Patents by Inventor Lu Velicky
Lu Velicky has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 8669179Abstract: A through-wafer interconnect for imager, memory and other integrated circuit applications is disclosed, thereby eliminating the need for wire bonding, making devices incorporating such interconnects stackable and enabling wafer level packaging for imager devices. Further, a smaller and more reliable die package is achieved and circuit parasitics (e.g., L and R) are reduced due to the reduced signal path lengths.Type: GrantFiled: July 11, 2013Date of Patent: March 11, 2014Assignee: Micron Technology, Inc.Inventors: Salman Akram, Charles M. Watkins, William M. Hiatt, David R. Hembree, James M. Wark, Warren M. Farnworth, Mark E. Tuttle, Sidney B. Rigg, Steven D. Oliver, Kyle K. Kirby, Alan G. Wood, Lu Velicky
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Publication number: 20130295766Abstract: A through-wafer interconnect for imager, memory and other integrated circuit applications is disclosed, thereby eliminating the need for wire bonding, making devices incorporating such interconnects stackable and enabling wafer level packaging for imager devices. Further, a smaller and more reliable die package is achieved and circuit parasitics (e.g., L and R) are reduced due to the reduced signal path lengths.Type: ApplicationFiled: July 11, 2013Publication date: November 7, 2013Inventors: Salman Akram, Charles M. Watkins, William M. Hiatt, David R. Hembree, James M. Wark, Warren M. Farnworth, Mark E. Tuttle, Sidney B. Rigg, Steven D. Oliver, Kyle K. Kirby, Alan G. Wood, Lu Velicky
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Patent number: 8502353Abstract: A through-wafer interconnect for imager, memory and other integrated circuit applications is disclosed, thereby eliminating the need for wire bonding, making devices incorporating such interconnects stackable and enabling wafer level packaging for imager devices. Further, a smaller and more reliable die package is achieved and circuit parasitics (e.g., L and R) are reduced due to the reduced signal path lengths.Type: GrantFiled: June 7, 2011Date of Patent: August 6, 2013Assignee: Micron Technology, Inc.Inventors: Salman Akram, Charles M. Watkins, William M. Hiatt, David R. Hembree, James M. Wark, Warren M. Farnworth, Mark E. Tuttle, Sidney B. Rigg, Steven D. Oliver, Kyle K. Kirby, Alan G. Wood, Lu Velicky
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Publication number: 20110233777Abstract: A through-wafer interconnect for imager, memory and other integrated circuit applications is disclosed, thereby eliminating the need for wire bonding, making devices incorporating such interconnects stackable and enabling wafer level packaging for imager devices. Further, a smaller and more reliable die package is achieved and circuit parasitics (e.g., L and R) are reduced due to the reduced signal path lengths.Type: ApplicationFiled: June 7, 2011Publication date: September 29, 2011Applicant: MICRON TECHNOLOGY, INC.Inventors: Salman Akram, Charles Watkins, Mark Hiatt, David Hembree, James Wark, Warren Farnworth, Mark Tuttle, Sidney Rigg, Steven Oliver, Kyle Kirby, Alan Wood, Lu Velicky
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Patent number: 7956443Abstract: A through-wafer interconnect for imager, memory and other integrated circuit applications is disclosed, thereby eliminating the need for wire bonding, making devices incorporating such interconnects stackable and enabling wafer level packaging for imager devices. Further, a smaller and more reliable die package is achieved and circuit parasitics (e.g., L and R) are reduced due to the reduced signal path lengths.Type: GrantFiled: March 17, 2010Date of Patent: June 7, 2011Assignee: Micron Technology, Inc.Inventors: Salman Akram, Charles M. Watkins, Mark Hiatt, David R. Hembree, James M. Wark, Warren M. Farnworth, Mark E. Tuttle, Sidney B. Rigg, Steven D. Oliver, Kyle K. Kirby, Alan G. Wood, Lu Velicky
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Publication number: 20100171217Abstract: A through-wafer interconnect for imager, memory and other integrated circuit applications is disclosed, thereby eliminating the need for wire bonding, making devices incorporating such interconnects stackable and enabling wafer level packaging for imager devices. Further, a smaller and more reliable die package is achieved and circuit parasitics (e.g., L and R) are reduced due to the reduced signal path lengths.Type: ApplicationFiled: March 17, 2010Publication date: July 8, 2010Applicant: MICRON TECHNOLOGY, INC.Inventors: Salman Akram, Charles Watkins, Mark Hiatt, David Hembree, James Wark, Warren Farnworth, Mark Tuttle, Sidney Rigg, Steven Oliver, Kyle Kirby, Alan Wood, Lu Velicky
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Patent number: 7683458Abstract: A through-wafer interconnect for imager, memory and other integrated circuit applications is disclosed, thereby eliminating the need for wire bonding, making devices incorporating such interconnects stackable and enabling wafer level packaging for imager devices. Further, a smaller and more reliable die package is achieved and circuit parasitics (e.g., L and R) are reduced due to the reduced signal path lengths.Type: GrantFiled: October 26, 2007Date of Patent: March 23, 2010Assignee: Micron Technology, Inc.Inventors: Salman Akram, Charles M. Watkins, William M. Hiatt, David R. Hembree, James M. Wark, Warren M. Farnworth, Mark E. Tuttle, Sidney B. Rigg, Steven D. Oliver, Kyle K. Kirby, Alan G. Wood, Lu Velicky
