Abstract: A method and device for performing a characterization of a description of the composition of an electronic system in terms of components used are disclosed. Performances of the components are described by at least two statistical parameters and one deterministic parameter. In one aspect, the method includes selecting a plurality of design of experiments (DoE) points, performing simulations on the selected DoE points, thus obtaining system responses, and determining a response model using the selected DoE points and the system responses. Selecting the DoE points includes making a first selection of a reduced set of chosen DoE points for the statistical parameters representing the statistical properties of the many possible statistical parameter realizations, and making a second selection of DoE points for the deterministic parameter representing the possible limited set of values that such parameter can take.