Patents by Inventor Lucio ROBLEDO
Lucio ROBLEDO has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Publication number: 20230233075Abstract: A device for carrying out fluorescence lifetime microscopy of an eye includes a probe light source for sending a probe beam into the eye as well as a fluorescence detector for measuring time-resolved fluorescence data using fluorescent light returning from the eye. The device further includes an interferometer for sending a measurement beam into the eye and carrying out optical coherence tomography on light reflected from structures within the eye. A beam splitter is provided to collinearly combine the probe beam and a measurement beam. This device can be used to combine optical coherence tomography (OCT) and fluorescence lifetime data for obtaining more descriptive results. The device is also equipped for correcting fluorescence lifetime data of a first structure of the eye by compensating for fluorescence contributions from a second structure of the eye.Type: ApplicationFiled: June 9, 2020Publication date: July 27, 2023Applicant: Haag-Streit AGInventor: Lucio ROBLEDO
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Publication number: 20230035499Abstract: Data representing structures in an eye, in particular data for a cross-sectional. image, is recorded by generating a plurality of A-scans using swept-source OCT at different locations in the eye, each of which generates a plurality of reflection values for a plurality of points along a light trace. Combined values are then calculated from several reflection values at different locations in the eye. For improving data quality, a model of at one curved structure in the eye is fitted to the reflection values, and it is then used for identifying the points on the A-scans that are to be combined. This allows to project the data along a tangential direction of the curved structures for reducing noise and for obtaining improved resolution in the direction perpendicular to the structure.Type: ApplicationFiled: January 8, 2020Publication date: February 2, 2023Applicant: Haag-Streit AGInventor: Lucio ROBLEDO
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Publication number: 20230000341Abstract: A method for measuring at least one parameter indicative of the optical transmission quality of the eye, such as information on absorptive or scattering structures that affect the propagation of light between the cornea and the retina and/or information on the imaging quality, e.g., the point-spread-function of the eye. The method includes recording a plurality of optical coherence tomography A-scans for different cornea locations xi, yi of the eye by an optical coherence tomography device and a scanner. For each A-scan, a reflection value at the retina of the eye is determined. The reflection values can then be combined, e.g., for displaying an image of the eye's transmission quality as a function of xi, yi or, by Fourier analysis, for determining the point spread function of the eye.Type: ApplicationFiled: January 17, 2020Publication date: January 5, 2023Applicant: Haag-Streit AGInventor: Lucio ROBLEDO
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Patent number: 11382504Abstract: The invention relates to an OCT system, comprising: an OCT light source for emitting OCT light into an object beam path and a reference beam path; and a detector for capturing an interference signal produced from the object beam path and the reference beam path. A wavelength-dependent beamsplitter is arranged in the OCT beam path such that a first spectral partial beam is guided along a longer path and a second spectral partial beam is guided along a shorter path. The invention further relates to a corresponding OCT method. Two measurement regions separated from each other can be sensed by means of the OCT system according to the invention.Type: GrantFiled: July 2, 2019Date of Patent: July 12, 2022Assignee: Haag-Streit AGInventors: Lucio Robledo, Peter Stalder, André Huber-Meznaric
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Patent number: 11272837Abstract: The invention relates to a method for performing a movement correction when measuring a human eye, in which the eye is scanned by a measurement beam in order to obtain a set of position values of an eye structure. Scanning extends over a measurement time interval, wherein the position values are each provided with a timestamp within the measurement time interval. A surface shape and a displacement function are determined, with the displacement function representing a movement pattern during the measurement time interval, and the surface shape and the displacement function being determined in such a way that the position values are approximated by the surface shape when the surface shape is moved according to the displacement function. Moreover, the invention relates to an associated measurement system.Type: GrantFiled: December 3, 2019Date of Patent: March 15, 2022Assignee: Haag-Streit AGInventors: Jörg Wagner, Philippe Cattin, Lucio Robledo
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Patent number: 11236986Abstract: The invention relates to an OCT system with an OCT light source for emitting OCT light into an object beam path and a reference beam path. The system comprises a detector for detecting an interference signal produced by the object beam path and the reference beam path. A polarization-dependent delay element is arranged in the object beam path. The invention also relates to a corresponding OCT method. The invention allows the effects of parasitic reflections to be reduced.Type: GrantFiled: May 22, 2019Date of Patent: February 1, 2022Assignee: Haag-Streit AGInventors: Peter Stalder, Lucio Robledo