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Patent number: 7452743Abstract: Microelectronic imaging units and methods for manufacturing a plurality of imaging units at the wafer level are disclosed herein. In one embodiment, a method for manufacturing a plurality of imaging units includes providing an imager workpiece having a plurality of imaging dies including integrated circuits, external contacts electrically coupled to the integrated circuits, and image sensors operably coupled to the integrated circuits. The individual image sensors include at least one dark current pixel at a perimeter portion of the image sensor. The method includes depositing a cover layer onto the workpiece and over the image sensors. The method further includes patterning and selectively developing the cover layer to form discrete volumes of cover layer material over corresponding image sensors. The discrete volumes of cover layer material have sidewalls aligned with an inboard edge of the individual dark current pixels such that the dark current pixels are not covered by the discrete volumes.Type: GrantFiled: September 1, 2005Date of Patent: November 18, 2008Assignee: Aptina Imaging CorporationInventors: Steven D. Oliver, Lu Velicky, William Mark Hiatt, David R. Hembree, Mark E. Tuttle, Sidney B. Rigg, James M. Wark, Warren M. Farnworth, Kyle K. Kirby
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Publication number: 20080111213Abstract: A through-wafer interconnect for imager, memory and other integrated circuit applications is disclosed, thereby eliminating the need for wire bonding, making devices incorporating such interconnects stackable and enabling wafer level packaging for imager devices. Further, a smaller and more reliable die package is achieved and circuit parasitics (e.g., L and R) are reduced due to the reduced signal path lengths.Type: ApplicationFiled: October 26, 2007Publication date: May 15, 2008Applicant: Micron Technology, Inc.Inventors: Salman Akram, Charles Watkins, Mark Hiatt, David Hembree, James Wark, Warren Farnworth, Mark Tuttle, Sidney Rigg, Steven Oliver, Kyle Kirby, Alan Wood, Lu Velicky
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Patent number: 7300857Abstract: A through-wafer interconnect for imager, memory and other integrated circuit applications is disclosed, thereby eliminating the need for wire bonding, making devices incorporating such interconnects stackable and enabling wafer level packaging for imager devices. Further, a smaller and more reliable die package is achieved and circuit parasitics (e.g., L and R) are reduced due to the reduced signal path lengths.Type: GrantFiled: September 2, 2004Date of Patent: November 27, 2007Assignee: Micron Technology, Inc.Inventors: Salman Akram, Charles Watkins, Mark Hiatt, David Hembree, James Wark, Warren Farnworth, Mark Tuttle, Sidney Rigg, Steven Oliver, Kyle Kirby, Alan Wood, Lu Velicky
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Publication number: 20070045632Abstract: Microelectronic imaging units and methods for manufacturing a plurality of imaging units at the wafer level are disclosed herein. In one embodiment, a method for manufacturing a plurality of imaging units includes providing an imager workpiece having a plurality of imaging dies including integrated circuits, external contacts electrically coupled to the integrated circuits, and image sensors operably coupled to the integrated circuits. The individual image sensors include at least one dark current pixel at a perimeter portion of the image sensor. The method includes depositing a cover layer onto the workpiece and over the image sensors. The method further includes patterning and selectively developing the cover layer to form discrete volumes of cover layer material over corresponding image sensors. The discrete volumes of cover layer material have sidewalls aligned with an inboard edge of the individual dark current pixels such that the dark current pixels are not covered by the discrete volumes.Type: ApplicationFiled: September 1, 2005Publication date: March 1, 2007Applicant: Micron Technology, Inc.Inventors: Steven Oliver, Lu Velicky, William Hiatt, David Hembree, Mark Tuttle, Sidney Rigg, James Wark, Warren Farnworth, Kyle Kirby
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Publication number: 20060043599Abstract: A through-wafer interconnect for imager, memory and other integrated circuit applications is disclosed, thereby eliminating the need for wire bonding, making devices incorporating such interconnects stackable and enabling wafer level packaging for imager devices. Further, a smaller and more reliable die package is achieved and circuit parasitics (e.g., L and R) are reduced due to the reduced signal path lengths.Type: ApplicationFiled: September 2, 2004Publication date: March 2, 2006Inventors: Salman Akram, Charles Watkins, Mark Hiatt, David Hembree, James Wark, Warren Farnworth, Mark Tuttle, Sidney Rigg, Steven Oliver, Kyle Kirby, Alan Wood, Lu Velicky