Patents by Inventor Luc Van Hoorebeke

Luc Van Hoorebeke has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10520452
    Abstract: A non-destructive inspection method for inline inspection of an object comprises moving an object in between a radiation source and an image detector and through a three-dimensional scanner field of view, imaging the object using the image detector to obtain a projection radiograph of an internal structure of the object, scanning an exterior surface of the object using the 3D scanner, fitting a shape model of the object to a point cloud provided by the 3D scanner to obtain a surface model of the exterior surface, creating a solid model of the surface model by taking a grey value distribution of a reference object into account, simulating a reference radiograph from the solid model and comparing the reference and projection radiographs to detect internal deviations of the object.
    Type: Grant
    Filed: March 16, 2016
    Date of Patent: December 31, 2019
    Assignees: KATHOLIEKE UNIVERSITEIT LEUVEN, UNIVERSITEIT GENT, UNIVERSITEIT ANTWERPEN
    Inventors: Mattias Van Dael, Pieter Verboven, Bart Nicolaï, Jelle Dhaene, Luc Van Hoorebeke, Jan Sijbers
  • Publication number: 20180113083
    Abstract: A non-destructive inspection method for inline inspection of an object comprises moving an object in between a radiation source and an image detector and through a three-dimensional scanner field of view, imaging the object using the image detector to obtain a projection radiograph of an internal structure of the object, scanning an exterior surface of the object using the 3D scanner, fitting a shape model of the object to a point cloud provided by the 3D scanner to obtain a surface model of the exterior surface, creating a solid model of the surface model by taking a grey value distribution of a reference object into account, simulating a reference radiograph from the solid model and comparing the reference and projection radiographs to detect internal deviations of the object.
    Type: Application
    Filed: March 16, 2016
    Publication date: April 26, 2018
    Inventors: Mattias VAN DAEL, Pieter VERBOVEN, Bart NICOLAÏ, Jelle DHAENE, Luc VAN HOOREBEKE, Jan SIJBERS
  • Patent number: 8199878
    Abstract: The present invention relates to a characterization system (100) for characterizing an object (104) comprising a basic material and additional structural features. The system (100) comprises at least one irradiation source (102) for generating an irradiation beam for irradiating the object (104) to be characterized and at least one detector (106) for detecting said irradiation beam transmitted through the object (104). The system (100) furthermore comprises a control means (108) for obtaining at least two different basic datasets of the object (104) for different configurations of the irradiation beam, the object (104) and the detector (106). The latter may be obtained by shifting and/or rotating components and/or by selecting different components used for acquisition of the datasets.
    Type: Grant
    Filed: April 10, 2008
    Date of Patent: June 12, 2012
    Assignee: Sutor BVBA
    Inventors: Walter Schoenmaekers, Luc Van Hoorebeke, Bert Masschaele, Veerle Cnudde, Manuel Dierick, Jelle Vlassenbroek
  • Publication number: 20100060633
    Abstract: The present invention relates to a characterisation system (100) for characterising an object (104) comprising a basic material and additional structural features. The system (100) comprises at least one irradiation source (102) for generating an irradiation beam for irradiating the object (104) to be characterised and at least one detector (106) for detecting said irradiation beam transmitted through the object (104). The system (100) furthermore comprises a control means (108) for obtaining at least two different basic datasets of the object (104) for different configurations of the irradiation beam, the object (104) and the detector (106). The latter may be obtained by shifting and/or rotating components and/or by selecting different components used for acquisition of the datasets.
    Type: Application
    Filed: April 10, 2008
    Publication date: March 11, 2010
    Inventors: Luc Van Hoorebeke, Bert Masschaele, Veerle Cnudde, Manuel Dierick, Jelle Vlassenbroek, Walter Schoenmaekers