Patents by Inventor Luca PLUTINO

Luca PLUTINO has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Self-test capable integrated circuit apparatus and method of self-testing an integrated circuit
    Patent number: 10496506
    Abstract: A self-test capable integrated circuit apparatus includes a pattern generator, a results store and testable logic. The testable logic includes a plurality of scan channels, each of the channels being respectively coupled between the pattern generator and the results store. A self-test controller is arranged to supervise a self-test in respect of the testable logic to generate self-test result data, the self-test result data being stored in the results store. A processing resource is coupled to the self-test controller and coupled between the pattern generator and the results store, the processing resource being capable of evaluating the self-test result data stored in the results store. The testable logic includes the processing resource, arranged to cooperate with the self-test controller. The processing resource is able, subsequent to the self-test, to evaluate the self-test result data.
    Type: Grant
    Filed: November 17, 2017
    Date of Patent: December 3, 2019
    Assignee: u-blox AG
    Inventors: Yassine Fkih, Djordje Zegarac, Eric Demey, Luca Plutino, Marzia Sapienza
  • SELF-TEST CAPABLE INTEGRATED CIRCUIT APPARATUS AND METHOD OF SELF-TESTING AN INTEGRATED CIRCUIT
    Publication number: 20180145041
    Abstract: A self-test capable integrated circuit apparatus includes a pattern generator, a results store and testable logic. The testable logic includes a plurality of scan channels, each of the channels being respectively coupled between the pattern generator and the results store. A self-test controller is arranged to supervise a self-test in respect of the testable logic to generate self-test result data, the self-test result data being stored in the results store. A processing resource is coupled to the self-test controller and coupled between the pattern generator and the results store, the processing resource being capable of evaluating the self-test result data stored in the results store. The testable logic includes the processing resource, arranged to cooperate with the self-test controller. The processing resource is able, subsequent to the self-test, to evaluate the self-test result data.
    Type: Application
    Filed: November 17, 2017
    Publication date: May 24, 2018
    Applicant: u-blox AG
    Inventors: Yassine FKIH, Djordje Zegarac, Eric DEMEY, Luca PLUTINO, Marzia SAPIENZA