Patents by Inventor Luca Bortesi

Luca Bortesi has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method and relative test structure for measuring the coupling capacitance between two interconnect lines
    Patent number: 7352192
    Abstract: A method and a relative test structure for measuring the coupling capacitance between two interconnect lines exploits the so-called cross-talk effect and keeps an interconnect line at a constant reference voltage. This approach addresses the problem of short-circuit currents that affect known test structures, and allows a direct measurement of the coupling capacitance between the two interconnect lines. Capacitance measurements may also be used for determining points of interruption of interconnect lines. When a line is interrupted, the measured coupling capacitance is the capacitance of a single conducting branch. The position of points of interruption of an interconnect line is determined by measuring the coupling capacitance of all segments of the line with a second conducting line.
    Type: Grant
    Filed: April 30, 2004
    Date of Patent: April 1, 2008
    Assignee: STMicroelectronics S.r.l.
    Inventors: Luca Bortesi, Loris Vendrame, Alessandro Bogliolo
  • Method and relative test structure for measuring the coupling capacitance between two interconnect lines
    Publication number: 20040227527
    Abstract: A method and a relative test structure for measuring the coupling capacitance between two interconnect lines exploits the so-called cross-talk effect and keeps an interconnect line at a constant reference voltage. This approach addresses the problem of short-circuit currents that affect known test structures, and allows a direct measurement of the coupling capacitance between the two interconnect lines. Capacitance measurements may also be used for determining points of interruption of interconnect lines. When a line is interrupted, the measured coupling capacitance is the capacitance of a single conducting branch. The position of points of interruption of an interconnect line is determined by measuring the coupling capacitance of all segments of the line with a second conducting line.
    Type: Application
    Filed: April 30, 2004
    Publication date: November 18, 2004
    Applicant: STMicroelectronics S.r.l.
    Inventors: Luca Bortesi, Loris Vendrame, Alessandro Bogliolo