Abstract: Devices and techniques for estimating lifelong data traffic of a memory device are described herein. A system includes a processing device and memory configured to store instructions to perform operations comprising: receiving a history of memory accesses to a device under test during execution of an application; identifying a partition size associated with the application; determining an address offset value based on the partition size and the application; and repeatedly applying the memory accesses over a number of iterations, the application of the memory accesses constrained to the partition size, and the memory accesses applied with each iteration beginning at an address based on a multiple of the address offset value to produce an estimation of data traffic.

Abstract: Devices and techniques for controlling NAND operation latency are described herein. A controlled can receive a write request. The controller can then calculate a number of garbage collection operations to perform on a physical block that is closed. Here, the calculation includes adding a logical-to-physical (L2P) region search ratio to a cadence calculation for garbage collection. Garbage collection operations can be performed on the physical block in accordance with the calculated number of garbage collection operations to perform. Then, the controller can perform the write request in response to completing the calculated number of garbage collection operations.

Abstract: Embedded memory lifetime testing is described herein. An example system includes a memory device configured to store instructions for performing a test to determine a remaining lifetime of the memory device, and a controller coupled to the memory device. The controller can be configured to, responsive to receipt of a command from a host, receive, from the memory device, the instructions for performing the test, and execute the instructions to perform the test to determine the remaining lifetime of the memory device.

Abstract: Devices and techniques for controlling NAND operation latency are described herein. A controlled can receive a write request. The controller can then calculate a number of garbage collection operations to perform on a physical block that is closed. Here, the calculation includes adding a logical-to-physical (L2P) region search ratio to a cadence calculation for garbage collection. Garbage collection operations can be performed on the physical block in accordance with the calculated number of garbage collection operations to perform. Then, the controller can perform the write request in response to completing the calculated number of garbage collection operations.

Abstract: Devices and techniques for controlling NAND operation latency are described herein. A controlled can receive a write request. The controller can then calculate a number of garbage collection operations to perform on a physical block that is closed. Here, the calculation includes adding a logical-to-physical (L2P) region search ratio to a cadence calculation for garbage collection. Garbage collection operations can be performed on the physical block in accordance with the calculated number of garbage collection operations to perform. Then, the controller can perform the write request in response to completing the calculated number of garbage collection operations.

Abstract: Devices and techniques for controlling NAND operation latency are described herein. A controlled can receive a write request. The controller can then calculate a number of garbage collection operations to perform on a physical block that is closed. Here, the calculation includes adding a logical-to-physical (L2P) region search ratio to a cadence calculation for garbage collection. Garbage collection operations can be performed on the physical block in accordance with the calculated number of garbage collection operations to perform. Then, the controller can perform the write request in response to completing the calculated number of garbage collection operations.

Abstract: Devices and techniques for controlling NAND operation latency are described herein. A controlled can receive a write request. The controller can then calculate a number of garbage collection operations to perform on a physical block that is closed. Here, the calculation includes adding a logical-to-physical (L2P) region search ratio to a cadence calculation for garbage collection. Garbage collection operations can be performed on the physical block in accordance with the calculated number of garbage collection operations to perform. Then, the controller can perform the write request in response to completing the calculated number of garbage collection operations.

Abstract: Devices and techniques for controlling NAND operation latency are described herein. A controlled can receive a write request. The controller can then calculate a number of garbage collection operations to perform on a physical block that is closed. Here, the calculation includes adding a logical-to-physical (L2P) region search ratio to a cadence calculation for garbage collection. Garbage collection operations can be performed on the physical block in accordance with the calculated number of garbage collection operations to perform. Then, the controller can perform the write request in response to completing the calculated number of garbage collection operations.