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Patent number: 11193754Abstract: The invention relates to an OCT system with an OCT light source for emitting OCT light into an object beam path and a reference beam path. The system comprises a detector for detecting an interference signal produced by the object beam path and the reference beam path. A polarization-dependent delay element is arranged in the object beam path. The invention also relates to a corresponding OCT method. The invention allows the effects of parasitic reflections to be reduced.Type: GrantFiled: May 22, 2019Date of Patent: December 7, 2021Assignee: Haag-Streit AGInventors: Peter Stalder, Lucio Robledo
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Publication number: 20210353139Abstract: The invention relates to a method for performing a movement correction when measuring a human eye, in which the eye is scanned by a measurement beam in order to obtain a set of position values of an eye structure. Scanning extends over a measurement time interval, wherein the position values are each provided with a timestamp within the measurement time interval. A surface shape and a displacement function are determined, with the displacement function representing a movement pattern during the measurement time interval, and the surface shape and the displacement function being determined in such a way that the position values are approximated by the surface shape when the surface shape is moved according to the displacement function. Moreover, the invention relates to an associated measurement system.Type: ApplicationFiled: December 3, 2019Publication date: November 18, 2021Inventors: Jörg Wagner, Philippe Cattin, Lucio Robledo
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Publication number: 20210244269Abstract: The invention relates to an OCT system, comprising: an OCT light source for emitting OCT light into an object beam path and a reference beam path; and a detector for capturing an interference signal produced from the object beam path and the reference beam path. A wavelength-dependent beamsplitter is arranged in the OCT beam path such that a first spectral partial beam is guided along a longer path and a second spectral partial beam is guided along a shorter path. The invention further relates to a corresponding OCT method. Two measurement regions separated from each other can be sensed by means of the OCT system according to the invention.Type: ApplicationFiled: July 2, 2019Publication date: August 12, 2021Inventors: Lucio Robledo, Peter Stalder, André Huber-Meznaric
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Publication number: 20210223025Abstract: The invention relates to an OCT system with an OCT light source for emitting OCT light into an object beam path and a reference beam path. The system comprises a detector for detecting an interference signal produced by the object beam path and the reference beam path. A polarization-dependent delay element is arranged in the object beam path. The invention also relates to a corresponding OCT method. The invention allows the effects of parasitic reflections to be reduced.Type: ApplicationFiled: May 22, 2019Publication date: July 22, 2021Inventors: Peter Stalder, Lucio Robledo
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Publication number: 20210199420Abstract: The invention relates to an OCT system with an OCT light source for emitting OCT light into an object beam path and a reference beam path. The system comprises a detector for detecting an interference signal produced by the object beam path and the reference beam path. A polarization-dependent delay element is arranged in the object beam path. The invention also relates to a corresponding OCT method. The invention allows the effects of parasitic reflections to be reduced.Type: ApplicationFiled: May 22, 2019Publication date: July 1, 2021Inventors: Peter Stalder, Lucio Robledo
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Patent number: 11009337Abstract: In a method for calibrating an interferometer (100) having a beam path for a measuring beam (112), wherein at least one plane (320) that at least partially reflects the measuring beam (112) has been introduced into the beam path, and wherein a normal to a first plane (320) is inclined at a first angle to a measuring beam (112) incident on the first plane (320), the following steps are carried out: interferometric measurement of a first axial spacing of a first point on the first plane (320) with the measuring beam (112), and interferometric measurement of a second axial spacing of a second point on one of the at least one plane (320) with the measuring beam (112), wherein the second point is spaced apart from the first point.Type: GrantFiled: May 16, 2019Date of Patent: May 18, 2021Assignee: HAAG-STREIT AGInventors: Lucio Robledo, Pascal Kesselring
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Patent number: 10595723Abstract: In a method for registering measurement points on a body, in particular on an eye, measurement points are registered along a trajectory on a surface of the body, in particular a curved surface of the body, for determining an axial length profile, by way of a measurement beam. Here, a minimum radius of curvature of the trajectory is at least 1/7, preferably at least ?, particularly preferably at least ? of a radius of a circumference of the surface.Type: GrantFiled: November 10, 2015Date of Patent: March 24, 2020Assignee: HAAG-STREIT AGInventors: André Meznaric, Bernhard Von Waldkirch, Christian Schlaeppi, Christian Zoss, Ernst Rindlisbacher, Joerg Breitenstein, Kaspar Baltzer, Lucio Robledo, Peter Stalder, Silja Kiriyanthan
