Abstract: Provided is a driving method of a display panel, which relates to a field of a display technology. The display panel includes a pixel array, the pixel array comprises a plurality of rows of sub-pixels, and the driving method includes: driving, in a same display frame, different sub-pixels in a row of the sub-pixels respectively by a forward driving signal and a negative driving signal, wherein a voltage conversion rate of the forward driving signal is greater than a voltage conversion rate of the negative driving signal under a same display gray scale. A driving circuit, a driving chip and a display device are further provided.

Abstract: Provided is a driving method of a display panel, which relates to a field of a display technology. The display panel includes a pixel array, the pixel array comprises a plurality of rows of sub-pixels, and the driving method includes: driving, in a same display frame, different sub-pixels in a row of the sub-pixels respectively by a forward driving signal and a negative driving signal, wherein a voltage conversion rate of the forward driving signal is greater than a voltage conversion rate of the negative driving signal under a same display gray scale. A driving circuit, a driving chip and a display device are further provided.

Abstract: Systems and methods for laser stimulated lock-in thermography (LLT) crack detection are provided. The system includes a spatial light modulator and a controller. The spatial light modulator reflects a laser beam to focus the laser beam onto a sample for detection of a crack, hole or scratch. The controller is coupled to the spatial light modulator and controls operation of the spatial light modulator to switch focus of the laser beam onto the sample between a plurality of LLT focus configurations for detection of the crack, hole or scratch on the sample. The method includes using a first one of the plurality of LLT configurations for coarse scanning of the sample to detect a crack, hole or scratch on the sample and, when a crack, hole or scratch is detected on the sample, switching to a second one of the plurality of LLT configurations for fine scanning of the crack, hole or scratch on the sample to determine one or more parameters of the crack, hole or scratch on the sample.

Abstract: Systems and methods for laser stimulated lock-in thermography (LLT) crack detection are provided. The system includes a spatial light modulator and a controller. The spatial light modulator reflects a laser beam to focus the laser beam onto a sample for detection of a crack, hole or scratch. The controller is coupled to the spatial light modulator and controls operation of the spatial light modulator to switch focus of the laser beam onto the sample between a plurality of LLT focus configurations for detection of the crack, hole or scratch on the sample. The method includes using a first one of the plurality of LLT configurations for coarse scanning of the sample to detect a crack, hole or scratch on the sample and, when a crack, hole or scratch is detected on the sample, switching to a second one of the plurality of LLT configurations for fine scanning of the crack, hole or scratch on the sample to determine one or more parameters of the crack, hole or scratch on the sample.

Abstract: Systems and methods for laser stimulated lock-in thermography (LLT) crack detection are provided. The system includes a spatial light modulator and a controller. The spatial light modulator reflects a laser beam to focus the laser beam onto a sample for detection of a crack, hole or scratch. The controller is coupled to the spatial light modulator and controls operation of the spatial light modulator to switch focus of the laser beam onto the sample between a plurality of LLT focus configurations for detection of the crack, hole or scratch on the sample. The method includes using a first one of the plurality of LLT configurations for coarse scanning of the sample to detect a crack, hole or scratch on the sample and, when a crack, hole or scratch is detected on the sample, switching to a second one of the plurality of LLT configurations for fine scanning of the crack, hole or scratch on the sample to determine one or more parameters of the crack, hole or scratch on the sample.

Abstract: A device which detects and/or emits infrared radiation in the mid-infrared to far- infrared region is disclosed herein. The device comprises a first layer comprising a first transition metal dichalcogenide, and a second layer comprising a second transition metal dichalcogenide, wherein the second layer is deposited adjacent to the first layer to form a first interface which interlayer excitons are producible from for rendering the device operable to detect and/or emit infrared radiation in the mid-infrared to far-infrared region.

Abstract: An annotation system for a neural network and a method thereof are disclosed in the present application. The annotation system comprises a memory and a processor operatively coupled to the memory. The memory is configured for storing instructions to cause the process to receive information comprising a first set of unlabeled instances from at least one source; set a learning target of the information; select a second set of unlabeled instances from the first set of unlabeled instances by executing a software algorithm; and annotate the second set of unlabeled instances for generating labeled data. The software algorithm increases an efficiency of annotation in training neural networks for deep-learning-based video analysis by combining semi-supervised learning and transfer learning via a data augmentation method. The software algorithm can increase the efficiency of annotation by reducing an amount of annotation by an order of one magnitude.

Abstract: A semiconductor device includes a semiconductor substrate having a metasurface layer configured with multiple pairs of finger portions in a repeating arrangement. The multiple pairs of finger portions are electrically configurable to modulate a radiation signal received by the semiconductor device. Each pair of finger portions includes first and second members where the first member is doped with a first dopant and the second member is doped with a second dopant being different to the first dopant. Any two adjacent first or second members are configured to be separated by at least deep subwavelength to enable the repeating arrangement.

