Patents by Inventor Luca Ribetto

Luca Ribetto has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11709431
    Abstract: A method for manufacturing a plurality of mechanical resonators (100) in a manufacturing wafer (10), the resonators being intended to be fitted to an adjusting member of a timepiece, the method comprising the following steps: (a) manufacturing a plurality of resonators in at least one reference wafer according to reference specifications, such manufacture comprising at least one lithography step to form patterns of the resonators on or above the reference wafer and a step of machining in the reference plate using the patterns; (b) for the at least one reference plate, establishing a map indicative of the dispersion of stiffnesses of the resonators relative to an average stiffness value; (c) dividing the map into fields and determining a correction to be made to the dimensions of the resonators for at least one of the fields in order to reduce the dispersion; (d) modifying the reference specifications for the lithography step so as to make the corrections to the dimensions for the at least one field in the lit
    Type: Grant
    Filed: September 15, 2020
    Date of Patent: July 25, 2023
    Assignee: RICHEMONT INTERNATIONAL SA
    Inventors: Susana del Carmen Tobenas Borron, Alexis Heraud, Luca Ribetto, Béatrice Wenk, Nelly Socquet
  • Publication number: 20220350255
    Abstract: A method for manufacturing a plurality of mechanical resonators (100) in a manufacturing wafer (10), the resonators being intended to be fitted to an adjusting member of a timepiece, the method comprising the following steps: (a) manufacturing a plurality of resonators in at least one reference wafer according to reference specifications, such manufacture comprising at least one lithography step to form patterns of the resonators on or above the reference wafer and a step of machining in the reference plate using the patterns; (b) for the at least one reference plate, establishing a map indicative of the dispersion of stiffnesses of the resonators relative to an average stiffness value; (c) dividing the map into fields and determining a correction to be made to the dimensions of the resonators for at least one of the fields in order to reduce the dispersion; (d) modifying the reference specifications for the lithography step so as to make the corrections to the dimensions for the at least one field in the lit
    Type: Application
    Filed: September 15, 2020
    Publication date: November 3, 2022
    Applicant: RICHEMONT INTERNATIONAL SA
    Inventors: Susana del Carmen TOBENAS BORRON, Alexis HERAUD, Luca RIBETTO, Béatrice WENK, Nelly SOCQUET
  • Patent number: 10095184
    Abstract: A mechanical oscillator endowed with a strip, with the aforesaid strip incorporating a first silicon layer having a crystal lattice extending along a first direction of one plane, a thermal compensation layer composed of a material having a Young's modulus thermal coefficient of opposite sign to that of the silicon, and a second silicon layer having a crystal lattice extending in a second direction of the plane, with the first and direction being offset at an angle of 45° within the plane of the layers, and with the thermal compensation layer extending between the first and second silicon layers.
    Type: Grant
    Filed: February 12, 2016
    Date of Patent: October 9, 2018
    Assignee: TRONIC'S MICROSYSTEMS
    Inventors: Vincent Gaff, Pierre-Marie Visse, Luca Ribetto
  • Publication number: 20180004161
    Abstract: A mechanical oscillator endowed with a strip, with the aforesaid strip incorporating a first silicon layer having a crystal lattice extending along a first direction of one plane, a thermal compensation layer composed of a material having a Young's modulus thermal coefficient of opposite sign to that of the silicon, and a second silicon layer having a crystal lattice extending in a second direction of the plane, with the first and direction being offset at an angle of 45° within the plane of the layers, and with the thermal compensation layer extending between the first and second silicon layers.
    Type: Application
    Filed: February 12, 2016
    Publication date: January 4, 2018
    Inventors: Vincent Gaff, Pierre-Marie Visse, Luca Ribetto
  • Publication number: 20160265916
    Abstract: A micromechanical sensor for measuring z-axis angular rate includes a substrate defining a substrate plane and a z-axis perpendicular to the substrate plane. A first vibratory structure has a first shuttle-mass and a first proof-mass coupled to the first shuttle-mass by a first sense-mode spring. There is a second vibratory structure in a mirror-symmetrical setup (excepting the electrodes). First and second suspension structures suspend the first and second shuttle-masses above the substrate flexibly in drive-mode direction. Both shuttle-masses are suspended above the substrate for movement at least in drive-mode direction, wherein drive-mode direction and sense-mode direction are parallel to the substrate plane. Both vibratory structures are elastically coupled to each other.
    Type: Application
    Filed: December 11, 2014
    Publication date: September 15, 2016
    Inventors: Christophe Kergueris, Luca Ribetto, Riccardo Signoretti