Abstract: A method of managing a multi-level memory device having singularly addressable three-level cells includes storing strings of three bits by coding them in corresponding ternary strings according to a coding scheme and writing each of the ternary strings in a respective pair of three-level cells. Strings of three bits are read by reading respective ternary strings written in respective pairs of three-level cells and decoding each read ternary string in a corresponding string of three bits according to the coding scheme. A pair of adjacent bits, belonging to at least one of a same initial string and two initial adjacent strings, are programmed by identifying pairs of three-level cells to be programmed that encode the strings of three bits and programming each pair of three-level cells.

Abstract: A method of managing a multi-level memory device having singularly addressable three-level cells includes storing strings of three bits by coding them in corresponding ternary strings according to a coding scheme and writing each of the ternary strings in a respective pair of three-level cells. Strings of three bits are read by reading respective ternary strings written in respective pairs of three-level cells and decoding each read ternary string in a corresponding string of three bits according to the coding scheme. A pair of adjacent bits, belonging to at least one of a same initial string and two initial adjacent strings, are programmed by identifying pairs of three-level cells to be programmed that encode the strings of three bits and programming each pair of three-level cells.

Abstract: A Flash EEPROM having negative voltage generator means for generating a negative voltage to be supplied to control gate electrodes of memory cells for erasing the memory cells. The Flash EEPROM also has first positive voltage generator means for generating a first positive voltage, independent from an external power supply of the Flash EEPROM, to be supplied to source regions of the memory cells during erasing.

Abstract: A pulse generator of a type that includes at least one current mirror connected between first and second voltage references and to at least one initiation terminal receiving a pulsive-type initiating signal, connected to a load terminal receiving a load signal, and connected to an output terminal providing an output signal.

Abstract: A Flash EEPROM having negative voltage generator means for generating a negative voltage to be supplied to control gate electrodes of memory cells for erasing the memory cells. The Flash EEPROM also has first positive voltage generator means for generating a first positive voltage, independent from an external power supply of the Flash EEPROM, to be supplied to source regions of the memory cells during erasing.

Abstract: A Flash EEPROM includes a negative voltage generator for generating a negative voltage to be supplied to control gate electrodes of memory cells for erasing the memory cells. The Flash EEPROM also has a first positive voltage generator for generating a first positive voltage, independent from an external power supply of the Flash EEPROM, to be supplied to source regions of the memory cells during erasing.

Abstract: A circuit for switching between supply voltages and in particular for non-volatile flash memory devices and of the type comprising a first and a second circuit branch each incorporating a pair of transistors connected in series provides that at least one branch of the circuit be structured with a bridge circuit made up of P-channel MOS transistors. The bridge is made of a first and a second pairs of transistors connected between a first supply voltage reference and a common node. The first pair comprises transistors bigger than the transistors of the second pair while between the transistors making up the second pair is inserted a pair of resistors. Between the pair of resistors there is an interconnection node connected to a corresponding interconnection node between the transistors of the first pair.

Abstract: A method and a circuit generates a pulse synchronization signal in order to control the reading phase of memory cells in semiconductor integrated, electronic memory devices. The pulse synchronization signal is generated upon sensing a change in logic state on at least one of a plurality of address input terminals of the memory cells to also generate an equalization signal for a sense amplifier. The logic state of said pulse synchronization signal is re-acknowledged by a fed-back response having a predetermined delay and being generated upon reception of a corresponding signal to said equalization signal. To this aim, a re-acknowledge circuit portion is provided which is input a corresponding signal to the equalization signal and feedback connected to the output node to drive the discharging of the node with a predetermined delay from the reception of the input signal.

Abstract: The invention relates to a method of erasing an electrically programmable non-volatile memory device constructed as a multi-sector matrix memory and being of the type with an erase algorithm integrated into the device. The method comprises the following steps of: erasing some or all of the matrix sectors in parallel; subsequently reading and checking each erased sector; storing the address of a sector being checked when the issue of a check is unfavorable; carrying out a fresh parallel erasing step; and starting a new reading/checking step from the sector that has checked unfavorably.