Abstract: A system, method and architecture of using context in determining a response to user interaction with a device, such context may be context of content being output by the device, the device's context, the user's content, or some combination of contexts. In accordance with one or more embodiments, a response may comprise a menu the content of which, e.g., one or more user-selectable actions or options, can be determined based on a determined context, or contexts, or a determination may be made to provide a response other than an option menu, which determination may be made based on a determined context or combination of contexts. As yet another alternative, a determination may be made to provide a response that includes a menu, the content of which is determined based on one or more determined contexts, and another response, such as an answer identified based on one or more determined contexts.

Abstract: Systems and methods for laser stimulated lock-in thermography (LLT) crack detection are provided. The system includes a spatial light modulator and a controller. The spatial light modulator reflects a laser beam to focus the laser beam onto a sample for detection of a crack, hole or scratch. The controller is coupled to the spatial light modulator and controls operation of the spatial light modulator to switch focus of the laser beam onto the sample between a plurality of LLT focus configurations for detection of the crack, hole or scratch on the sample. The method includes using a first one of the plurality of LLT configurations for coarse scanning of the sample to detect a crack, hole or scratch on the sample and, when a crack, hole or scratch is detected on the sample, switching to a second one of the plurality of LLT configurations for fine scanning of the crack, hole or scratch on the sample to determine one or more parameters of the crack, hole or scratch on the sample.

Abstract: A semiconductor device includes a semiconductor substrate having a metasurface layer configured with multiple pairs of finger portions in a repeating arrangement. The multiple pairs of finger portions are electrically configurable to modulate a radiation signal received by the semiconductor device. Each pair of finger portions includes first and second members where the first member is doped with a first dopant and the second member is doped with a second dopant being different to the first dopant. Any two adjacent first or second members are configured to be separated by at least deep subwavelength to enable the repeating arrangement.

Abstract: A read command is received from a host requesting data from a portion of a first memory of a data storage system and it is determined whether one or more sections of the first memory including the portion have previously been written to by the host. If it is determined that the one or more sections have not previously been written to by the host, predetermined data is sent to the host in response to the read command without reading the portion of the first memory. According to another aspect, the requested data from the read command is cached in a second memory of the data storage system based on whether the one or more sections of the first memory have previously been written to by the host.

Abstract: Lifetime extension of a non-volatile semiconductor memory (NVSM) for a data storage device (DSD) includes determining a write amplification factor based on an amount of data previously written to the NVSM and at least one of an amount of data previously requested to be written to the DSD, and an amount of data previously requested to be written to the NVSM. At least a portion of the amount of data to be written to the NVSM is directed or redirected to the disk based on the determined write amplification factor.

Abstract: Lifetime extension of a non-volatile semiconductor memory (NVSM) for a data storage device (DSD) includes determining a write amplification factor based on an amount of data previously written to the NVSM and at least one of an amount of data previously requested to be written to the DSD, and an amount of data previously requested to be written to the NVSM. At least a portion of the amount of data to be written to the NVSM is directed or redirected to the disk based on the determined write amplification factor.

Abstract: A system, method and architecture of using context in determining a response to user interaction with a device, such context may be context of content being output by the device, the device's context, the user's content, or some combination of contexts. In accordance with one or more embodiments, a response may comprise a menu the content of which, e.g., one or more user-selectable actions or options, can be determined based on a determined context, or contexts, or a determination may be made to provide a response other than an option menu, which determination may be made based on a determined context or combination of contexts. As yet another alternative, a determination may be made to provide a response that includes a menu, the content of which is determined based on one or more determined contexts, and another response, such as an answer identified based on one or more determined contexts.

Abstract: System and method for identification of foreign object debris, FOD, in a sample, based on comparison of edge features identified in images of the sample takes at a reference point in time and at a later time (when FOD may be already present). The rate of success of identification of the FOD is increased by compensation for relative movement between the imaging camera and the sample, which may include not only processing the sample's image by eroding of imaging data but also preceding spatial widening of edge features that may be indicative of FOD.

Abstract: A current resonance DC-DC converter has a ZCS resonance switch circuit which comprises a semiconductor switch device 7 and a diode 8 connected together into a parallel circuit, the diode 8 being connected at its cathode to one end of a DC power supply 1, a center-tapped resonance inductance 13 adapted to produce voltages of the same polarity across the center tap and its respective opposite ends and connected at its resonance side to the anode of the diode 8, and a resonance capacitor 6 connected to the center tap of the resonance inductance 13 and to the above-mentioned one end of the power supply 1, the resonance inductance 13 being connected at a transformerside terminal thereof to one end of the primary inductance 4 of a high-frequency transformer HT, the other end of the primary inductance 4 being connected to the other end of the power supply 1.