sample. The chopper blocks the beam while the chopper is at a first angle of rotation, redirects the beam along a reference path while the chopper is at a second angle of rotation, and permits the beam to follow a sample path through the chopper and strike the sample while the chopper is at a third angle of rotation. The system also includes a hollow sphere that defines a slot through which the sample path and reference path enter the sphere. The hollow sphere includes a spectral hemispherical reflectance detector, a mount that receives the sample at the sphere, and an actuator that rotates the sphere about an axis that intersects the sample.

Abstract: Disclosed are curved electrochromic devices comprising an electrochromic apparatus disposed between first and second curved layers of transparent material, and the first and second curved layers have exterior and inner surfaces, wherein the inner surfaces face the electrochromic apparatus. Also disclosed are processes for manufacturing the disclosed bubble visors.

Abstract: Systems and methods are provided for measuring spectral hemispherical reflectance. One embodiment is a system that includes a laser that emits a beam of light, and an optical chopper disposed between the laser and a sample. The chopper blocks the beam while the chopper is at a first angle of rotation, redirects the beam along a reference path while the chopper is at a second angle of rotation, and permits the beam to follow a sample path through the chopper and strike the sample while the chopper is at a third angle of rotation. The system also includes a hollow sphere that defines a slot through which the sample path and reference path enter the sphere. The hollow sphere includes a spectral hemispherical reflectance detector, a mount that receives the sample at the sphere, and an actuator that rotates the sphere about an axis that intersects the sample.

Abstract: Methods and apparatus to thermally manage heat sources using eutectic thermal control are disclosed. A disclosed example apparatus includes a cooling block to be thermally coupled to a heat generation source of an aircraft, and eutectic metal alloy disposed within cavities of the cooling block.

Abstract: A method involves determining multiple temperatures of an object from spectral data collected from the object. The spectral data covers a plurality of wavelengths. The method comprises using a computer to (a) assign an initial value for residual radiation; (b) identify a black body profile that best fits the spectral data over the plurality of wavelengths; (c) remove radiation corresponding to the identified profile from the residual radiation; and (d) return to (b) until the residual radiation reaches a termination criterion.