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Publication number: 20190271533Abstract: In a method for calibrating an interferometer (100) having a beam path for a measuring beam (112), wherein at least one plane (320) that at least partially reflects the measuring beam (112) has been introduced into the beam path, and wherein a normal to a first plane (320) is inclined at a first angle to a measuring beam (112) incident on the first plane (320), the following steps are carried out: interferometric measurement of a first axial spacing of a first point on the first plane (320) with the measuring beam (112), and interferometric measurement of a second axial spacing of a second point on one of the at least one plane (320) with the measuring beam (112), wherein the second point is spaced apart from the first point.Type: ApplicationFiled: May 16, 2019Publication date: September 5, 2019Applicant: Haag-Streit AGInventors: Lucio ROBLEDO, Pascal KESSELRING
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Patent number: 10330461Abstract: In a method for calibrating an interferometer (100) having a beam path for a measuring beam (112), wherein at least one plane (320) that at least partially reflects the measuring beam (112) has been introduced into the beam path, and wherein a normal to a first plane (320) is inclined at a first angle to a measuring beam (112) incident on the first plane (320), the following steps are carried out: interferometric measurement of a first axial spacing of a first point on the first plane (320) with the measuring beam (112), and interferometric measurement of a second axial spacing of a second point on one of the at least one plane (320) with the measuring beam (112), wherein the second point is spaced apart from the first point.Type: GrantFiled: December 13, 2016Date of Patent: June 25, 2019Assignee: HAAG-STREIT AGInventors: Lucio Robledo, Pascal Kesselring
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Patent number: 10201271Abstract: In a method for interferometrically capturing measurement points of a region of an eye, a plurality of measurement points are captured by a measurement beam along a trajectory, wherein the same trajectory is passed over by the measurement beam in the region during at least a first iteration and a second iteration. The trajectory of the first iteration is rotated through an angle and/or displaced by a distance in relation to the trajectory of the second iteration in order to obtain a more homogeneous measurement point distribution.Type: GrantFiled: March 10, 2017Date of Patent: February 12, 2019Assignee: HAAG-STREIT AGInventors: Jörg Wagner, Lucio Robledo, Philippe Cattin
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Publication number: 20170258318Abstract: In a method for interferometrically capturing measurement points of a region of an eye, a plurality of measurement points are captured by a measurement beam along a trajectory, wherein the same trajectory is passed over by the measurement beam in the region during at least a first iteration and a second iteration. The trajectory of the first iteration is rotated through an angle and/or displaced by a distance in relation to the trajectory of the second iteration in order to obtain a more homogeneous measurement point distribution.Type: ApplicationFiled: March 10, 2017Publication date: September 14, 2017Applicant: Haag-Streit AGInventors: Jörg WAGNER, Lucio ROBLEDO, Philippe CATTIN
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Publication number: 20170167846Abstract: In a method for calibrating an interferometer (100) having a beam path for a measuring beam (112), wherein at least one plane (320) that at least partially reflects the measuring beam (112) has been introduced into the beam path, and wherein a normal to a first plane (320) is inclined at a first angle to a measuring beam (112) incident on the first plane (320), the following steps are carried out: interferometric measurement of a first axial spacing of a first point on the first plane (320) with the measuring beam (112), and interferometric measurement of a second axial spacing of a second point on one of the at least one plane (320) with the measuring beam (112), wherein the second point is spaced apart from the first point.Type: ApplicationFiled: December 13, 2016Publication date: June 15, 2017Applicant: Haag-Streit AGInventors: Lucio ROBLEDO, Pascal KESSELRING
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Patent number: 9375140Abstract: An adapter (60) for an apparatus (50) for measuring a first property of an eye is attachable to the apparatus (50), wherein, when the adapter (60) is attached to the apparatus (50), a second additional property of the eye is measurable.Type: GrantFiled: January 24, 2014Date of Patent: June 28, 2016Assignee: HAAG-STREIT AGInventors: Joerg Breitenstein, Jonas Haehnle, Christian Zoss, Peter Stalder, Kaspar Baltzer, Ernst Rindlisbacher, André Meznaric, Christian Schlaeppi, Lucio Robledo
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Publication number: 20160128565Abstract: In a method for registering measurement points on a body, in particular on an eye, measurement points are registered along a trajectory on a surface of the body, in particular a curved surface of the body, for determining an axial length profile, by way of a measurement beam. Here, a minimum radius of curvature of the trajectory is at least 1/7, preferably at least ?, particularly preferably at least ? of a radius of a circumference of the surface.Type: ApplicationFiled: November 10, 2015Publication date: May 12, 2016Applicant: Haag-Streit AGInventors: André MEZNARIC, Bernhard VON WALDKIRCH, Christian SCHLAEPPI, Christian ZOSS, Ernst RINDLISBACHER, Joerg BREITENSTEIN, Kaspar BALTZER, Lucio ROBLEDO, Peter STALDER, Silja KIRIYANTHAN