Patents by Inventor Luh Chyuan Lau

Luh Chyuan Lau has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Determining bit aspect ratios for partially-overlapping magnetic recording tracks
    Patent number: 10339969
    Abstract: A method involves determining bit aspect ratios for interlaced tracks written to a magnetic recording medium. The interlaced tracks include top tracks that are written partially overlapping with bottom tracks. Isolated test tracks are written at first different bit aspect ratios to determine a top bit aspect ratio that achieves a first target areal density for the isolated test tracks. Test tracks are written at second different bit aspect ratios to determine a bottom bit aspect ratio that achieves a second target areal density for the test tracks. Top test tracks of the test tracks are written at the top bit aspect ratio. The top and bottom bit aspect ratios are selected to subsequently write partially-overlapping tracks on the magnetic recording medium.
    Type: Grant
    Filed: July 30, 2018
    Date of Patent: July 2, 2019
    Assignee: Seagate Technology LLC
    Inventors: Edmun Chian Song Seng, Det Hau Wu, Lin Nah Lim, Jose Mari Corral Toribio, Luh Chyuan Lau, Utt Heng Kan, Meng Suan June Lee
  • DETERMINING BIT ASPECT RATIOS FOR PARTIALLY-OVERLAPPING MAGNETIC RECORDING TRACKS
    Publication number: 20190013045
    Abstract: A method involves determining bit aspect ratios for interlaced tracks written to a magnetic recording medium. The interlaced tracks include top tracks that are written partially overlapping with bottom tracks. Isolated test tracks are written at first different bit aspect ratios to determine a top bit aspect ratio that achieves a first target areal density for the isolated test tracks. Test tracks are written at second different bit aspect ratios to determine a bottom bit aspect ratio that achieves a second target areal density for the test tracks. Top test tracks of the test tracks are written at the top bit aspect ratio. The top and bottom bit aspect ratios are selected to subsequently write partially-overlapping tracks on the magnetic recording medium.
    Type: Application
    Filed: July 30, 2018
    Publication date: January 10, 2019
    Inventors: Edmun Chian Song Seng, Det Hau Wu, Lin Nah Lim, Jose Mari Corral Toribio, Luh Chyuan Lau, Utt Heng Kan, Meng Suan June Lee
  • Determining bit aspect ratios for interlaced magnetic recording tracks
    Patent number: 10056108
    Abstract: A method involves determining bit aspect ratios for interlaced tracks written to a magnetic recording medium. The interlaced tracks include top tracks that are written partially overlapping and interlaced with bottom tracks. Isolated test tracks are written at first different bit aspect ratios to determine a top bit aspect ratio that achieves a first target areal density for the isolated test tracks. Interlaced test tracks are written at second different bit aspect ratios to determine a bottom bit aspect ratio that achieves a second target areal density for the interlaced test tracks. Top test tracks of the interlaced test tracks are written at the top bit aspect ratio. The top and bottom bit aspect ratios are selected to subsequently write interlaced tracks on the magnetic recording medium.
    Type: Grant
    Filed: July 5, 2017
    Date of Patent: August 21, 2018
    Assignee: Seagate Technology LLC
    Inventors: Edmun Chian Song Seng, Det Hau Wu, Lin Nah Lim, Jose Mari Corral Toribio, Luh Chyuan Lau, Utt Heng Kan, Meng Suan June Lee