Patents by Inventor Luai Nassar

Luai Nassar has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • MULTIVARIATE YIELD CALCULATOR FOR WAFER INTEGRATED CIRCUIT FABRICATION AND METHOD OF USE THEREOF
    Publication number: 20140358478
    Abstract: A multivariate yield calculator for wafer integrated circuit (IC) fabrication and a method of generating a multivariate yield forecast using the multivariate yield calculator. One embodiment of the multivariate yield calculator includes: (1) a Gaussian computer configured to compute a mean vector and a covariance matrix from multivariate performance characterizations having a multivariate distribution over a plurality of wafer ICs, and (2) an integrator configured to integrate a probability distribution function (PDF) based on the mean vector and the covariance matrix over a multivariate performance bin, thereby generating a multivariate yield forecast.
    Type: Application
    Filed: May 30, 2013
    Publication date: December 4, 2014
    Inventors: Meng Yu, Luai Nassar, Jason Musicer, Himanshu Kumar, Craig Nishizaki, Amit Dave